UV Visible Near Infrared Spectrophotometer
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| Brand | HanHe |
|---|---|
| Origin | Shandong, China |
| Model | H-L1900 |
| Spectral Range | 190–1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.8 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Photometric Accuracy | ±0.3%T (0–100%T), ±0.002 Abs (0–0.5 Abs), ±0.004 Abs (0.5–1.0 Abs) |
| Baseline Drift | ±0.002 A/h |
| Baseline Flatness | ±0.002 A |
| Stray Light | ≤0.1%T |
| Photometric Repeatability | ≤0.15%T (0–100%T), ≤0.001 Abs (0–0.5 Abs), ≤0.002 Abs (0.5–1.0 Abs) |
| Detector | Imported Silicon Photodiode |
| Light Sources | Long-life Deuterium Lamp & Tungsten Halogen Lamp |
| Display | 128×64 Dot-Matrix LCD |
| Data Interface | USB Port |
| Dimensions | 460 × 380 × 180 mm |
| Weight | 18 kg |
| Brand | HanHe |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | H-L72 Series |
| Spectral Range | 350–1050 nm |
| Spectral Bandwidth | 6 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤1 nm |
| Photometric Accuracy | Contact Technical Support |
| Baseline Drift | See Detailed Specifications |
| Baseline Flatness | Contact Technical Support |
| Brand | INNOTEG |
|---|---|
| Origin | China |
| Manufacturer Type | Manufacturer |
| Model | IUS-190 |
| Spectral Range | 190–3200 nm |
| Bandwidth (UV-VIS) | 0.2, 0.5, 1, 2, 3, 5 nm |
| Bandwidth (NIR) | 0.8, 2, 4, 8, 12, 20 nm |
| Wavelength Accuracy | ±0.5 nm (UV/VIS), ±2.0 nm (NIR) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS), ≤1.0 nm (NIR) |
| Brand | Topo |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | TP-760A |
| Price Range | USD 21,000–28,000 (FOB) |
| Spectral Range | 280–2500 nm |
| Spectral Bandwidth | UV/VIS: 0.1, 0.2, 0.5, 1.0, 2.0, 3.0, 5.0 nm (selectable) |
| NIR | 0.4–16.0 nm (auto/manual) |
| Wavelength Accuracy | ±0.5 nm (UV/VIS) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS) |
| Photometric Accuracy | ±0.3% T |
| Baseline Flatness | ±0.008 A (280–2500 nm, after 30-min warm-up) |
| Brand | Topo |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Direct Manufacturer |
| Region Classification | Domestic (China) |
| Model | TP720 |
| Price Range | USD 21,000 – 35,000 (FOB Tianjin) |
| Spectral Range | 190–3200 nm |
| Spectral Bandwidth (UV/VIS) | 0.1, 0.2, 0.5, 1.0, 2.0, 3.0, 5.0 nm (selectable) |
| Spectral Bandwidth (NIR) | 0.4–16.0 nm (auto/manual) |
| Wavelength Accuracy | ±0.5 nm (UV/VIS) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS) |
| Photometric Accuracy | ±0.3% T |
| Baseline Flatness | ±0.005 A (200–2500 nm, after 30-min warm-up) |
| Brand | Topo |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | TP760 |
| Spectral Range | 280–2500 nm |
| Slit Bandwidth | UV-Vis: 2.0 / 3.0 / 5.0 nm (selectable) |
| NIR | 5.0–20.0 nm (auto/manual) |
| Wavelength Accuracy | ±0.5 nm (UV/VIS), ±2.0 nm (NIR) |
| Wavelength Repeatability | ≤0.3 nm (UV/VIS), ≤1.0 nm (NIR) |
| Photometric Accuracy | ±0.3% T |
| Baseline Flatness | ±0.005 A (200–2500 nm, after 30-min warm-up) |
| Brand | X-Rite |
|---|---|
| Model | Ci7500 |
| Measurement Principle | D/8° (Diffuse Illumination / 8° Viewing) with Integrated Sphere |
| Wavelength Range | 360–750 nm |
| Optical Geometry | SCI & SCE Simultaneous |
| Aperture Options | 25 mm & 10 mm |
| Repeatability (White Tile) | ≤0.03 ΔE* uv (D65, UV Filter On) |
| Inter-Instrument Agreement (SCI) | ≤0.15 avg. ΔE CIELAB |
| Spectral Bandwidth | 10 nm |
| Reflectance Range | 0–200% |
| Measurement Cycle Time | <3 s |
| Brand | Youyunpu |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | YP-EU Series |
| Spectral Range | 190–1020 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ±1.0 nm |
| Wavelength Repeatability | ≤0.5 nm |
| Photometric Accuracy | ±0.002 A (0–0.5 A), ±0.004 A (0.5–1.0 A), ±0.3% T (0–100% T) |
| Baseline Drift | ≤0.002 A/h (at 500 nm, 0 A) |
| Baseline Flatness | ±0.003 A |