Scanning Probe Microscopes
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| Brand | Abner |
|---|---|
| Origin | Jiangsu, China |
| Model | ABN-AFM-001 |
| Instrument Type | Material-oriented AFM |
| Sample Dimensions | Max 15 mm × 15 mm × 2 mm |
| Scan Range | 70 µm × 70 µm (X–Y), 17 µm (Z) |
| Lateral Resolution | ≤1 nm |
| Vertical Resolution | ≤0.1 nm |
| XY Noise | ≤0.01 nm RMS |
| Z Noise | ≤0.05 nm RMS |
| Scan Speed | Up to 10 Hz |
| Probe Compatibility | Si probes with spring constants from 0.01 N/m to 40 N/m |
| Scanner | High-precision closed-loop piezoelectric scanner |
| Environmental Requirements | 18–25 °C, ≤60% RH |
| Image Resolution | 512×512 to 2048×2048 pixels |
| Interface | USB and Ethernet |
| Power Supply | 220 V/50 Hz or 110 V/60 Hz |
| Brand | ACST |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ACST-AFM |
| Instrument Type | Biological AFM |
| Position Detection Noise | ≤0.15 nm RMS |
| Maximum Sample Size | 15 mm diameter |
| XY Stage Travel Range | 25 mm × 25 mm |
| Software | Aotu AFM |
| Imaging Modes | Contact, Tapping, Phase, Lateral Force, Advanced Force Spectroscopy, Conductive AFM, Magnetic AFM, Nanolithography |
| XY Scanner Range | >50 µm (closed-loop), <10 nm resolution (closed-loop), <1 nm resolution (open-loop) |
| Z Scanner Range | >16 µm |
| Z Sensor Noise | <5 nm |
| Z Feedback Noise | <0.2 nm |
| Z Actuation | Direct-drive stepper motor, 25 mm travel, 330 nm minimum step, 8 mm/min max speed |
| Optical System | 3 MP CCD camera, 45×–400× real-time magnification |
| Base Material | Solid granite for vibration isolation and mechanical stability |
| Probe Loading | Tool-free, rapid exchange design |
| Brand | AppNano |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | VertiSense |
| Instrument Type | Material Science AFM-Compatible SThM Module |
| Primary Function | Nanoscale Thermal Property Mapping (Topography + Thermal Conductivity + Temperature Distribution) |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GetReal |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Calibration Module |
| Brand | Truth Instruments Company Limited |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | AtomEdge Pro |
| Pricing | Available Upon Request |
| Brand | attocube |
|---|---|
| Origin | Germany |
| Model | attoCFM I |
| Instrument Type | Cryogenic Confocal Microscope for Quantum Materials Research |
| Positioning Noise | < 0.5 nm |
| Sample Size Capacity | Ø100 mm |
| Sample Stage Travel Range | 150 µm (fine scan) / 5 × 5 × 5 mm³ (coarse positioning) |
| Temperature Range | 1.8 K – 300 K |
| Magnetic Field | Up to 12 T (vector magnet optional) |
| Vacuum Operating Range | 1 × 10⁻⁶ mbar – 1 atm |
| Optical Resolution | ~550 nm (at 635 nm, NA = 0.82) |
| Scan Area | 30 × 30 µm² @ 4 K |
| Objective | Cryo-optimized Achromatic Objective, NA = 0.82, WD = 0.7 mm |
| Expandable Modules | AFM/MFM/PFM/KPFM/ct-AFM/cryo-Raman |
| Brand | attocube |
|---|---|
| Origin | Germany |
| Model | attoCFM I |
| Instrument Type | Magnetic Force Microscope (MFM) / Cryogenic Confocal Microscope |
| Positioning Noise | < 0.5 nm |
| Sample Size Capacity | Ø100 mm |
| Sample Stage Travel Range | 150 µm (fine scan) / 5 × 5 × 5 mm³ (coarse positioning) |
| Temperature Range | 1.8 K – 300 K |
| Magnetic Field | Up to 12 T (vector magnet optional) |
| Vacuum Operation | 1 × 10⁻⁶ mbar – 1 atm |
| Numerical Aperture (NA) | 0.82 |
| Optical Resolution | ~550 nm (@635 nm) |
| Working Distance (WD) | 0.7 mm |
| Confocal Scan Range | 30 × 30 µm² @4 K |
