Jingfei FLA7200 Rapid Photometric, Colorimetric & Electrical Analysis System for LED and General Lamps

Overview

The Jingfei FLA7200 Rapid Photometric, Colorimetric & Electrical Analysis System is a fully integrated benchtop instrument engineered for high-throughput, traceable optical characterization of solid-state lighting (SSL) and conventional electric light sources. It operates on the principle of spectral radiance measurement via a calibrated miniature fiber-optic spectrometer, coupled with a thermally stabilized integrating sphere and synchronized digital power metering. The system conforms to fundamental photometric and colorimetric principles defined by the CIE (Commission Internationale de l’Éclairage), including CIE 127:2007 (measurement of LEDs), CIE 13.3:1995 (color rendering), and CIE S 025/E:2015 (LED lamp testing). Designed for laboratory, QC, and R&D environments, it delivers simultaneous acquisition of photometric (luminous flux, luminous efficacy), colorimetric (CCT, Duv, CRI, TM-30 metrics, chromaticity coordinates, dominant wavelength, peak wavelength, spectral purity, full-width half-maximum), and electrical parameters (V_f, I_f, power, power factor, harmonic distortion) — all under controlled thermal and temporal conditions.

Key Features

• Modular integrating sphere architecture supporting interchangeable sphere sizes (e.g., 0.3 m, 0.6 m, 1.0 m) to optimize signal-to-noise ratio across luminous flux ranges from 0.01 lm to >1.99 × 10⁵ lm
• High-stability CIE-standard tungsten-halogen reference lamp with NIST-traceable calibration certificate for spectral responsivity and photometric scale transfer
• Real-time synchronization between spectrometer acquisition, electrical parameter sampling, and thermal stabilization feedback loops to minimize drift-induced uncertainty
• Automated dark-current and stray-light correction routines compliant with CIE TR 211:2021 guidelines for spectral instrument validation
• Rugged aluminum alloy chassis with EMI-shielded enclosure and passive thermal management, enabling stable operation in non-climate-controlled lab settings
• Embedded firmware with dual-mode operation: manual single-measurement mode and automated batch protocol execution with pass/fail threshold logic

Sample Compatibility & Compliance

The FLA7200 supports standardized geometries and mounting configurations for lamps and modules per IEC 60901, IEC 62504, and ANSI C78.377. Tested sample types include: omnidirectional and directional LED lamps (A19, PAR30, GU10), LED modules (COB, SMD arrays), low-pressure sodium and compact fluorescent lamps (CFL), induction lamps, and OLED panels. All measurements adhere to metrological traceability chains aligned with ISO/IEC 17025:2017 requirements for testing laboratories. Optional factory calibration packages include CIE 1931 xy chromaticity verification, luminous flux calibration against a primary standard sphere (NIM or PTB traceable), and spectral irradiance validation per ISO/CIE 19476:2014.

Software & Data Management

The system ships with Jingfei LightLab v4.x — a Windows-based application built on .NET Framework with native support for ASTM E308-22 conversion tables, CIE 15:2018 color space transforms, and TM-30-20 Annex B computation. Software features include: GLP-compliant audit trail (user login, method version, calibration timestamp, raw spectrum export), CSV/PDF report generation with embedded metadata (CIE illuminant tag, observer angle, integration time), batch data trending with statistical process control (SPC) charts, and API-enabled integration with MES/LIMS platforms via OPC UA or RESTful endpoints. Data files are stored in vendor-neutral HDF5 format, preserving raw spectral counts, integration settings, and environmental sensor logs (ambient temperature/humidity).

Applications

• LED manufacturing line end-of-line (EOL) photometric binning and color consistency screening
• QC verification of CCT shift and lumen depreciation during accelerated life testing (per IES LM-80 / TM-21)
• Independent lab accreditation for ENERGY STAR®, DLC, CE, and CCC certification pre-testing
• Research into phosphor degradation mechanisms via time-resolved spectral analysis at fixed drive currents
• Validation of optical design simulations (e.g., LightTools, TracePro) using empirical spectral power distribution (SPD) datasets
• Comparative evaluation of circadian-effective irradiance (E_p) and melanopic daylight efficacy ratio (DLER) per CIE S 026/E:2018

FAQ

Does the FLA7200 comply with FDA 21 CFR Part 11 for electronic records and signatures?
Yes — when deployed with optional LightLab v4.x GxP Edition, the system provides role-based access control, electronic signature workflows, and immutable audit trails meeting ALCOA+ principles.
Can the wavelength range be extended beyond 800 nm for IR-emitting devices?
Yes — custom configurations with InGaAs-detector spectrometers covering 350–1100 nm or 200–1100 nm are available upon request, subject to recalibration and sphere coating validation.
Is third-party calibration service supported post-warranty?
Yes — Jingfei maintains ISO/IEC 17025-accredited calibration laboratories in Hangzhou and Shanghai; international customers may arrange local NMI traceable recalibration via authorized service partners.
How is thermal management handled during high-power LED testing?
The system integrates a programmable DC power supply with pulse-width modulation (PWM) mode and active heatsink monitoring; optional external thermal chuck interfaces enable junction temperature control per JEDEC JESD51-1.
What spectral resolution is achieved at 380 nm and 780 nm?
Typical FWHM resolution is ≤2.5 nm across the 380–800 nm range, verified per CIE 127:2007 Annex D using mercury-argon emission lines.