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RITE XSight™ LC Lens-Coupled High-Resolution X-ray Camera

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Brand RITE
Origin Czech Republic
Model XSight™ LC
Sensor Type CCD / sCMOS
Effective Pixels 3300×2500 (CCD) / 2048×2048 (sCMOS)
Pixel Pitch 0.275–5.2 µm (model-dependent)
Spatial Resolution 0.4–7.0 µm (JIMA RT RC-02 test pattern, 8 keV)
Energy Range 5–30 keV (vacuum-compatible version extends to EUV ≥50 eV)
Read Noise 7.5 e⁻ RMS (CCD) / 1.4 e⁻ RMS (sCMOS)
Dark Current ≤0.001 e⁻/pix/s @ −30°C (CCD) / ≤0.04 e⁻/pix/s @ −10°C (sCMOS, water-cooled)
Frame Rate 3–40 fps
Dynamic Range 2800:1 (CCD) / 21400:1 (sCMOS)
Lens Mount Bayonet-type interchangeable lens units (up to five configurations)
Vacuum Option Available (EUV-capable)
Cooling Air- or water-cooled (no liquid nitrogen required)
Interface USB 3.0
Compliance Designed for GLP/GMP-aligned lab environments

Overview

The RITE XSight™ LC Lens-Coupled High-Resolution X-ray Camera is an engineered imaging solution for synchrotron beamlines, laboratory-scale X-ray microscopes, computed tomography (CT) systems, and precision metrology applications requiring sub-micron spatial fidelity. Unlike fiber-optic-coupled or direct-detection architectures, the XSight™ LC employs a lens-coupled optical relay design—where X-rays are first converted to visible light via a high-efficiency scintillator (e.g., LuAG:Ce or Gd₂O₂S:Tb), then imaged onto the sensor through a multi-element, radiation-hardened microscope objective. This configuration decouples detection efficiency from pixel size constraints, enabling scalable resolution across field-of-view (FOV) tiers—from 0.67 mm × 0.67 mm up to 14.4 mm × 10.8 mm—while maintaining <0.4 µm demonstrable resolution on JIMA RT RC-02 test patterns at 8 keV. The system operates in the 5–30 keV range; optional vacuum-integrated variants extend spectral sensitivity into the extreme ultraviolet (EUV) regime (≥50 eV), supporting soft X-ray microscopy and plasma diagnostics.

Key Features

  • Lens-based optical coupling architecture optimized for high modulation transfer function (MTF) and minimal geometric distortion across FOV
  • Interchangeable bayonet-mount lens units (LC 0270 to LC 4320), enabling rapid reconfiguration between resolution-priority and FOV-priority modes without realignment
  • Integrated X-ray shielding housing prevents stray radiation from impinging directly on the sensor, reducing background noise and improving signal-to-noise ratio (SNR)
  • Compact, rigid mechanical design suitable for integration into constrained spaces—including rotating gantries in CT setups and vacuum chambers in synchrotron endstations
  • Thermally stabilized sensor operation: CCD variant cooled to −30°C (air/water hybrid); sCMOS variant supports −10°C water cooling for ultra-low dark current
  • USB 3.0 interface ensures deterministic data transfer with no external frame grabber required; native support for GenICam-compliant acquisition software
  • No cryogenic cooling needed—eliminates operational complexity and maintenance overhead associated with liquid nitrogen or closed-cycle coolers

Sample Compatibility & Compliance

The XSight™ LC accommodates diverse sample geometries and experimental conditions. Its modular lens system supports both transmission and reflection-mode X-ray imaging, including phase-contrast modalities when paired with appropriate zone plates or grating interferometers. The vacuum-compatible version meets ISO 10110-7 surface quality standards for internal optics and complies with UHV-compatible material specifications (e.g., stainless steel 316L housings, metal-sealed feedthroughs). For regulated environments, the camera’s firmware implements audit-trail logging and timestamped metadata embedding per FDA 21 CFR Part 11 requirements. Data acquisition workflows align with ISO/IEC 17025 documentation practices and ASTM E2737-10 guidelines for digital radiographic system validation.

Software & Data Management

Native SDKs (C/C++, Python, MATLAB) provide low-level control over exposure timing, gain, region-of-interest (ROI) readout, and hardware-triggered synchronization. Optional RITE ImageStudio™ software delivers real-time flat-field correction, dead-pixel mapping, and MTF calculation using slanted-edge analysis per ISO 12233. All acquired frames embed EXIF-style metadata—including energy calibration, lens ID, temperature log, and shutter timing—ensuring traceability in GLP audits. Raw data export supports HDF5 and TIFF formats with embedded bit-depth preservation (16-bit linear output). Integration with third-party platforms (e.g., TomoPy, FIJI/ImageJ, DAWN) is validated for reconstruction pipeline interoperability.

Applications

  • X-ray microtomography of biological tissues, composite materials, and additive-manufactured components at voxel resolutions down to 0.4 µm
  • In-line process monitoring in semiconductor packaging inspection and battery electrode characterization
  • Dynamic studies of crack propagation, fluid flow in porous media, and thermal expansion under operando conditions
  • EUV lithography mask inspection and plasma emission spectroscopy in fusion research facilities
  • Phase-retrieval imaging using grating-based interferometry or ptychographic reconstruction algorithms
  • Calibration reference imaging for beamline diagnostics and detector intercomparison campaigns

FAQ

What scintillators are compatible with the XSight™ LC system?

Standard configurations include LuAG:Ce (for high-resolution, fast decay) and Gd₂O₂S:Tb (for high conversion efficiency at lower energies); custom scintillator bonding is available upon request.
Can the XSight™ LC be synchronized with pulsed X-ray sources?

Yes—the camera supports TTL-triggered exposure with jitter <100 ns and configurable delay ranges from 0–10 s, enabling precise gating with synchrotron fill patterns or laser-driven X-ray sources.
Is remote operation supported in vacuum environments?

Vacuum-rated models include feedthrough-compatible USB 3.0 and power connectors rated to 10⁻⁷ mbar; remote firmware updates and parameter adjustment are fully supported via encrypted command protocol.
How is spatial resolution verified and documented?

Resolution is measured using NIST-traceable JIMA RT RC-02 test patterns under controlled beam conditions (8 keV, monochromatic); full MTF curves and uncertainty budgets are provided in the factory calibration report.
Does the system support binning or partial-frame readout?

Yes—hardware binning (2×2, 4×4) and arbitrary ROI selection are implemented at the FPGA level, enabling frame-rate increases up to 40 fps without compromising SNR or dynamic range.

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