UV Visible Near Infrared Spectrophotometer
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| Brand | FEMTOEASY |
|---|---|
| Origin | France |
| Model Variants | SWIR 320, SWIR 640, SWIR 1280, VSWIR 656/L, VSWIR 1296/L, UV-VIS, Yb, Ti:Sa, IR-L, Ti:Sa-L, Broadband-L |
| Spectral Range | 240–1700 nm |
| Detector Types | InGaAs (SWIR), CMOS (UV-VIS-IR) |
| Resolution Options | 0.08–20 MPx |
| Spectral Sampling | 0.11–1.7 nm/pixel |
| Spectral Resolution | <0.35–3.5 nm (FWHM) |
| Spatial Resolution | 3.6–25 µm |
| Input Beam Diameter | 3.3–12.5 mm |
| Exposure Time | 0.01–10,000 ms |
| Interface | USB 3.1 |
| Shutter Type | Global (InGaAs & most CMOS) / Rolling (Broadband-L CMOS) |
| Dimensions | 102×101×52 mm to 117×102×52 mm |
| Brand | HanHe |
|---|---|
| Origin | Shandong, China |
| Model | H-L1900 |
| Spectral Range | 190–1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.8 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Photometric Accuracy | ±0.3%T (0–100%T), ±0.002 Abs (0–0.5 Abs), ±0.004 Abs (0.5–1.0 Abs) |
| Baseline Drift | ±0.002 A/h |
| Baseline Flatness | ±0.002 A |
| Stray Light | ≤0.1%T |
| Photometric Repeatability | ≤0.15%T (0–100%T), ≤0.001 Abs (0–0.5 Abs), ≤0.002 Abs (0.5–1.0 Abs) |
| Detector | Imported Silicon Photodiode |
| Light Sources | Long-life Deuterium Lamp & Tungsten Halogen Lamp |
| Display | 128×64 Dot-Matrix LCD |
| Data Interface | USB Port |
| Dimensions | 460 × 380 × 180 mm |
| Weight | 18 kg |
| Brand | HanHe |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | H-L72 Series |
| Spectral Range | 350–1050 nm |
| Spectral Bandwidth | 6 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤1 nm |
| Photometric Accuracy | Contact Technical Support |
| Baseline Drift | See Detailed Specifications |
| Baseline Flatness | Contact Technical Support |
| Spectral Range | 190–3200 nm |
|---|---|
| Bandwidth (UV-VIS) | 0.2, 0.5, 1, 2, 3, 5 nm |
| Bandwidth (NIR) | 0.8, 2, 4, 8, 12, 20 nm |
| Wavelength Accuracy | ±0.5 nm (UV/VIS), ±2.0 nm (NIR) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS), ≤1.0 nm (NIR) |
| Brand | INNOTEG |
|---|---|
| Origin | China |
| Manufacturer Type | Manufacturer |
| Model | IUS-190 |
| Spectral Range | 190–3200 nm |
| Bandwidth (UV-VIS) | 0.2, 0.5, 1, 2, 3, 5 nm |
| Bandwidth (NIR) | 0.8, 2, 4, 8, 12, 20 nm |
| Wavelength Accuracy | ±0.5 nm (UV/VIS), ±2.0 nm (NIR) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS), ≤1.0 nm (NIR) |
| Brand | INNOTEG |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | IUS-200-10 |
| Spectral Range | 280–2500 nm |
| Slit Bandwidth | UV-VIS: 0.2, 0.5, 1, 2, 3, 5 nm |
| NIR | 0.8, 2, 4, 8, 12, 20 nm |
| Wavelength Accuracy | ±0.5 nm (UV/VIS), ±2.0 nm (NIR) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS), ≤1.0 nm (NIR) |
| Brand | INNOTEG |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | IUS-200-15 |
| Spectral Range | 280–2500 nm |
| Slit Bandwidth | UV-VIS: 0.2, 0.5, 1, 2, 3, 5 nm |
| NIR | 0.8, 2, 4, 8, 12, 20 nm |
| Wavelength Accuracy | ±0.5 nm (UV/VIS), ±2.0 nm (NIR) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS), ≤1.0 nm (NIR) |
| Integrating Sphere Diameter | 150 mm |
| Optical Design | Dual-beam, dual-grating, dual-detector architecture |
| Detector Configuration | Separate optimized detectors for UV/VIS and NIR ranges |
