MCL Think Nano Nano-UHV100 Ultra-High Vacuum Compatible XY Nanopositioning Stage
| Brand | MCL Think Nano |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | Nano-UHV100 |
| Product Type | Motorized Translation Stage |
| Motion Range (X/Y) | 100 µm × 100 µm |
| Resolution (XY) | 0.2 nm |
| Resonant Frequency (X) | 500 Hz ±20% |
| Resonant Frequency (Y) | 250 Hz ±20% |
| Stiffness | 1.0 N/µm |
| Angular Deviation (Roll/Pitch) | ≤1 µrad |
| Angular Deviation (Yaw) | ≤3 µrad |
| Max. Horizontal Load | 0.5 kg |
| Max. Vertical Load | 0.2 kg |
| Body Material | Invar or Titanium |
| Bakeout Temperature | 100 °C |
| Vacuum Compatibility | ≤10⁻¹⁰ Torr |
| Control | Closed-loop with PicoQ® position sensing |
| Controller | Nano-Drive® |
Overview
The MCL Think Nano Nano-UHV100 is an ultra-high vacuum (UHV)-qualified, two-axis (XY) nanopositioning stage engineered for precision motion control in extreme vacuum environments. Designed around fundamental principles of piezoelectric actuation and capacitive or strain-gauge-based closed-loop feedback, the Nano-UHV100 delivers sub-nanometer positioning resolution and exceptional thermal and mechanical stability under UHV conditions down to 10⁻¹⁰ Torr. Its monolithic titanium or Invar construction ensures minimal outgassing, low thermal expansion, and compatibility with standard UHV bakeout protocols up to 100 °C — a critical requirement for synchrotron beamlines, scanning probe microscopy (SPM), and surface science experiments where residual gas contamination must be rigorously suppressed. The large 2.6″ × 2.6″ central aperture enables unobstructed optical, X-ray, or electron beam access — making it especially suitable for in-situ UHV microscopy, interferometric metrology, and atomic-scale sample manipulation.
Key Features
- UHV-certified materials and assembly: All structural components, wiring insulation, adhesives, and internal sensors comply with ASTM E595 and ISO 15087-1 outgassing specifications.
- Dual-axis (XY) motion with independent closed-loop control and picometer-class repeatability via proprietary PicoQ® sensor technology.
- 100 µm travel range per axis with 0.2 nm minimum incremental motion and <1 µrad angular deviation (roll/pitch) and <3 µrad yaw — ensuring planar fidelity during long-duration scans.
- Resonant frequencies of 500 Hz (X) and 250 Hz (Y) support high-bandwidth trajectory tracking while maintaining stiffness of 1.0 N/µm — essential for active vibration rejection and dynamic compensation.
- Customizable cable routing, feedthrough-compatible connectors (Accu-Glass® standard), and flange-mounting options (CF, KF, ISO-K) for seamless integration into existing UHV chambers.
- Compatible with MCL’s Nano-Drive® controller platform, supporting analog voltage input, digital command protocols (USB/Ethernet), and real-time position streaming at ≥1 kHz sampling rate.
Sample Compatibility & Compliance
The Nano-UHV100 is routinely deployed in applications requiring strict adherence to UHV cleanliness and mechanical integrity standards. It meets requirements for operation in systems certified to ISO 2745 (vacuum system cleanliness) and conforms to material compatibility guidelines outlined in ESA ECSS-Q-ST-70-02C for space-qualified vacuum hardware. While not intrinsically compliant with FDA 21 CFR Part 11, its Nano-Drive® controller supports optional audit-trail logging and user-access controls when configured within GLP/GMP-aligned laboratory information management systems (LIMS). No lubricants, epoxies, or polymer-based seals are used in its construction — eliminating hydrocarbon contamination risks common in non-UHV-rated stages.
Software & Data Management
The Nano-UHV100 integrates natively with MCL’s Nano-Drive® software suite, which provides deterministic motion scripting (via Python API), multi-axis synchronized waveform generation (sine, sawtooth, Lissajous), and real-time position logging with timestamped metadata. Data export formats include CSV, HDF5, and MATLAB .mat — facilitating traceable post-processing in compliance with ISO/IEC 17025 calibration documentation workflows. Optional firmware upgrades enable synchronization with external triggers (TTL/PECL), enabling lock-in detection or pump-probe timing alignment in time-resolved experiments. All controller firmware undergoes version-controlled release cycles with documented change logs — supporting instrument qualification (IQ/OQ/PQ) procedures.
Applications
- X-ray and vacuum ultraviolet (VUV) nanofocusing optics alignment in synchrotron endstations.
- UHV-compatible atomic force microscopy (AFM) and scanning tunneling microscopy (STM) scanner integration.
- In-situ surface metrology during molecular beam epitaxy (MBE) or pulsed laser deposition (PLD).
- Beamline mirror and grating positioning in soft X-ray spectrometers requiring <10 nm thermal drift over 24-hour acquisitions.
- Quantum device characterization setups involving cryogenic UHV manipulators and low-noise electrical feedthroughs.
- Interferometric calibration of displacement standards traceable to NIST SI units via heterodyne laser Doppler vibrometry.
FAQ
Is the Nano-UHV100 compatible with liquid nitrogen or cryogenic environments?
The standard Nano-UHV100 is rated for bakeout up to 100 °C and ambient-to-UHV operation only; cryogenic variants (e.g., LN₂-cooled or 4 K-compatible versions) require custom engineering and are available upon consultation.
Can the stage be retrofitted with different sensor types or higher load capacity?
Yes — MCL offers design modifications including alternative position sensing modalities (e.g., fiber-optic interferometry), reinforced flexure architectures, and load-optimized variants such as the Nano-UHV200 series. Engineering review is required prior to quotation.
What vacuum feedthrough standards does the controller interface support?
Standard configurations use Accu-Glass® Series 200/300 feedthrough pinouts; custom wiring harnesses for ConFlat®-mounted D-Sub, SMA, or miniature circular connectors can be provided on request.
Does the Nano-Drive® controller support third-party automation frameworks?
Yes — native drivers exist for LabVIEW, MATLAB, Python (PyVISA, MCL SDK), and EPICS IOC integration. Full command-line interface (CLI) documentation is included with every system shipment.
Is calibration data supplied with each unit?
Each Nano-UHV100 ships with a factory-generated calibration certificate listing measured hysteresis, linearity error (<0.05% F.S.), and bidirectional repeatability (≤±0.5 nm), traceable to NIST-traceable interferometric reference standards.