| Compatible Cryostats | attoDRY1000/2100, Quantum Design PPMS (1″/2″ bore) |
| Expandable Modules | AFM/MFM/PFM/KPFM/ct-AFM/cryo-Raman |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany (manufactured in Germany |
| Instrument Type | Research-grade industrial SPM platform |
| Magnet Strength | Up to 15 T |
| Temperature Range | 1.5 K – 300 K (continuous, closed-cycle) |
| Positioning Noise | < 0.5 nm RMS |
| Sample Dimensions | Max 100 mm × 50 mm × 20 mm |
| XY Scanner Range | 10 µm × 10 µm |
| Vibration Level | 0.12 nm RMS (typical) |
| Compliance | ASTM E2579, ISO/IEC 17025 compatible operation environment |
| Software Control | Integrated touchscreen interface with automated temperature/magnetic field ramping |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Model | attoDRY Lab |
| Instrument Type | Cryogenic Scanning Probe Microscope (SPM) |
| Magnetic Field Strength | Up to 15 T |
| Temperature Range | 1.5 K – 300 K (closed-cycle) |
| Positioning Noise | < 0.5 nm RMS |
| Sample Dimensions | Max 100 mm × 50 mm × 20 mm |
| XY Scanner Range | 10 µm × 10 µm |
| Vibration Level | 0.12 nm RMS (typ.) |
| Compliance | ASTM E2917, ISO/IEC 17025 compatible workflows, GLP/GMP-ready data logging |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Model | attoDRY Lab |
| Instrument Type | Magnetic Force Microscope (MFM) |
| Positioning Noise | 0.12 nm RMS |
| Sample Stage Travel Range | 5 mm × 5 mm × 5 mm |
| Temperature Range | 1.5 K – 300 K (configurable) |
| Maximum Magnetic Field | 15 T |
| Cooling Time (to base temperature) | ~1–2 hours |
| Control Interface | Integrated touchscreen with automated thermal and magnetic field sequencing |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Dimension Edge |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Positional Noise (X-Y, Closed-Loop) | ≤0.15 nm RMS at standard imaging bandwidth (up to 625 Hz) |
| Z-Noise (Closed-Loop) | 35 pm RMS at standard imaging bandwidth (up to 625 Hz) |
| Sample Diameter Capacity | 210 mm |
| XY Stage Travel Range | 150 mm × 150 mm |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Icon |
| Instrument Type | Atomic Force Microscope |
| X-Y Positioning Noise (Closed-Loop) | ≤0.15 nm RMS (Standard Imaging Bandwidth, up to 625 Hz) |
| Z Positioning Noise (Closed-Loop) | 35 pm RMS (Standard Imaging Bandwidth, up to 625 Hz) |
| Maximum Sample Diameter | 210 mm |
| Sample Stage Travel Range | 150 mm |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Manufacturer |
| Import Status | Imported |
| Model | Signature SPM |
| Instrument Category | Atomic Force Microscope |
| Instrument Type | Materials-Focused AFM |
| Spectroscopy Integration | Confocal Raman & Photoluminescence (PL) |
| Core Capability | True Co-Localized Multimodal Imaging (Topography + Nanomechanics + Electrostatics + Magnetism + Chemical Fingerprinting) |
| Scanner Range | 100 × 100 × 15 µm |
| Optical Access | Dual-Path, IR AFM Laser (1310 nm) + Visible/NIR Excitation Lasers (e.g., 532 nm, 638 nm, 785 nm) |
| Spectrometer | Achromatic, >95% Reflectivity, Triple-Grating Support (150–6000 cm⁻¹) |
| Software Feature | “Probe Away” / “Probe Back” Automated Tip Retraction & Re-Registration |
| Compliance | Designed for GLP/GMP-adjacent research environments |
| Brand | MX-AFM |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MX-plorer Premium |
| Instrument Type | Atomic Force Microscope (AFM) |
| Position Detection Noise | ≤ 50 pm |
| XY Sample Stage Travel Range | ≥ 5 mm |
