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ZOLIX FI-RXF50 Fourier Transform Infrared (FT-IR) Spectrometer

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Brand ZOLIX
Origin Beijing, China
Manufacturer Type Direct Manufacturer
Instrument Type Laboratory FT-IR Spectrometer
Spectral Range 5000–500 cm⁻¹ (ZnSe anti-humidity version)
Spectral Resolution < 0.9 cm⁻¹
Wavenumber Accuracy < 0.01 cm⁻¹
Interferometer Domestic high-stability立体角镜 interferometer with permanent alignment
Beam Splitter Ge-coated KBr, optimized for mid-IR
Detector Fast-response pyroelectric detector
IR Source High-energy SiN mid-IR source
Laser Solid-state diode laser (>10 yr lifetime)
Environmental Sealing Integrated desiccant system with real-time internal T/RH monitoring and auto-humidity alarm
Dimensions 17 × 39.5 × 22.3 cm
Connectivity Ethernet interface
Power 100–240 VAC, 50–60 Hz

Overview

The ZOLIX FI-RXF50 is a fully domestic, laboratory-grade Fourier Transform Infrared (FT-IR) spectrometer engineered for robustness, operational simplicity, and metrological reliability in routine qualitative identification and comparative spectral analysis. Based on Michelson-type interferometry with a permanently aligned solid-angle mirror interferometer, the instrument acquires interferograms via rapid-scanning motion and applies fast Fourier transformation to generate high-fidelity absorbance/transmittance spectra across the mid-infrared region. Its compact footprint (17 × 39.5 × 22.3 cm), sealed optical bench architecture, and integrated environmental monitoring system make it suitable for deployment in teaching laboratories, quality control environments, and regulated industrial settings where space constraints, ambient variability, and long-term stability are critical factors.

Key Features

  • Permanently aligned solid-angle mirror interferometer — eliminates periodic realignment needs and ensures mechanical stability under thermal drift or minor vibration, supporting >10 years of continuous operation without performance degradation.
  • Ge-coated KBr beam splitter optimized for 5000–500 cm⁻¹ spectral coverage; ZnSe anti-humidity variant available for humid environments or hygroscopic sample analysis.
  • High-energy silicon nitride infrared source delivering stable broadband emission across the mid-IR range; user-replaceable without optical bench disassembly.
  • Long-lifetime solid-state diode laser (≥10 years) serving as internal wavelength reference; no alignment or recalibration required during service life.
  • Fully sealed, desiccated optical path with real-time internal temperature and relative humidity monitoring; visual alert triggered when humidity exceeds user-defined threshold.
  • Modular design enabling field replacement of key consumables — including IR source, desiccant cartridge, power supply, sample compartment windows, and detector — without specialized tools or factory intervention.
  • Wide environmental tolerance: operational within 10–35 °C and 20–80% RH (non-condensing), validated per IEC 61010-1 for laboratory equipment safety.

Sample Compatibility & Compliance

The FI-RXF50 supports universal sampling via standardized accessory interfaces compatible with ATR (attenuated total reflectance), transmission, diffuse reflectance, specular reflectance, and gas cell configurations. This flexibility enables direct analysis of solids (pellets, films, powders), liquids (neat or solvent-diluted), pastes, gels, and low-pressure gases without hardware modification. All optical components comply with ISO 17025 traceability requirements when used with NIST-traceable polystyrene or polyethylene reference standards. The instrument’s firmware and data acquisition logic adhere to GLP/GMP principles: spectral metadata (date/time, operator ID, instrument serial, calibration status) is embedded in every saved spectrum file. While not pre-certified for FDA 21 CFR Part 11, the software architecture supports audit trail configuration, electronic signature integration, and secure user role management — essential for regulated QA/QC workflows in pharmaceutical, polymer, and fine chemical manufacturing.

Software & Data Management

Bundled ZOLIX SpectraPro™ software provides full instrument control, real-time spectral preview, baseline correction, peak search, library searching (user-expandable with commercial or in-house spectral databases), and quantitative analysis via classical least-squares (CLS) or partial least-squares (PLS) regression. Raw interferogram and processed spectral data are stored in open-format .SPA files compliant with ASTM E1421 and JCAMP-DX v5.0 standards, ensuring interoperability with third-party chemometric platforms (e.g., Unscrambler®, MATLAB, Python SciPy). Data export supports CSV, TXT, and PDF formats; batch processing and report templating are configurable for high-throughput labs. Network-enabled operation allows remote diagnostics, centralized firmware updates, and shared spectral library access across local area networks.

Applications

  • Academic instruction: Ideal for undergraduate spectroscopy labs due to intuitive interface, fault-tolerant design, and minimal setup time for ATR or transmission experiments.
  • Pharmaceutical QA/QC: Rapid identity testing of raw materials (APIs, excipients), finished dosage forms, and packaging components per USP and EP 2.2.24.
  • Polymer characterization: Identification of functional groups (C=O, O–H, C–Cl, C≡N), detection of oxidation or hydrolysis products, and verification of copolymer composition.
  • Materials science: Analysis of coatings, adhesives, composites, and nanomaterial surface functionalization.
  • Forensic and environmental screening: Detection of unknown organic residues, contaminants, or adulterants in seized samples or environmental matrices.

FAQ

Is the FI-RXF50 compliant with ISO/IEC 17025 for accredited testing laboratories?
Yes — when operated with documented calibration procedures, traceable reference standards, and controlled environmental conditions, the FI-RXF50 meets the technical requirements for spectral accuracy, resolution, and repeatability outlined in ISO/IEC 17025:2017 clause 7.2.2.
Can the instrument be upgraded to support far-IR or near-IR extensions?
No — the optical design, detector, and beam splitter are fixed for the mid-IR range (5000–500 cm⁻¹ standard). Optional KBr optics extend coverage to 8000–350 cm⁻¹ but do not enable true far-IR ( 5000 cm⁻¹) operation.
Does the software support automated pass/fail criteria for release testing?
Yes — SpectraPro™ allows definition of spectral similarity thresholds (e.g., correlation coefficient ≥0.995 vs. reference), peak presence/absence rules, and band ratio limits, with configurable pass/fail output and electronic record generation.
What maintenance is required beyond desiccant replacement?
None under normal use — the permanently aligned interferometer, solid-state laser, and sealed optical path eliminate routine optical alignment or lamp replacement. Annual verification using polystyrene film is recommended for regulatory compliance.
Is remote instrument monitoring supported?
Yes — Ethernet connectivity enables live status viewing (temperature, humidity, laser status, detector voltage), remote start/stop, and diagnostic log retrieval via standard web browser or dedicated client application.

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