| Software Compatibility | Windows 7/10 |
| Data Export Formats | TXT, CSV, XLSX |
| Compliance Standards | GB/T 2680-2021, JGJ/T 151-2008, ISO 9050:2003, GB/T 22476-2008, GB/T 36261-2018, GB/T 25261-2010, JG/T 235-2014, JGJ/T 287-2014, GJB 798-90, GJB 2502.2-2006 |
| Brand | INNOTEG |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | IUS-200-6 |
| Spectral Range | 280–2500 nm |
| Slit Bandwidth | [UV-VIS] 0.2, 0.5, 1, 2, 3, 5 nm |
| Wavelength Accuracy | ±0.5 nm (UV/VIS), ±2.0 nm (NIR) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS), ≤1.0 nm (NIR) |
| Brand | Ocean Optics |
|---|---|
| Model | FX UV-VIS / FX VIS-NIR / FX XR |
| Wavelength Range | 200–850 nm / 350–1000 nm / 200–1025 nm |
| Optical Resolution (FWHM) | 1.33 nm (typ.) / 1.69 nm (typ.) / Not Specified |
| Integration Time | 10 µs – 10 s |
| Detector | Back-Illuminated CMOS |
| A/D Resolution | 16 bit |
| Signal-to-Noise Ratio | 290:1 |
| Dynamic Range | 5000:1 |
| Onboard Buffer | 50,000 spectra |
| Max Acquisition Rate | 4,500 spectra/s |
| Grating Options | GRATING_#1 / GRATING_#3 / GRATING_#XR1 |
| Slit Width | 25 µm |
| Connectivity | Gigabit Ethernet, USB 3.0, RS-232, Wi-Fi |
| Onboard Processing | Spectral averaging (up to 5,000 spectra), timestamping, SNR enhancement |
| Brand | Ocean Optics |
|---|---|
| Origin | USA |
| Model | HDX |
| Wavelength Range (HDX-UV-VIS) | 200–800 nm |
| Wavelength Range (HDX-VIS-NIR) | 350–925 nm |
| Wavelength Range (HDX-XR) | 200–1100 nm |
| Optical Resolution (FWHM) | ~0.73 nm (UV-VIS), ~0.7 nm (VIS-NIR), ~1.1 nm (XR) |
| Slit Options (HDX-Raman) | 25 µm, 50 µm |
| Raman Shift Range | 150–3400 cm⁻¹ |
| Optical Resolution (Raman) | 9 cm⁻¹ (25 µm), 12 cm⁻¹ (50 µm) |
| Integration Time | 6 ms – 10 s |
| Dynamic Range | 12,000:1 |
| SNR | 400:1 |
| Operating Temperature | 0–40 °C |
| Storage Temperature | −30–70 °C |
| Dimensions | 88.9 × 63.5 × 52.4 mm³ |
| Weight | 400 g |
| Interface Options | USB 2.0, Gigabit Ethernet, RS-232, AP Wi-Fi |
| Onboard Memory | Up to 50,000 spectra |
| Detector | Back-illuminated CCD |
| Platform | X-Platform electronics |
| Brand | Ocean Optics |
|---|---|
| Origin | USA |
| Model Series | HR2, HR4, HR6 |
| Wavelength Range (configurable) | 185–1100 nm |
| Optical Resolution (FWHM) | 0.06–7.24 nm |
| Integration Time | 1 µs–10 s |
| Dynamic Range | 3400:1 to 12000:1 |
| Signal-to-Noise Ratio | 380:1 to 3000:1 |
| Interface | USB Type-C, SMA, 16-pin Samtec TFM, RS-232 |
| Dimensions | 148.8 × 106.4 × 48.2 mm³ |
| Weight | 930.6 g |
| Operating Temperature | 0–55 °C |
| Storage Temperature | −30–70 °C |
| Software | OceanDirect SDK (cross-platform API) |
| Brand | Ocean Optics |
|---|---|
| Origin | USA |
| Model Series | SR2, SR4, SR6 |
| Wavelength Range | 185–1100 nm (configurable) |
| Resolution (FWHM) | 0.28–11.52 nm (model- and grating-dependent) |
| Integration Time | 1 µs – 10 s (SR2: 1 µs–2 s |
| SR4 | 3.8 ms–10 s |
| SR6 | 7.2 ms–5 s) |
| Dynamic Range | 3400:1 (SR2) / 1300:1 (SR4) / 12000:1 (SR6) |
| SNR | 380:1 (SR2) / 3000:1 (SR4) / 3500:1 (SR6) |
| Detector | CMOS (SR2), 3648-pixel CCD (SR4), 2048-pixel CCD (SR6) |
| Interface | USB Type-C, SMA fiber port, 16-pin Samtec TFM, RS-232 |
| Dimensions | 88.1 × 63.5 × 31.45 mm |