| Operating Modes | Contact, Tapping, Phase Imaging, Conductive AFM (C-AFM), Kelvin Probe Force Microscopy (KPFM), Force Spectroscopy, Nanolithography |
| Control Architecture | Closed-Loop Piezoelectric Scanning System |
| Brand | Nano analytik |
|---|---|
| Origin | Germany |
| Model | AFM Series (SmartProbe Platform) |
| Instrument Type | Atomic Force Microscope |
| Vertical Position Detection Noise | 0.01 nm RMS |
| Maximum Sample Diameter | ≤10 cm |
| Scanner Range (Adeona) | 15 µm × 15 µm × 4 µm |
| Dimensions (Vacuum-Compatible Version) | 140 mm × 100 mm × 60 mm |
| Integrated Actuation & Sensing | Piezoresistive readout + bimaterial excitation on SmartProbe |
| XYZ Nanopositioning Range (Vacuum Variant) | 20 µm × 10 µm × 10 µm |
| Brand | Nano analytik |
|---|---|
| Origin | Germany |
| Model | SPL |
| Instrument Type | Atomic Force Microscope-based Scanning Probe Lithography System |
| Positioning Detection Noise | 0.01 nm (X, Y, Z) |
| Maximum Sample Diameter | 150 mm (6 in) |
| Stage Travel Range | 18 mm × 18 mm (expandable to 150 mm × 150 mm) |
| Minimum Feature Size | 5 nm (verified) |
| Direct-Write Speed | 300 µm/s |
| Overlay Accuracy | < 7 nm |
| Stitching Accuracy | < 10 nm |
| Maximum Writing Area per Field | 200 µm × 200 µm |
| Footprint | 80 cm × 100 cm × 190 cm |
| AFM Imaging Range | 10 µm × 10 µm × 5 µm (expandable to 200 µm × 200 µm) |
| Vertical RMS Noise | 0.01 nm |
| Closed-Loop Scan Linearity | 99.7% |
| Real-Time FPGA Feedback Bandwidth | 8 MHz |
| Data Acquisition Resolution | 16-bit (amplitude/phase) |
| Output Formats | BMP, PNG, JPG, TXT |
| Brand | Nanosurf |
|---|---|
| Origin | Switzerland |
| Model | FLEX-AFM |
| Instrument Type | Atomic Force Microscope |
| XY Positioning Noise | ≤ 0.15 nm (RMS, in air & liquid) |
| Sample Dimensions | Ø ≤ 100 mm, Thickness ≤ 5 mm |
| Sample Stage Travel Range | 300 mm × 300 mm |
| Scan Range | 100 µm × 100 µm × 10 µm (XY × Z) |
| XY Drive Resolution | 0.152 nm |
| Z Drive Resolution | 0.046 nm |
| Minimum Z Noise Floor | 0.15 nm (RMS, closed-loop) |
| Compatible Environments | Ambient air, liquid, controlled atmosphere (e.g., inert gas, low-oxygen), temperature-controlled stages |
| Controller | C3000 (24-bit, dual-channel lock-in amplifiers, digital feedback) |
| Optical Integration | Fully compatible with inverted optical microscopes |
| Modular Add-ons | ECS 204 electrochemical stage, ATS 204 automated translation stage, Isostage active vibration isolation, acoustic enclosure, glovebox integration kit |
| Brand | Nanosurf |
|---|---|
| Origin | Switzerland |
| Model | FlexAFM |
| Instrument Type | Material-Focused AFM |
| Position Detection Noise | <35 pm |
| Maximum Sample Diameter | ≤120 mm |
| Control Electronics | C3000i (24-bit), upgradeable to CX (28-bit) |
| Software | Nanosurf Software Suite |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments, supports GLP/GMP audit trails via optional software modules |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | blueDrive |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Accessory |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES EC-AFM |
| Price Range | USD 340,000 – 410,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM), Materials-Focused |
| Position Detection Noise | 625 Hz (RMS, bandwidth-corrected) |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| XY Stage Scan Range | 180 µm × 180 µm (optical field of view), with full 180 mm × 180 mm motorized sample positioning area |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher S |
| Instrument Type | Materials-Focused AFM |
