Sensofar S neox Five Axis 5-Axis Non-Contact 3D Optical Profilometer
| Brand | Sensofar |
|---|---|
| Origin | Spain |
| Model | S neox Five Axis |
| Measurement Principle | White-Light Interferometry & Confocal Microscopy |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Axes | 5-Axis (A/B rotational + X/Y/Z linear) |
| Rotational Accuracy | A-axis — 360° continuous, ±1 arcsec repeatability |
| Illumination | Uniform LED ring light integrated around objective lens |
| Software Platform | SensoFIVE v6.x (with GLP-compliant audit trail, data export in ISO-standard formats) |
Overview
The Sensofar S neox Five Axis is a high-precision, fully automated 5-axis non-contact 3D optical profilometer engineered for comprehensive surface topography characterization across multi-scale geometries. It integrates three complementary optical metrology modalities—white-light interferometry (WLI), confocal microscopy, and focus variation (multi-focus stacking)—within a single platform, enabling quantitative analysis from sub-nanometer roughness (Rq 90°, micro-gears, threaded surfaces). Its core architecture conforms to ISO 25178-601 (areal surface texture) and ISO 21920-1 (linear roughness parameters), supporting traceable calibration via NPL/NIST/PTB-certified reference standards.
Key Features
- 5-Axis Synchronized Motion: Motorized A-axis (360° continuous rotation, ±1 arcsec repeatability) and B-axis (−30° to +110° tilt, ±0.5 arcmin resolution) enable dynamic sample repositioning without manual intervention.
- Multi-Modal Optical Engine: Seamless switching between white-light interferometry (for smooth, reflective surfaces), confocal mode (for high lateral resolution on structured or semi-transparent samples), and focus variation (for steep slopes up to 85° and textured surfaces).
- Automated Full-Surface Reconstruction: SensoFIVE software stitches multiple 3D topographies acquired at different angular positions into a unified, distortion-free cylindrical or freeform surface model—critical for turbine blades, bearing races, and precision-machined rings.
- GLP-Compliant Data Workflow: Built-in electronic signatures, time-stamped audit trails, and 21 CFR Part 11–ready user access controls ensure regulatory compliance for QC laboratories operating under ISO/IEC 17025 or GMP frameworks.
- System3R Precision Fixturing: Modular clamping system with interchangeable chucks (15 standard options), flat fixtures, calibration kits (including Si wafer and step-height standards), and integrated limit switches for repeatable setup.
- Uniform Ring Illumination: Coaxial LED ring light delivers consistent, glare-free illumination across all magnifications—optimized for signal-to-noise ratio in both confocal and interferometric modes.
Sample Compatibility & Compliance
The S neox Five Axis accommodates samples ranging from 10 mm × 10 mm wafers to Ø200 mm rotationally symmetric components, including metallic, ceramic, polymer, and coated substrates. Its non-destructive, non-contact methodology complies with ASTM E2947 (standard guide for 3D surface topography measurement), ISO 25178-2 (specification of areal parameters), and USP (surface characterization of pharmaceutical tooling). All raw height maps are stored in vendor-neutral .xyz or .stl formats, with metadata embedded per ISO 10360-8 for measurement uncertainty reporting. Calibration certificates are issued against traceable NIST SRM 1960 and PTB reference gratings.
Software & Data Management
SensoFIVE v6.x provides an intuitive, workflow-driven interface with drag-and-drop scripting for custom measurement routines. Users define regions of interest (ROIs), set angular step intervals (e.g., 5° increments over 360°), and configure parameter sets (e.g., scan speed, integration time, z-step size) per acquisition zone. The software supports batch processing of stitched datasets, statistical process control (SPC) charting, GD&T evaluation (flatness, cylindricity, runout), and automated pass/fail reporting aligned with internal SOPs. Export modules generate PDF reports compliant with ISO 14289-1 (PDF/A-2u) and CSV files compatible with Minitab, JMP, and MATLAB for advanced statistical modeling.
Applications
- Micro-optics manufacturing: Measurement of aspheric lenses, diffractive optical elements (DOEs), and AR-coated surfaces.
- Aerospace component inspection: Quantitative assessment of turbine blade leading edges, combustion chamber liners, and thermal barrier coatings.
- Medical device QA: Surface finish verification of orthopedic implants (Ti-6Al-4V, CoCr), stent struts, and dental abutments.
- Semiconductor packaging: Warpage analysis of fan-out wafer-level packages (FO-WLP) and solder bump coplanarity.
- Precision machining validation: Form error mapping of hydraulic valve spools, gear teeth profiles, and injection mold cavities.
FAQ
What surface roughness ranges can the S neox Five Axis measure?
It quantifies Ra values from 0.01 nm (on silicon wafers) to 50 µm (on sandblasted metals), validated per ISO 25178-2 using calibrated step-height standards.
Does the system support automated GD&T evaluation?
Yes—SensoFIVE includes built-in algorithms for cylindricity, circularity, flatness, and profile of a line/surface, with deviation overlays directly overlaid on measured topography.
How is measurement traceability ensured?
All systems ship with factory calibration certificates traceable to NPL and PTB; optional on-site recalibration services include uncertainty budgets per ISO/IEC 17025.
Can the platform integrate into existing MES or LIMS environments?
Via RESTful API and OPC UA connectivity, raw data and summary metrics can be pushed to enterprise databases, supporting Industry 4.0 traceability requirements.
Is training provided for ISO 25178-compliant reporting?
Sensofar offers certified operator training courses covering ISO 25178-601 implementation, uncertainty budgeting, and audit-readiness preparation.
