- All
- Favorite
- Popular
- Most rated
| Brand | MX-AFM |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MX-plorer Premium |
| Instrument Type | Atomic Force Microscope (AFM) |
| Position Detection Noise | ≤ 50 pm |
| XY Sample Stage Travel Range | ≥ 5 mm |
| Operating Modes | Contact, Tapping, Phase Imaging, Conductive AFM (C-AFM), Kelvin Probe Force Microscopy (KPFM), Force Spectroscopy, Nanolithography |
| Control Architecture | Closed-Loop Piezoelectric Scanning System |
Show next