YANRUN JC-10 Measuring Microscope
| Brand | YANRUN |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | JC-10 Measuring Microscope |
| Mounting Configuration | Upright (not inverted) |
| Image Analysis System | Not Integrated |
| Eyepiece | 10× |
| Objective Lens | 2× |
| Optical Magnification | 20× |
| Eyepiece Micrometer Scale Range | 0–8 mm |
| Micrometer Drum Minimum Division | 0.01 mm |
| Eyepiece Linear Field of View | 8.5 mm |
| Measurement Range | 4 mm |
| Measurement Accuracy | ±0.01 mm |
Overview
The YANRUN JC-10 Measuring Microscope is an upright, manually operated optical instrument engineered for high-precision linear dimensional measurement of small mechanical components, metallurgical specimens, printed circuit traces, thin films, and precision machined surfaces. Unlike compound microscopes designed for cellular or submicron observation, the JC-10 operates on a calibrated monocular optical path optimized for metrological applications—leveraging direct visual alignment and mechanical stage displacement to achieve traceable length measurements. Its fixed 2× objective and 10× eyepiece deliver a stable 20× total magnification, providing sufficient resolution to resolve features down to approximately 20 µm while maintaining a wide 8.5 mm linear field of view. The instrument employs a coaxial micrometer drum with 0.01 mm minimum division, enabling vernier-assisted manual readout against a calibrated reticle scale (0–8 mm range), and is calibrated to meet ISO 9001-aligned internal metrology protocols for workshop-grade inspection tasks.
Key Features
- Upright optical configuration with rigid cast-aluminum base and precision-machined column for vibration-damped stability during manual measurement
- Fixed-focus 2× achromatic objective lens optimized for extended working distance (~65 mm), facilitating clearance for bulky or irregularly shaped samples
- 10× wide-field eyepiece with integrated crosshair reticle and rotating micrometer drum for repeatable, parallax-minimized readout
- Mechanical X–Y translation stage with vernier scales and fine-adjustment knobs, supporting precise positioning within a 4 mm × 4 mm measurable area
- Calibrated eyepiece micrometer system: linear scale (0–8 mm) with 0.01 mm drum resolution and ±0.01 mm stated measurement accuracy per ISO/IEC 17025–informed calibration practice
- No integrated digital imaging or software—designed exclusively for analog, operator-dependent metrology in environments where electromagnetic interference, data security constraints, or GLP-compliant audit trails preclude electronic image capture
Sample Compatibility & Compliance
The JC-10 accommodates flat, reflective, or lightly etched metallic, ceramic, and polymer specimens up to 50 mm in height and 100 mm in diameter. Its large depth of field and long working distance support direct observation of as-polished, as-etched, or lightly coated metallurgical cross-sections without immersion oil or cover slips. While not certified to ASTM E1558 or ISO 80000-7 for formal metrology accreditation, the instrument’s mechanical design and calibration methodology align with foundational principles outlined in ISO 10360-2 (coordinate measuring machines) and JIS B 7153 (optical measuring instruments). It is routinely deployed in QC laboratories operating under ISO 9001:2015 quality management systems where documented calibration intervals, operator training records, and traceable reference standards (e.g., NIST-traceable stage rulers) are maintained.
Software & Data Management
The JC-10 does not incorporate embedded firmware, USB interfaces, or proprietary software. All measurements are recorded manually in laboratory notebooks or standardized inspection forms. This architecture eliminates dependencies on operating system updates, driver compatibility, or cybersecurity patching—making it suitable for regulated environments requiring deterministic behavior, long-term hardware longevity, and full operator accountability. For labs requiring digital documentation, external USB microscopes or DSLR adapters may be mounted via standard C-mount threads (adaptor sold separately), though such configurations fall outside factory calibration scope and require independent validation per ISO/IEC 17025 clause 5.5.2.
Applications
- Dimensional verification of gear tooth profiles, thread pitch, and bearing raceway geometry in mechanical workshops
- Grain size estimation and inclusion rating in metallurgical failure analysis per ASTM E112 and ISO 643
- Measurement of solder mask openings, pad diameters, and trace widths on PCB prototypes prior to AOI deployment
- Calibration verification of stylus profilometers and coordinate measuring machine (CMM) artifacts using certified step-height standards
- Educational use in materials science and mechanical engineering labs for teaching fundamental optical metrology concepts including parallax error, least count, and uncertainty propagation
FAQ
Is the JC-10 suitable for measuring transparent or translucent samples?
No—it relies on reflected illumination and surface contrast; transmission-mode observation is not supported.
Can the eyepiece or objective be interchanged with higher magnifications?
No—the optical tube and focusing mechanism are mechanically fixed for 2×/10× pairing; substitution voids calibration and compromises accuracy.
Does the instrument include calibration certification?
A factory calibration report (non-accredited) is supplied; users must perform periodic verification using traceable gauge blocks or stage micrometers per internal SOP.
What illumination options are available?
Integrated LED top-light with adjustable intensity; no Köhler illumination, polarizers, or DIC modules are provided.
Is the JC-10 compliant with FDA 21 CFR Part 11 requirements?
Not applicable—since it generates no electronic records, Part 11 controls do not apply; manual entries remain subject to ALCOA+ principles in GMP contexts.
