Along JF-2000 Benchtop X-ray Diffractometer (XRD) for Non-Destructive Structural Analysis

Overview

The Along JF-2000 is a benchtop X-ray diffractometer engineered for non-destructive crystallographic analysis of solid-state materials. It operates on the Bragg diffraction principle—where monochromatic X-rays interact with periodic atomic lattices to produce characteristic interference patterns—enabling precise determination of crystalline phase composition, lattice parameters, crystal orientation, residual stress distribution, and microstructural defects. Designed for laboratory-scale R&D and quality control environments, the system integrates a stabilized X-ray source, integrated cooling, and configurable detection geometry to support both powder and single-crystal analysis workflows. Its compact footprint and self-contained thermal management make it suitable for installation in standard analytical labs without dedicated HVAC or external chiller infrastructure.

Key Features

• Microfocus X-ray tube with selectable anode targets (Cu, Fe, Co, Cr, W, Mo) for optimized Kα radiation matching sample absorption and diffraction efficiency
• Digitally regulated high-voltage generator: 10–60 kV (1 kV step), 5–80 mA (1 mA step); long-term output stability ≤0.03% under load
• Integrated closed-loop refrigeration system featuring stainless-steel circulation pump (20 dB(A) acoustic emission), real-time water temperature/pressure/flow monitoring, and automatic shutdown on thermal or flow anomaly
• Lead-glass shielding enclosure compliant with IEC 61000-4-2 and GB/T 18871–2002 radiation safety standards; measured leakage dose ≤2.5 µSv/h at 5 cm from surface
• Two focal spot configurations: point focus (0.1 × 0.1 mm) for high-resolution mapping and line focus (0.1 × 0.1 mm) for enhanced beam intensity in bulk-phase analysis
• Programmable PLC-based control interface supporting timed operation, parameter recall, and hardware interlock sequencing for fail-safe tube activation
• Modular detector interface compatible with Debye–Scherrer cameras, Laue cameras, and third-party CCD/CMOS area detectors (e.g., PILATUS, Rayonix)

Sample Compatibility & Compliance

The JF-2000 accommodates flat-plate, rod, and irregularly shaped solid specimens up to 100 mm in diameter and 50 mm in height. Sample stages support manual θ–2θ goniometry or optional motorized rotation/tilt for texture analysis. All operational modes comply with ISO 17873:2015 (X-ray diffraction — General requirements for equipment calibration and verification) and ASTM E915–22 (Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation). Radiation safety protocols align with national regulatory frameworks for Class II X-ray generating devices in China (NMPA Order No. 129) and include mandatory audit trails for exposure logs, interlock status, and maintenance records—supporting GLP and GMP-aligned documentation practices.

Software & Data Management

Instrument control and data acquisition are managed via Along’s proprietary XRD-Studio software suite, built on a Windows 10/11 64-bit platform. The application provides real-time spectrum preview, automated peak search using modified Thompson–Cooper algorithms, Rietveld refinement (via embedded GSAS-II engine), and lattice parameter calculation per ASTM E975–21. Raw data export supports CIF, XYE, RAW, and HDF5 formats; metadata embedding includes instrument configuration, calibration date, operator ID, and environmental conditions (temperature, humidity). Audit trail functionality meets FDA 21 CFR Part 11 requirements for electronic records and signatures when configured with user role-based access control and digital certificate authentication.

Applications

• Phase identification and quantitative analysis of polycrystalline powders (e.g., pharmaceutical APIs, battery cathode materials, catalysts)
• Single-crystal orientation mapping for semiconductor wafer slicing and metallurgical grain alignment verification
• Residual stress evaluation in welded joints, shot-peened surfaces, and additive-manufactured components per ASTM E915 and EN 15305
• Crystallite size and microstrain assessment using Williamson–Hall and Warren–Averbach deconvolution methods
• Thin-film texture analysis via pole figure acquisition and ODF reconstruction
• Educational use in materials science curricula for hands-on diffraction physics instruction

FAQ

What X-ray tube anode materials are supported, and how does target selection affect measurement?
The JF-2000 accepts Cu, Fe, Co, Cr, W, and Mo anodes. Cu-Kα (1.5418 Å) is standard for general-purpose analysis; Co-Kα (1.7903 Å) improves contrast for Fe-rich alloys; Mo-Kα (0.7107 Å) enables high-angle resolution for nanostructured ceramics.
Is external water cooling required?
No. The unit incorporates a sealed, corrosion-resistant refrigeration loop with temperature regulation between 15–25 °C and continuous flow monitoring.
Can the system be upgraded for automated sample changers or high-throughput scanning?
Yes. The mechanical interface and software API support integration with third-party XYZ stages and robotic sample loaders, subject to factory validation and firmware update.
Does the system meet international radiation safety certification for export?
The base configuration complies with IEC 61000-4-2 immunity standards and GB/T 18871–2002. CE marking and RoHS compliance documentation are available upon request for EU-bound units.
What level of technical support and calibration services are provided?
Along offers on-site installation verification, annual performance qualification (PQ) per ISO/IEC 17025, and remote diagnostics via secure TLS-encrypted connection. Calibration certificates traceable to NIM (National Institute of Metrology, China) are issued with each service event.