Scanning Probe Microscopes
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| Brand | Park SYSTEMS |
|---|---|
| Origin | South Korea |
| Model | NX-TSH |
| Instrument Type | Industrial AFM |
| Sample Stage Travel Range | 625 mm × 525 mm |
| Maximum Sample Dimensions | 520 mm × 520 mm × 10 mm (10 kg) |
| Acoustic Noise Attenuation | >20 dB with Integrated Acoustic Enclosure |
| XY Scanning Range (Closed-Loop) | 100 µm × 100 µm |
| Z Scanning Range | 15 µm |
| Z Sensor Noise Floor | Sub-nanometer (low-noise optical lever detection) |
| Probe Exchange | Automated Tip eXchanger (ATX) with vision-based tip recognition and magnetic probe handling |
| Laser Alignment | Motorized, auto-focused beam positioning |
| Electrostatic Control | Integrated bipolar ionizer for charge neutralization |
| Electrical Characterization Option | Conductive AFM (C-AFM) with micro-probe station and 2D encoder stage |
| Brand | Quantum Scale |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | Nano Tech 20 AFM |
| Instrument Type | Industrial-Grade |
| SPM Architecture | Modular & Multi-Functional |
| Positioning Noise | XY: 0.2 nm, Z: 0.05 nm |
| Sample Size Compatibility | Up to 300 mm (12-inch) wafers, downward-compatible |
| XY Stage Travel | 200 mm × 200 mm (customizable) |
| Z Scan Range | 10 µm |
| Imaging Modes | Contact, Tapping, Force Spectroscopy, Phase Imaging |
| Optional Upgrades | EFM, MFM, KPFM, PFM, Lateral Force Imaging |
| Optical Microscope | 6.3 MP color CMOS, 7.5×–50× zoom, 34 mm working distance, 1.5 µm optical resolution at 50×, coaxial LED illumination, parfocal design |
| Scan Speed | 0.1–20 Hz |
| Feedback Bandwidth | 500 kHz (dual-channel lock-in), 18-bit amplitude/phase resolution |
| Data Acquisition | 16-bit, 100 kHz multi-channel sampling |
| Environmental Options | Vacuum mode (7.3 Pa base pressure), inert gas enclosure (N₂/Ar), H₂O/O₂ monitoring, temperature-controlled stage (−100 °C to +150 °C, ±0.3 °C stability), active air-sound shielding, pneumatic vibration isolation platform |
| Brand | Quantum Scale |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | NanoTech 10 AFM |
| Instrument Type | Materials-Focused AFM |
| SPM Architecture | Modular & Multi-Functional |
| Closed-Loop Positioning Noise | XY = 0.2 nm, Z = 0.05 nm |
| Sample Dimensions | 25 mm × 10 mm |
| XY Scanner Travel Range | 12 mm × 12 mm |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | SPM-8100FM |
| Instrument Type | Atomic Force Microscope (AFM) |
| Lateral Positioning Noise | 0.1 nm |
| Vertical Positioning Noise | 0.03 nm |
| Sample Diameter × Thickness | Φ24 mm × 8 mm |
| Sample Stage Travel Range | ±5 mm |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | SPM-9700HT |
| Instrument Type | Atomic Force Microscope (AFM) |
| XY Positioning Noise | 0.1–0.2 nm (horizontal) |
| Z Positioning Noise | 0.03–0.05 nm (vertical) |
| Sample Size | Ø24 mm × 8 mm |
| Sample Stage Travel Range | ±6 mm |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer | Shimadzu Corporation |
| Instrument Type | Atomic Force Microscope (AFM) |
| Category | Materials AFM |
| Position Detection Noise | < 0.02 nm RMS |
| Sample Dimensions | Ø50 mm × 8 mm max thickness |
| XY Stage Travel Range | 5 mm × 5 mm |
| Imaging Resolution | Up to 8192 × 8192 pixels |
| Automation Features | Auto-alignment ("Link On"), Auto-parameter optimization ("NanoAssist"), Fully automated tip exchange and fast 3D mapping |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | SPM-Nanoa |
| Instrument Type | Material-oriented AFM |
| Position Detection Noise | < 0.02 nm (RMS) |
| Sample Diameter | 50 mm |
| Sample Thickness | ≤ 8 mm |
| XY Stage Travel Range | 5 × 5 mm |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Model | alpha300 A |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | ≤0.5 nm |
| Maximum Sample Diameter | 120 mm |
| Piezo Scanner Travel Range (X/Y) | ≤100 µm |
| Integrated Microscopy | Research-Grade Optical Microscope with Brightfield, Darkfield, Polarization & Fluorescence Capabilities |
| Scanning Technology | TrueScan™ Capacitive Feedback-Controlled Stage |