| Closed-Loop Noise (X,Y) | <0.06 nm |
| Closed-Loop Noise (Z) | <0.05 nm |
| Height Noise | <0.015 nm |
| Sample Diameter | <15 mm (standard), <7 mm (high-stability configuration) |
| XY Stage Travel Range | 180 mm × 180 mm |
| Imaging Speed | Up to 10–100× faster than conventional AFMs |
| Probe Compatibility | Supports ultra-small probes (e.g., 3 × 9 µm optical spot size, optional) |
| Environmental Flexibility | Upgradeable to Cypher ES (environmental control) and Cypher VRS (video-rate scanning) |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | Cypher VRS |
| Instrument Type | Material-Focused Atomic Force Microscope |
| XY Positional Noise | <60 pm |
| Z Positional Noise | <50 pm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤7 mm |
| Sample Stage Travel Range | 180 mm × 180 mm |
| Scan Speed | Up to 625 lines/sec |
| Frame Rate | >10 fps at 512×512 pixel resolution |
| Excitation Method | blueDrive™ Photothermal Actuation |
| Compliance | ASTM E2539, ISO/IEC 17025-compatible operation, GLP/GMP-ready data integrity architecture |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter XR |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | 35 pm |
| Maximum Sample Diameter | 210 mm |
| XY Stage Travel Range | 200 mm × 200 mm |
| Scan Range | Up to 100 μm (full closed-loop) |
| Imaging Speed | 5–20× faster than conventional large-sample AFMs |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MFP-3D |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Z-Axis Positioning Noise | < 0.06 nm (RMS, in air) |
| X/Y Closed-Loop Scanning Noise | < 0.5 nm (RMS) |
| Sample Diameter | ≤ 80 mm |
| Sample Thickness | ≤ 25 mm |
| Visual Field of View | 200 mm × 200 mm (XY stage travel with optical alignment) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Scanning Microwave Impedance Microscopy (sMIM) |
| Instrument Type | Scanning Probe Microscope |
| Application Domain | Nanoscale Electrical Characterization |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vero |
| Price | Upon Request |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | X&Y Sensor Noise < 60 pm, Z Sensor Noise < 50 pm |
| Sample Dimensions | Up to 15 mm in diameter, 7 mm in thickness |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES Polymer Edition |
| Price Range | USD 420,000 – 700,000 (est.) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science |
| Position Detection Noise | 625 Hz |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Environmental Control | Sealed fluid/gas chamber compatible |
| Temperature Control Range | 0–250 °C |
| Nanomechanical Capabilities | Integrated NanoMechPro toolkit (Force Modulation, Contact Resonance, and HarmoniX™) |
| Excitation Method | blueDrive photothermal excitation for tapping mode |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Cypher VRS1250 |
| Instrument Type | Materials-Focused Atomic Force Microscope |
| Position Detection Noise | X&Y < 60 pm |
| Sample Dimensions | Ø ≤ 15 mm, Thickness ≤ 7 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Software | SmartScan |
| Environmental Compatibility | Fully compatible with Cypher ES environmental control system (temperature-controlled sample stage: –30 °C to +250 °C) |
| Excitation Method | blueDrive™ photothermal excitation |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter Discovery AFM |
| Pricing | Available Upon Request |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Matrix |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Magnetic Force Microscope (MFM) Control System |