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WITec Alpha 300R High-Performance Confocal Raman Microscope

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Origin Beijing, China
Manufacturer Type Authorized Distributor
Origin Category Domestic (PRC)
Model WITec Alpha 300R
Price €500,000
Instrument Type Confocal Raman Microspectrometer
Spectral Range 300–1100 nm
Spectral Resolution 1 cm⁻¹
Spatial Resolution Lateral 0.3 µm, Axial 0.8 µm (at 532 nm)
Minimum Wavenumber 10 cm⁻¹
Spectral Reproducibility ±0.02 cm⁻¹

Overview

The WITec Alpha 300R is a high-precision confocal Raman microspectrometer engineered for nanoscale chemical imaging and quantitative molecular characterization. Based on true confocal optical architecture—achieved via single-mode fiber coupling from laser source to microscope objective and onward to spectrometer—it eliminates mechanical pinholes while maintaining diffraction-limited spatial resolution and exceptional signal fidelity. Unlike conventional reflective or refractive confocal systems, the fiber-to-fiber design minimizes alignment sensitivity to ambient thermal drift and humidity fluctuations, ensuring long-term spectral stability critical for stress mapping, peak-shift quantification, and extended integration experiments. The system operates across a broad spectral window (300–1100 nm), supports low-wavenumber detection down to 10 cm⁻¹, and delivers spectral reproducibility of ±0.02 cm⁻¹—enabling reliable inter-laboratory comparison and longitudinal process monitoring in regulated environments.

Key Features

  • True confocal design with single-mode fiber coupling at both excitation and collection paths—no physical pinhole, no alignment drift, >80% optical throughput efficiency
  • Lateral spatial resolution of 0.3 µm and axial resolution of 0.8 µm (measured at 532 nm excitation), enabling sub-diffraction chemical mapping of heterogeneous materials
  • High-throughput Raman imaging: real-time 2D and 3D hyperspectral mapping with automated stage control and hardware-synchronized acquisition
  • Modular platform architecture supporting seamless integration of atomic force microscopy (AFM-Raman), tip-enhanced Raman spectroscopy (TERS), and correlative RISE (Raman Imaging and Scanning Electron Microscopy) via TESCAN SEM interfaces
  • Thermally stabilized optical bench and passive vibration isolation—designed for continuous operation in standard laboratory environments without active cooling or climate control

Sample Compatibility & Compliance

The Alpha 300R accommodates a wide range of solid, thin-film, and encapsulated samples—including semiconductors, battery electrodes, polymer composites, geological specimens, and biological tissues—without requiring conductive coating or vacuum conditions. Its non-destructive, label-free measurement principle aligns with ISO/IEC 17025 requirements for method validation in accredited testing laboratories. For pharmaceutical and medical device applications, the system supports audit-trail-enabled data acquisition compliant with FDA 21 CFR Part 11 when operated with WITec’s ProjectX software suite under validated SOPs. All spectral calibrations are traceable to NIST SRM 2241 (silicon reference) and certified per ISO 17025 calibration procedures.

Software & Data Management

ProjectX, WITec’s proprietary acquisition and analysis platform, provides full control over acquisition parameters, automated spectral preprocessing (cosmic ray removal, baseline correction, fluorescence subtraction), and multivariate analysis including PCA, cluster analysis, and spectral unmixing. Raw hyperspectral datasets are stored in vendor-neutral HDF5 format with embedded metadata (laser power, integration time, objective magnification, grating selection). The software includes built-in tools for quantitative peak fitting (Voigt/Lorentzian models), stress/strain calculation from Raman shift maps, and crystallinity index derivation. Data export supports ASTM E131-compliant spectral exchange formats (.spc, .jdx) and direct import into MATLAB, Python (via h5py), and commercial chemometrics packages.

Applications

  • Nanomaterial characterization: graphene layer counting, carbon nanotube chirality assignment, MoS₂ phase identification
  • Failure analysis in microelectronics: residual stress mapping in SiN passivation layers, dopant distribution in FinFET structures
  • Pharmaceutical solid-state analysis: polymorph differentiation, API-excipient interaction assessment, tablet coating uniformity verification
  • Geosciences: mineral phase identification in thin sections, fluid inclusion composition profiling
  • Life sciences: label-free cell typing, lipid droplet distribution in adipocytes, collagen cross-linking assessment in tissue sections

FAQ

Is the Alpha 300R compatible with vacuum or controlled-atmosphere stages?
Yes—the microscope port configuration supports third-party environmental chambers (e.g., Linkam, Instec) for in situ temperature-, gas-, or humidity-controlled Raman measurements.
Can spectral calibration be performed automatically during acquisition?
Yes—real-time internal calibration using integrated silicon reference is triggered before each map or upon user-defined time intervals, ensuring wavenumber accuracy throughout multi-hour experiments.
What level of technical support is provided for method development?
WITec offers application-specific protocol development services, including custom spectral libraries, automated ROI definition scripts, and GLP-compliant validation documentation packages.
Does the system meet ISO/IEC 17025 requirements for accredited laboratories?
When deployed with documented SOPs, calibrated reference standards, and ProjectX audit-trail logging enabled, the Alpha 300R meets the technical competence criteria outlined in ISO/IEC 17025:2017 Clause 6.4 (Equipment) and Clause 7.7 (Ensuring Validity of Results).

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