| Weight | 275 g |
| Operating Temp. | 0–55 °C |
| Storage Temp. | −30–70 °C |
| Slit Options | 5, 10, 25, 50, 100, or 200 µm |
| Brand | Ocean Optics |
|---|---|
| Origin | USA |
| Model | ST UV / ST VIS / ST NIR |
| Wavelength Range | 185–650 nm (UV), 350–810 nm (VIS), 645–1085 nm (NIR) |
| Optical Resolution (FWHM, 25 µm slit) | 2.2 nm |
| Signal-to-Noise Ratio | 190:1 (single scan @ 10 ms), 2250:1 (1 s average, non-binned) |
| Dynamic Range | 1000:1 (single scan) |
| Integration Time | 3.8 ms – 6 s |
| Stray Light | < 2.0 AU |
| A/D Resolution | 14-bit |
| Scan Rate | 160 Hz (non-binned) |
| Thermal Stability | 0.05 pixel/°C |
| Detector | 1516-pixel linear CMOS |
| Input Connector | SMA 905 |
| Interface | USB-C + Samtec TFM-108-02-L-DH accessory header |
| Dimensions | 42.1 × 40.3 × 26.6 mm |
| Weight | 70.4 g |
| Environmental Compliance | EN 61326-1:2013, EN 55011:2009+A1:2010, IEC 60068-2-64 & -2-32 |
| Brand | Topo |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | TP-760A |
| Price Range | USD 21,000–28,000 (FOB) |
| Spectral Range | 280–2500 nm |
| Spectral Bandwidth | UV/VIS: 0.1, 0.2, 0.5, 1.0, 2.0, 3.0, 5.0 nm (selectable) |
| NIR | 0.4–16.0 nm (auto/manual) |
| Wavelength Accuracy | ±0.5 nm (UV/VIS) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS) |
| Photometric Accuracy | ±0.3% T |
| Baseline Flatness | ±0.008 A (280–2500 nm, after 30-min warm-up) |
| Brand | Topo |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Direct Manufacturer |
| Region Classification | Domestic (China) |
| Model | TP720 |
| Price Range | USD 21,000 – 35,000 (FOB Tianjin) |
| Spectral Range | 190–3200 nm |
| Spectral Bandwidth (UV/VIS) | 0.1, 0.2, 0.5, 1.0, 2.0, 3.0, 5.0 nm (selectable) |
| Spectral Bandwidth (NIR) | 0.4–16.0 nm (auto/manual) |
| Wavelength Accuracy | ±0.5 nm (UV/VIS) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS) |
| Photometric Accuracy | ±0.3% T |
| Baseline Flatness | ±0.005 A (200–2500 nm, after 30-min warm-up) |
| Brand | Topo |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | TP760 |
| Spectral Range | 280–2500 nm |
| Slit Bandwidth | UV-Vis: 2.0 / 3.0 / 5.0 nm (selectable) |
| NIR | 5.0–20.0 nm (auto/manual) |
| Wavelength Accuracy | ±0.5 nm (UV/VIS), ±2.0 nm (NIR) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS), ≤1.0 nm (NIR) |
| Photometric Accuracy | ±0.3% T |
| Baseline Flatness | ±0.005 A (200–2500 nm, after 30-min warm-up) |
| Brand | X-Rite |
|---|---|
| Model | Ci7500 |
| Measurement Principle | D/8° (Diffuse Illumination / 8° Viewing) with Integrated Sphere |
| Wavelength Range | 360–750 nm |
| Optical Geometry | SCI & SCE Simultaneous |
| Aperture Options | 25 mm & 10 mm |
| Repeatability (White Tile) | ≤0.03 ΔE* uv (D65, UV Filter On) |
| Inter-Instrument Agreement (SCI) | ≤0.15 avg. ΔE CIELAB |
| Spectral Bandwidth | 10 nm |
| Reflectance Range | 0–200% |
| Measurement Cycle Time | <3 s |
| Brand | Youyunpu |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | YP-EU Series |
| Spectral Range | 190–1020 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ±1.0 nm |
| Wavelength Repeatability | ≤0.5 nm |
| Photometric Accuracy | ±0.002 A (0–0.5 A), ±0.004 A (0.5–1.0 A), ±0.3% T (0–100% T) |
| Baseline Drift | ≤0.002 A/h (at 500 nm, 0 A) |
| Baseline Flatness | ±0.003 A |