OK-TH Series Large-Scale Temperature and Humidity Controlled Environmental Test Chamber

Overview

The OK-TH Series Large-Scale Temperature and Humidity Controlled Environmental Test Chamber is an industrial-grade climatic simulation system engineered for rigorous reliability validation under controlled thermal and hygrothermal stress conditions. Based on the principle of forced-air convection combined with precision PID-controlled refrigeration and steam-based humidification, it replicates real-world environmental profiles—including extreme cold, high heat, and cyclic humidity—to assess material stability, component integrity, and functional performance across extended exposure durations. Designed for compliance-driven testing environments, the chamber supports full traceability and reproducible test execution per internationally recognized environmental stress standards. Its scalable architecture—available in six standard internal volumes (80 L to 1000 L)—enables adaptation to diverse specimen footprints, from automotive ECUs and aerospace avionics modules to large-scale battery packs and medical device enclosures.

Key Features

• High-stability microprocessor-based controller with 7-inch color TFT touchscreen, supporting real-time parameter monitoring, multi-segment programmable profiles, and bilingual (English/Chinese) UI navigation.
• Dual-stage hermetic refrigeration system utilizing environmentally compliant R404A/R23 mixed refrigerant, enabling stable operation down to –70 °C without external chillers or liquid nitrogen supplementation.
• Steam-humidification system with stainless-steel boiler and PID-modulated water feed, delivering precise RH control across 20–98 %RH (optionally extended to 5–98 %RH for low-RH corrosion studies).
• Full SUS#304 stainless-steel construction for both inner and outer chambers, ensuring long-term corrosion resistance and cleanroom-compatible surface finish.
• Multi-layer laminated observation window with integrated indium tin oxide (ITO) conductive film, providing unobstructed visual access while maintaining thermal and moisture barrier integrity.
• Robust safety architecture including over-temperature cutoff, compressor high-pressure shutdown, humidity sensor failure alarm, door-open interlock, and real-time fault logging with on-screen diagnostic codes.

Sample Compatibility & Compliance

The OK-TH chamber accommodates specimens up to 1000 L in volume, with standardized 50 mm diameter cable/port access on the left wall for external signal routing, power feeding, or sensor integration. Internal shelving—two adjustable tiers made from perforated SUS#304—supports uniform airflow distribution and minimizes thermal shadowing. The system meets mechanical and operational requirements of multiple international test standards, including MIL-STD-810G Method 502.5 (low temperature), Method 501.5 (high temperature), Method 507.5 (humidity), as well as IEC 60068-2-1 (cold), IEC 60068-2-2 (dry heat), IEC 60068-2-78 (steady-state humidity), and IEC 60068-2-30 (cyclic humidity). It also satisfies the structural and instrumentation criteria outlined in GB/T 2423.1–2423.4 (China National Standards), GJB 150.3–150.4 (PLA General Specification), and ISO 16750-4 (road vehicles—environmental conditions).

Software & Data Management

The embedded controller logs all critical parameters—including chamber setpoints, actual temperature/humidity readings, ramp rates, alarm events, and runtime statistics—at user-configurable intervals (1–60 seconds). Data export is supported via USB flash drive in CSV format for offline analysis in Excel or statistical software (e.g., JMP, Minitab). Optional Ethernet or RS485 communication enables integration into centralized laboratory information management systems (LIMS) or SCADA platforms. While the base unit does not include FDA 21 CFR Part 11-compliant electronic signature or audit trail functionality, the controller firmware supports time-stamped event logging with operator ID input—a prerequisite for GLP/GMP-aligned validation protocols when paired with documented SOPs and periodic calibration records.

Applications

This chamber serves as a core tool in quality assurance laboratories for accelerated aging, qualification testing, and design verification. Typical use cases include: evaluating solder joint reliability in PCB assemblies under thermal cycling with humidity bias; assessing seal integrity and condensation resistance of IP67-rated enclosures; validating thermal management performance of Li-ion battery modules at sub-zero start-up conditions; conducting coating adhesion and blistering tests per ASTM D714 and ISO 4628; performing shelf-life studies on pharmaceutical packaging under ICH Q1A(R2) stability protocols; and simulating tropical storage environments for consumer electronics per JEDEC JESD22-A110.

FAQ

What is the standard warranty period for the OK-TH chamber?

The unit carries a 12-month parts-and-labor warranty from date of commissioning, covering manufacturing defects in materials and workmanship.

Can the chamber be validated for IQ/OQ/PQ documentation?

Yes—each unit ships with a factory calibration certificate (traceable to NIST-equivalent national standards) and supports third-party qualification using calibrated reference sensors and documented test scripts.

Is remote monitoring capability available?

Remote status viewing and basic setpoint adjustment are possible via optional Ethernet module and web-based HMI; full supervisory control requires integration with external SCADA infrastructure.

What maintenance is required for long-term reliability?

Quarterly inspection of condensate drain lines, annual cleaning of evaporator coils and humidifier tank, biannual verification of sensor accuracy, and replacement of desiccant filters every 18 months under continuous operation.

Does the chamber support custom test profiles beyond standard cycles?

Yes—the controller allows up to 100 programmable segments per profile, including ramp/soak steps, humidity modulation synchronized with temperature transitions, and conditional branching based on elapsed time or sensor feedback.