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X-Rite Ci7500 Benchtop Sphere Spectrophotometer

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Brand X-Rite
Model Ci7500
Measurement Principle D/8° (Diffuse Illumination / 8° Viewing) with Integrated Sphere
Wavelength Range 360–750 nm
Optical Geometry SCI & SCE Simultaneous
Aperture Options 25 mm & 10 mm
Repeatability (White Tile) ≤0.03 ΔE* uv (D65, UV Filter On)
Inter-Instrument Agreement (SCI) ≤0.15 avg. ΔE CIELAB
Spectral Bandwidth 10 nm
Reflectance Range 0–200%
Measurement Cycle Time <3 s

Overview

The X-Rite Ci7500 Benchtop Sphere Spectrophotometer is a high-precision, production-grade color measurement instrument engineered for consistent, repeatable reflectance analysis of opaque and textured materials across industrial quality control environments. Utilizing a dual-beam D/8° optical geometry with integrated 150 mm diameter sphere, the Ci7500 delivers simultaneous Spectular Component Included (SCI) and Specular Component Excluded (SCE) measurements—enabling robust distinction between colorant formulation consistency (SCI) and surface appearance evaluation (SCE). Its 360–750 nm spectral range, sampled at 10 nm intervals, complies with CIE 15:2018 and ISO/CIE 11664 standards for spectral data acquisition. Designed for integration into regulated manufacturing workflows, the Ci7500 supports full traceability via NIST-traceable calibration references and embedded environmental monitoring—ensuring measurement validity under varying ambient conditions.

Key Features

  • Simultaneous SCI/SCE measurement mode eliminates manual geometry switching and reduces operator-induced variability.
  • Onboard high-resolution video preview with image capture enables precise sample positioning and visual documentation of measurement location—critical for heterogeneous or patterned surfaces (e.g., woven textiles, molded plastics).
  • Integrated temperature and humidity sensors log environmental metadata with every spectral reading, supporting root-cause analysis in GLP/GMP-compliant audits.
  • Automatic aperture detection identifies 25 mm and 10 mm ports without user intervention, minimizing setup errors and ensuring consistent illumination area.
  • Sub-3-second measurement cycle time maintains throughput in high-volume QC labs while preserving photometric stability through thermal management of the xenon flash lamp and grating spectrometer.
  • Vertical or configurable horizontal orientation accommodates diverse sample handling requirements—including conveyor-integrated setups or benchtop workflows with space constraints.

Sample Compatibility & Compliance

The Ci7500 is validated for measuring solid, non-transmissive substrates including but not limited to: dyed and printed textiles, automotive coatings, powder-coated metal panels, injection-molded thermoplastics, paperboard packaging, and ceramic glazes. Its large 25 mm aperture ensures representative sampling of coarse textures and macro-heterogeneous surfaces, while the optional 10 mm port supports smaller or higher-resolution regional analysis. Instrument performance adheres to ASTM E308-22 (computing tristimulus values from spectral data), ISO 13655:2017 (spectral measurement of prints), and ISO 27668-1:2012 (instrument intercomparison protocols). Full compliance with FDA 21 CFR Part 11 is achievable when deployed with validated Color iQC software configurations—including electronic signatures, audit trails, and role-based access control.

Software & Data Management

The Ci7500 operates natively with X-Rite’s Color iQC and Color iMatch software suites—both designed for enterprise-scale color data governance. Color iQC provides workflow automation with enforced parameter templates, digital approval routing, and revision-controlled configuration libraries—ensuring uniform interpretation of tolerances across global sites. Color iMatch leverages spectral matching algorithms compliant with ISO 18314-2:2016 to generate optimized pigment formulations using proprietary constraint solvers and metamerism prediction. All spectral data is stored in vendor-neutral *.qtx format, enabling long-term archival and cross-platform interoperability. NetProfiler™ integration allows periodic performance validation against certified reference standards (e.g., BCRA Series II tiles), generating PDF reports compliant with ISO/IEC 17025 internal audit requirements.

Applications

  • Textile & Apparel: Batch-to-batch shade matching of woven/knitted fabrics; verification of dye lot conformance per AATCC Evaluation Procedure 1; spectral assessment of colorfastness post-wash or light exposure.
  • Coatings & Paints: Quantitative evaluation of metallic flake orientation effects; batch release testing against OEM color specifications (e.g., Ford ES-XZ101, GM 9985770); gloss-independent color acceptance criteria.
  • Plastics & Polymers: Monitoring chromatic shift during extrusion or injection molding cycles; detecting thermal degradation via UV-VIS spectral drift; validating masterbatch dispersion homogeneity.
  • Packaging & Printing: Verification of spot color fidelity on corrugated board or flexible films; spectral correlation between prepress proofs and press runs per ISO 12647-2.
  • Automotive Interiors: Multi-angle color assessment of leather, vinyl, and composites under controlled illuminants (D65, A, F2); inter-lab reproducibility validation across Tier-1 supplier networks.

FAQ

Does the Ci7500 support regulatory compliance for pharmaceutical or medical device packaging?
Yes—when configured with validated Color iQC workflows and backed by documented IQ/OQ/PQ protocols, the system meets FDA 21 CFR Part 11 requirements for electronic records and signatures, including full audit trail generation and secure user authentication.
Can historical spectral data acquired on older Ci6x instruments be directly compared to Ci7500 measurements?
Yes—the Ci7500 maintains backward compatibility through firmware-level spectral interpolation and standardized CIE 1931 2° observer weighting, ensuring metrological continuity across the Ci7x platform and legacy Ci6x devices calibrated to the same NIST-traceable standards.
Is remote diagnostics and firmware updates supported over Ethernet?
Yes—via X-Rite’s Secure Remote Access Protocol (SRAP), authorized service engineers can perform real-time health monitoring, spectral recalibration verification, and version-controlled firmware deployment without physical site visits.
How does NetProfiler mitigate inter-instrument variation in multi-site deployments?
NetProfiler quantifies deviation vectors across the full 360–750 nm spectrum using certified reference tiles, then applies instrument-specific correction matrices—reducing inter-unit ΔE differences to ≤0.15 avg. CIELAB, as verified per ISO 13655 Annex B.
What environmental conditions are required for optimal long-term stability?
Operation within 15–30°C ambient temperature and 20–80% RH (non-condensing) is recommended; onboard sensors automatically flag out-of-spec conditions and append contextual metadata to each measurement record for downstream statistical process control (SPC) analysis.

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