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ZOLIX Chame-IH100 LED Luminous Intensity Meter

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Brand ZOLIX
Origin Beijing, China
Manufacturer Type Original Equipment Manufacturer (OEM)
Country of Origin China
Model Chame-IH100
Price USD 5,600 (FOB Beijing)

Overview

The ZOLIX Chame-IH100 LED Luminous Intensity Meter is a precision optical measurement instrument engineered for quantitative photometric and colorimetric characterization of light-emitting diodes under standardized geometrical and spectral conditions. It operates in strict compliance with CIE Publication 127:2007 — “Measurement of LEDs”, which defines two standardized measurement conditions: Condition A (far-field, 316 mm source-to-detector distance) and Condition B (near-field, 100 mm source-to-detector distance). The Chame-IH100 is configured for Condition B, with a fixed 100 mm test distance and a calibrated detection aperture of 1.0 cm², ensuring repeatable spatial response and minimizing angular sensitivity deviations. The system integrates a thermoelectrically stabilized silicon photodiode sensor coupled with a high-resolution CCD-based spectroradiometer (380–780 nm, 0.5 nm optical resolution), enabling simultaneous acquisition of absolute spectral power distribution (in mW/nm), photometric quantities (e.g., luminous intensity in candela), and full CIE colorimetric parameters.

Key Features

  • Compliant with CIE 127:2007 Condition B (100 mm measurement distance, 1 cm² detector area)
  • Simultaneous spectral acquisition and photometric calculation without manual recalibration
  • Thermally stabilized optical path to minimize drift during extended measurement sessions
  • Integrated cosine-corrected input optics ensuring accurate angular response up to ±85° incidence
  • Real-time calculation of CIE 1931 chromaticity coordinates (x, y), dominant wavelength (nm), excitation purity, and correlated color temperature (CCT)
  • Full spectral radiometric output: absolute spectral irradiance (µW/cm²·nm) and spectral radiant intensity (mW/sr·nm)
  • Computation of general color rendering index (CRI, Ra) and extended metrics including R1–R15 and TM-30-15 fidelity and gamut indices
  • USB 2.0 interface with native support for Windows-based control software and SCPI-compatible remote command set

Sample Compatibility & Compliance

The Chame-IH100 supports measurement of discrete through-hole and surface-mount (SMD) LEDs, LED packages (including COB and multi-die arrays), and small-area LED modules with active emitting surfaces ≤ 5 mm in diameter. Fixture alignment is facilitated by an integrated XYZ micrometer stage (±10 mm travel, 10 µm resolution) and adjustable collimating lens mount. All photometric calibrations are traceable to NIM (National Institute of Metrology, China) standards, with annual calibration certificates available per ISO/IEC 17025 requirements. The instrument meets electromagnetic compatibility (EMC) criteria per GB/T 18268.1–2010 (equivalent to IEC 61326-1) and safety specifications per GB 4793.1–2007 (IEC 61010-1). Data integrity protocols align with GLP principles, supporting audit-ready metadata logging (operator ID, timestamp, ambient temperature/humidity, integration time, slit width).

Software & Data Management

The bundled ZOLIX SpectraView Pro software provides a validated platform for instrument control, spectral visualization, batch report generation, and export to industry-standard formats (CSV, XML, CIE xyY, IESNA LM-63). Each measurement session automatically embeds device-specific metadata—including calibration date, detector responsivity curve, and spectral stray-light correction coefficients—ensuring full traceability. Software features include customizable pass/fail thresholds for color binning, comparative spectral overlay, and automated CRI deviation reporting against user-defined reference spectra. For regulated environments, optional 21 CFR Part 11 compliance packages are available, delivering electronic signature workflows, role-based access control, and immutable audit trails for all configuration changes and result exports.

Applications

  • LED manufacturing QA/QC: verification of luminous intensity binning, chromaticity shift under drive current variation, and thermal roll-off profiling
  • R&D laboratories: spectral stability analysis of novel phosphor-converted LEDs and micro-LED arrays
  • Lighting design validation: correlation of near-field photometric data with far-field IES files via empirical scaling models
  • Academic research: investigation of human-centric lighting metrics (e.g., melanopic EDI, circadian stimulus) derived from full-spectrum input
  • Third-party testing labs: accredited conformance testing against GB/T 24824–2009 (Chinese national standard for LED modules) and IEC TR 62778

FAQ

What is the minimum measurable luminous intensity?

The Chame-IH100 achieves a lower detection limit of 0.01 cd under 100 ms integration time, optimized for low-power indicator LEDs.
Can it measure pulsed or PWM-driven LEDs?

Yes—the system supports synchronous gated acquisition triggered by external TTL signals, enabling accurate time-resolved spectral capture of transient emission profiles.
Is NIST-traceable calibration available?

While factory calibration is traceable to NIM, optional NIST-traceable calibration services are provided through ZOLIX’s authorized metrology partners upon request.
Does the software support automated pass/fail classification per MacAdam ellipse limits?

Yes—users may define custom chromaticity tolerance zones (u’v’, xy, or CCT-based) and generate real-time binning reports compliant with JEDEC JESD78A and ENERGY STAR SSL program requirements.
How often is recalibration recommended?

Annual recalibration is recommended under normal operating conditions; biannual calibration is advised for instruments used in production line environments exceeding 8 hours/day.

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