Lake Shore CRX-EM-HF Helium-Free Cryogenic Horizontal Field Probe Station
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | CRX-EM-HF |
| Price | Upon Request |
| Temperature Range | 8 K to 400 K |
| Magnetic Field | ±0.6 T (horizontal, in-plane) |
| Max Sample Diameter | 25.4 mm (1 inch) |
| Vacuum Base Pressure | <1 × 10⁻⁵ Torr (at base temperature) |
| Probe Arms | Up to 4 |
| Sample Rotation | 360° optional |
| Probe Positioning Accuracy | <5 µm over full field sweep |
| DC/RF Insulation | >100 GΩ |
| Microwave Frequency Range | DC to 67 GHz |
| Optical Access | Fiber-coupled electro-optic probing supported |
Overview
The Lake Shore CRX-EM-HF is a helium-free, closed-cycle cryogenic probe station engineered for high-precision magneto-transport and electro-optical characterization of semiconductor devices, 2D materials, spintronic heterostructures, and quantum devices under controlled low-temperature and in-plane magnetic field conditions. Unlike conventional liquid-helium-dependent systems, the CRX-EM-HF integrates a high-stability, water-cooled electromagnetic magnet generating a programmable horizontal field up to ±0.6 T—parallel to the sample plane—enabling vector-resolved measurements such as anisotropic magnetoresistance (AMR), anomalous Hall effect (AHE), spin-torque ferromagnetic resonance (ST-FMR), and non-local spin valve transport. Its all-dry operation eliminates cryogen handling, reduces operational overhead, and supports unattended cooldown from ambient to base temperature (8 K) in under 2.5 hours. The system’s mechanical architecture features ultra-low vibration (<1 µm RMS), rigid thermal anchoring between probe arms and cold stages, and vacuum integrity maintained by a TPS-FRG turbomolecular pump achieving ≤1 × 10⁻⁵ Torr at 8 K—critical for minimizing thermal drift and electrical noise during sub-picoamp current measurements.
Key Features
- Helium-free operation using a two-stage closed-cycle cryocooler with base temperature of 8 K and precise temperature control from 10 K to 400 K (±20 mK stability between 10–350 K)
- Integrated horizontal-field electromagnet delivering ±0.6 T (±6 kOe) with real-time closed-loop regulation via in-situ Hall sensor feedback
- Uniform magnetic field region: 0.6% variation over 10 mm Ø, 2.6% over 25 mm Ø—optimized for 1-inch wafers and exfoliated flakes
- 30° probe arm tilt geometry maximizing field coupling while preserving planar access for DC/RF/microwave probes and optical fibers
- Up to four independently positionable probe arms, each thermally anchored to the 20 K radiation shield or 8 K cold plate depending on measurement requirements
- DC/RF probe insulation exceeding 100 GΩ enables low-leakage characterization of high-impedance devices including tunnel junctions and 2D semiconductors
- 67 GHz microwave-compatible probe interface supporting on-wafer S-parameter extraction and RF magnetotransport
- Optional PS-360-EMPX 360° motorized sample rotation stage for angle-resolved magnetotransport, domain imaging correlation, and crystallographic symmetry analysis
Sample Compatibility & Compliance
The CRX-EM-HF accommodates substrates up to 51 mm (2-inch) in diameter, though optimal field homogeneity and probe access are specified for samples ≤25.4 mm (1-inch). It supports standard semiconductor wafer formats (Si, GaAs, sapphire), insulating substrates (SiO₂/Si, h-BN), and freestanding membranes. All metallic components conform to ASTM F519 and ISO 8502-3 for ultra-high-vacuum compatibility, and surface finishes meet Class 100 cleanroom standards. The system is designed to comply with GLP and GMP documentation requirements when integrated with validated software workflows; vacuum interlocks, temperature ramp logs, and magnetic field calibration records are timestamped and exportable for audit trails per FDA 21 CFR Part 11 guidelines where applicable.
Software & Data Management
Lake Shore’s BlueBox™ control software provides unified orchestration of temperature, magnetic field, probe positioning, and data acquisition across multiple instruments—including source-measure units (SMUs), RF analyzers, and lock-in amplifiers. Real-time field-temperature sweeps, multi-axis raster scans, and synchronized parameter logging are scriptable via Python API. All measurement metadata—including vacuum pressure, thermal gradients, Hall sensor offsets, and probe contact resistance—are embedded in HDF5-formatted output files. Software validation packages are available for laboratories requiring IQ/OQ documentation under ISO/IEC 17025 or internal quality management systems.
Applications
- Vector-resolved magneto-transport in topological insulators, magnetic skyrmion hosts, and antiferromagnetic spintronics
- ST-FMR linewidth analysis and damping parameter extraction under variable temperature and field orientation
- In-plane field-dependent C-V profiling of ferroelectric gate stacks and 2D transistor heterostructures
- Electro-optic modulation characterization using fiber-coupled probes at cryogenic temperatures
- Angle-resolved magnetoresistance mapping for identifying crystalline anisotropy axes in van der Waals magnets
- Low-noise DC transport studies of Majorana nanowires and Josephson junction arrays
FAQ
Does the CRX-EM-HF require liquid helium or other cryogens?
No. It operates entirely on a closed-cycle cryocooler with no consumables.
Can magnetic field be applied while the system is at elevated temperatures?
Yes. The electromagnet is decoupled from the cryogenic stage and can be energized at any temperature between 8 K and 400 K without requiring system cooldown.
What is the maximum sample thickness supported?
Standard configuration accommodates samples up to 3 mm thick; custom spacers and lift mechanisms are available for thicker substrates.
Is the system compatible with third-party SMUs and RF equipment?
Yes. All electrical feedthroughs meet IEEE 488 and SCPI standards; RF ports are 2.92 mm (K-type) and calibrated to 67 GHz.
How is magnetic field uniformity verified and maintained?
Each system ships with a NIST-traceable Hall probe map and factory-generated uniformity report; in situ recalibration is supported via BlueBox™’s field-mapping utility.
