Empowering Scientific Discovery

LEI-TECH LK-SP800 Digital Stereo Video Microscope with Real-Time Magnification Recognition

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Brand LEI-TECH
Origin Tianjin, China
Manufacturer Type OEM/ODM Manufacturer
Country of Origin China
Model LK-SP800
Total Magnification Range 9.6×–80.3×
Zoom Ratio 1:8.3
Field Diameter 8 mm
Working Distance 90 mm
Objective Type Apochromatic Plan Achromat Objective
Illumination LED Ring Light (Epi-Illumination)
Depth of Field 1 mm
Numerical Aperture 0.1
Sensor 1/2″ CMOS, 1920×1080 @ 60 fps
Display 11.6″ Integrated LCD
Stand Height 300 mm (Linear Rail Column), Base Dimensions: 320×260×20 mm
Software Functions Brightness/Saturation/RGB Adjustment, One-Touch White Balance & Auto Exposure, HDR Imaging, SE Enhancement, Image Freeze, Capture, On-Screen Measurement, Reference Image Overlay, Crosshair & Custom Grid Lines, Edge Detection, Mirror Flip (H/V), Color/Grayscale Toggle, LED Intensity Control

Overview

The LEI-TECH LK-SP800 is a high-performance digital stereo video microscope engineered for precision visual inspection, dimensional analysis, and real-time magnification-aware imaging in industrial QA/QC, electronics assembly, materials science, and academic research environments. Unlike conventional stereo microscopes requiring external cameras and separate monitor setups, the LK-SP800 integrates a calibrated optical path, high-sensitivity 1080p CMOS imaging sensor, embedded processing unit, and an 11.6″ HD display into a single compact chassis—measuring only slightly larger than a standard mouse pad (320 × 260 mm base footprint). Its optical architecture employs apochromatic plan-corrected objectives paired with a continuous 1:8.3 zoom system, delivering parfocal, distortion-minimized stereoscopic imagery across its full 9.6×–80.3× magnification range. The system operates on epi-illumination principles using a uniform, thermally stable LED ring light, ensuring consistent contrast and color fidelity without shadowing or glare—critical for surface topography assessment and defect localization.

Key Features

  • Integrated all-in-one design eliminates cable clutter: single power input replaces traditional multi-cable configurations (camera, monitor, controller, light source)
  • Real-time on-screen magnification recognition: dynamic OSD overlay displays current optical magnification value synchronized to zoom position—no manual calibration or lookup tables required
  • Intuitive dual-mode OSD interface: accessible via double-click; fully labeled in English with icon-driven navigation for rapid operator onboarding
  • Modular mechanical platform: compatible with XY translation stages, coarse/fine focus columns, dual-side illumination modules, and external HDMI output to large-format monitors (up to 4K)
  • Embedded measurement suite: supports pixel-to-unit calibration (µm/mm/inch), distance, angle, area, and diameter measurements directly on live or frozen frames—no PC dependency
  • Advanced image optimization engine: includes HDR fusion, SE (sharpening enhancement), automatic edge detection, and one-touch white balance—optimized for low-contrast or reflective samples such as PCB traces, battery electrodes, or textile fibers

Sample Compatibility & Compliance

The LK-SP800 accommodates a broad spectrum of non-destructive inspection tasks involving opaque, semi-transparent, or highly reflective specimens—including printed circuit boards, semiconductor packages, solder joints, coinage, metallurgical cross-sections, polymer films, and woven fabrics. Its 90 mm working distance enables safe observation of bulky or heat-sensitive components without risk of thermal interference or physical contact. The system supports both brightfield and polarized light observation modes, facilitating birefringence analysis in crystalline or stressed polymeric materials. While not certified to ISO/IEC 17025 or ASTM E2912 per se, the instrument’s optical repeatability (< ±0.8% magnification drift over 8-hour operation), consistent LED spectral output (CCT: 5700 K ± 200 K), and traceable calibration protocol align with GLP-compliant documentation requirements for internal lab use. All firmware and measurement algorithms are deterministic and auditable—supporting FDA 21 CFR Part 11 readiness when deployed with optional networked logging and user-access controls.

Software & Data Management

The embedded operating system delivers a responsive, deterministic UI optimized for factory-floor usability. Image capture (JPEG/PNG), timestamped video recording (MP4/H.264), and annotated measurement reports are stored internally on 32 GB eMMC flash memory or exported via USB 3.0 to external drives. Measurement data exports include CSV files with X/Y coordinates, dimensional values, operator ID, and acquisition timestamps—enabling integration with MES or LIMS platforms. Optional software extensions provide batch reporting templates compliant with ISO 9001 clause 8.6 (release of products and services) and support for custom pass/fail tolerancing overlays against reference CAD silhouettes or golden-sample images. Audit trails record all parameter changes, calibration events, and user logins—meeting basic GMP traceability expectations for regulated manufacturing environments.

Applications

  • Electronics manufacturing: solder joint inspection (IPC-A-610 Class 2/3), component placement verification, wire bond integrity assessment
  • Precision machining: burr detection, thread pitch validation, surface finish evaluation (Ra estimation via texture contrast analysis)
  • Academic microscopy labs: comparative morphology studies, botanical section imaging, entomological specimen documentation
  • Quality assurance workflows: incoming material inspection (e.g., battery tab geometry, connector plating uniformity), in-process verification of adhesive dispensing patterns
  • Forensic document examination: ink differentiation, paper fiber structure analysis, latent mark enhancement via polarization contrast

FAQ

Does the LK-SP800 require external software or a PC to perform measurements?
No. All measurement functions—including calibration, annotation, and report generation—are executed natively on the device’s onboard processor.
Is the magnification value displayed on-screen traceably calibrated?
Yes. Each unit undergoes factory calibration against NIST-traceable stage micrometers; magnification readout accuracy is ±0.5% across the zoom range.
Can the system be integrated into an automated production line?
Yes. HDMI video output, USB control interface (UVC/UAC class-compliant), and TTL trigger input support synchronization with PLCs, robotic handlers, or AOI stations.
What is the warranty coverage and service response time?
LEI-TECH provides a 24-month limited warranty with 7×24 remote technical support and regional depot repair centers across North America, Europe, and Southeast Asia.
Are software updates provided post-purchase?
Yes. Firmware upgrades—including new measurement algorithms, UI enhancements, and compliance-related features—are delivered free of charge via secure OTA or USB update package.

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