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SPECTRO Analytical Instruments GmbH (Germany)

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BrandSPECTRO
OriginGermany
ModelSPECTROCUBE (RoHS-Optimized)
ConfigurationBenchtop/Free-Standing
Detector TypeHigh-Resolution Silicon Drift Detector (SDD)
Count Rate CapabilityUp to 100,000 cps
Elemental RangeNa (11) to U (92)
Minimum Detection Limits (MDL)Sub-ppm to low-ppm range for regulated elements (Pb, Cd, Hg, Cr, Br, Cl, etc.)
Compliance StandardsIEC 62321-5:2013, EN 62321-5:2014, ASTM F2853-21, USP <232>/<233>, ISO 17025-accredited operation support
SoftwareSPECTRO XRF Suite with RoHS-specific method templates, audit trail, and 21 CFR Part 11-compliant user management
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BrandSPECTRO
OriginGermany
ModelSPECTROCUBE
ConfigurationBenchtop/Floor-Standing
Elemental RangeNa–U
Quantification Range0.1 ppm – 99.99%
Energy Resolution130 eV (at Mn Kα)
Repeatability≤0.1% RSD (for major elements, n ≥ 10)
DetectorSilicon Drift Detector (SDD)
ComplianceCE, RoHS, IEC 61000-6-3/6-4
Instrument ClassED-XRF Spectrometer for Petrochemical QA/QC
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BrandSPECTRO
OriginGermany
ModelSPECTROMIDEX
Instrument TypeBenchtop ED-XRF Spectrometer
Application ScopeGeneral-purpose elemental analysis, optimized for precious metals
ComplianceDesigned for ISO/IEC 17025-compliant labs, supports GLP/GMP data integrity requirements
DetectorHigh-resolution silicon drift detector (SDD) with micro-focus X-ray source
Measurement PrincipleEnergy-dispersive X-ray fluorescence (ED-XRF) with polycapillary optic collimation
Sample FormSolid, powdered, or plated samples (non-destructive)
SoftwareSPECTRO XRF Analyzer Suite with audit trail, user-level permissions, and 21 CFR Part 11–ready reporting modules
Data ExportCSV, XML, PDF
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BrandSPECTRO
OriginGermany
ModelSPECTRO xSORT XHH04
ApplicationField-Portable Elemental Analysis
Element RangeNa (11) to U (92)
DetectorHigh-Performance Silicon Drift Detector (SDD)
Operating SystemAndroid-based Custom Firmware
Display5-inch Wide-Angle HD Touchscreen
ConnectivityWi-Fi, Bluetooth 5.0, USB-C, microSD Slot
Optional ModulesIntegrated GPS, Dual-Camera Imaging System (Sample Positioning + Test Area Documentation), Docking Station for Lab-Grade Expansion
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BrandSPECTRO
OriginGermany
ModelXEPOS Polarized
Instrument TypePolarized ED-XRF
ConfigurationBenchtop/Floor-standing
Regulatory ComplianceCE, RoHS, ISO/IEC 17025 compatible (when operated under GLP/GMP conditions)
SoftwareTurboQuant II with ASTM E1621, ISO 21043, and USP <233> method support
DetectorHigh-resolution silicon drift detector (SDD), >140 eV Mn Kα resolution
Excitation SourceDual-target polarized X-ray tube (Mo/Rh), variable kV/mA control
Multi-layer Analysis CapabilityUp to 8 layers, 55 elements simultaneously quantifiable
Detection LimitsSub-ppm for heavy metals in polymer matrices
Sample FormsSolids (flat, irregular, coated), powders (pressed pellets), liquids (in sealed cells)
Data SecurityFDA 21 CFR Part 11 compliant audit trail, electronic signature, role-based access control
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BrandSPECTRO
OriginGermany
ModelSPECTRO SCOUT
Instrument TypePolarized ED-XRF
ConfigurationBenchtop/Field-Deployable
DetectorSilicon Drift Detector (SDD)
X-ray TubeRhodium (Rh) anode, up to 50 kV
Elemental RangeNa (11) to U (92)
Detection LimitsAs low as <1 ppm for selected elements
Analysis Time3–10 min per sample
Dimensions270 × 306 × 306 mm
Weight12.75 kg
Battery LifeUp to 5 hours continuous operation
Sample ChamberLarge-volume, accommodates irregular and bulk samples
CalibrationiCAL single-sample standardization in ≤5 minutes
Software InterfaceIntegrated touchscreen with preloaded application packages
OptionalIntegrated high-resolution camera for sample positioning and image-result correlation
ConnectivityUSB, Wi-Fi, Ethernet
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BrandSPECTRO
OriginGermany
ModelSPECTRO xSORT
PortabilityHandheld / Field-Deployable
Detection RangeMg (12) to U (92)
Display5-inch HD touchscreen
Operating SystemAndroid-based embedded OS
ConnectivityWi-Fi, Bluetooth, USB, MicroSD
Integrated SensorsGPS, dual cameras
ErgonomicsGlove-compatible physical buttons, low-force trigger, balanced weight distribution
ComplianceMeets ISO 12847, ASTM E2865, and EU RoHS/WEEE screening requirements
Software PlatformXRF Analyzer Pro (PC-based, supports audit trail, method management, and GLP-compliant reporting)
Sample HandlingCompatible with portable sample chamber and docking station for lab-grade repeatability
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