FLOXLAB SPECIMEN FLATNESS GAGE
| Brand | FLOXLAB |
|---|---|
| Origin | France |
| Model | SPECIMEN FLATNESS GAGE |
| Granite Base Dimensions | 200 mm × 300 mm × 50 mm |
| Max Sample Height | 300 mm (12 in) |
| Accuracy | ±0.0001 in |
| Resolution | 0.01 mm (0.0005 in) |
| Weight | 20 kg |
| Compliance | ASTM D4543 |
Overview
The FLOXLAB SPECIMEN FLATNESS GAGE is a precision mechanical metrology instrument engineered for quantitative assessment of surface planarity in solid specimens across industrial quality control, materials R&D, and calibration laboratories. It operates on the principle of comparative contact measurement: a calibrated granite reference base provides a stable, thermally invariant datum plane, while a high-resolution dial indicator or digital probe—mounted on an adjustable vertical column—measures vertical deviation at discrete points across the specimen surface. This methodology delivers traceable, repeatable flatness data without reliance on optical interference or laser triangulation, making it particularly suitable for opaque, non-reflective, or textured surfaces where optical methods may yield ambiguous results. Designed in accordance with ASTM D4543 (“Standard Practice for Verification of Dimensional Metrology Software”), the instrument supports standardized verification protocols for flatness evaluation in compliance-driven environments including aerospace component inspection, semiconductor substrate qualification, and precision machining validation.
Key Features
- Monolithic granite base (200 mm × 300 mm × 50 mm) with certified flatness ≤0.5 µm over full surface area, providing long-term dimensional stability and minimal thermal drift (coefficient of expansion: 0.000006 mm/mm/°C)
- Adjustable vertical column with fine-threaded micrometer feed, enabling precise probe positioning within ±0.01 mm repeatability
- Digital indicator interface supporting RS-232 or USB output for direct integration with metrology software platforms
- Modular probe carriage compatible with interchangeable contact styli (spherical, conical, and flat-tipped) to accommodate varied surface geometries and material hardness
- Robust aluminum-alloy frame with vibration-damping feet, optimized for benchtop use in ISO Class 7 cleanrooms or production-floor environments
- Calibration certificate supplied with NIST-traceable uncertainty statement (k = 2), aligned with ISO/IEC 17025 requirements
Sample Compatibility & Compliance
The SPECIMEN FLATNESS GAGE accommodates specimens up to 300 mm in height and unrestricted lateral dimensions—as long as they fit within the effective travel envelope of the probe. It is routinely employed for flatness verification of metal plates, ceramic tiles, polymer sheets, machined flanges, printed circuit board substrates, and optical-grade glass blanks. The system complies with ASTM D4543 for procedural validation of flatness measurement practices and supports documentation workflows required under ISO 9001, AS9100, and IATF 16949 quality management systems. When used with validated measurement routines and operator training records, it satisfies audit requirements for GLP and GMP environments where traceability and measurement uncertainty reporting are mandatory.
Software & Data Management
While the base configuration operates as a stand-alone mechanical gage, optional FLOXLAB MetroSuite™ software enables automated point-grid acquisition, statistical analysis (e.g., least-squares plane fitting, maximum deviation, total indicator reading), and report generation compliant with FDA 21 CFR Part 11. The software includes electronic signature capability, audit trail logging (with timestamped user actions and parameter changes), and export formats including CSV, PDF, and XML for LIMS integration. All raw measurement data is stored with metadata—including environmental conditions (optional external hygrometer/thermometer input), calibration status, and operator ID—to ensure full data integrity and regulatory readiness.
Applications
- Flatness verification of heat-treated steel plates prior to CNC machining
- Quality gate inspection of injection-molded plastic housings for consumer electronics
- Pre-shipment testing of sapphire watch crystals per ISO 10110-7
- Validation of vacuum chuck surface flatness in semiconductor wafer handling systems
- Research-level characterization of warpage in thin-film battery electrodes during cycling studies
- Calibration reference for optical interferometers and coordinate measuring machines (CMMs)
FAQ
What standards does this flatness gage comply with?
It is designed and verified in accordance with ASTM D4543 and supports implementation of ISO 1101 (Geometrical Product Specifications – Geometrical tolerancing) for flatness tolerance evaluation.
Can the gage be recalibrated in-house?
Yes—routine verification using certified gauge blocks and reference flats is supported; however, full recalibration must be performed by an ISO/IEC 17025-accredited laboratory to maintain traceability.
Is temperature compensation built into the system?
The granite base minimizes thermal influence, but for measurements requiring sub-micron accuracy, ambient temperature should be controlled within ±1 °C of the calibration temperature (typically 20 °C), per ISO 1:2016.
Does the system support automated scanning?
Manual point-by-point measurement is standard; motorized Z-axis and programmable XY stages are available as factory-installed options for semi-automated grid mapping.
What documentation is provided with shipment?
Each unit ships with a calibration certificate, ASTM D4543-compliant operation manual, traceability matrix, and MSA (Measurement Systems Analysis) guidance for GR&R studies.
