CDE ResMap
Filter
Showing all 2 results
| Brand | CDE ResMap |
|---|---|
| Origin | USA |
| Model | ResMap 168 |
| Automation Level | Fully Automated |
| Probe Material | Tungsten Carbide (WC) |
| Probe Lifetime | >500,000 measurements |
| Vertical Resolution for Probe Contact Optimization | 0.01 mm |
| Measurement Range | 1 mΩ/□ to 5 MΩ/□ |
| Standard Reference Wafers Included | NIST-traceable calibration set (6 pieces) |
| Brand | CDE ResMap |
|---|---|
| Origin | USA |
| Model | ResMap 273 |
| Automation Level | Fully Automatic |
| Price | USD $68,000 |
| Probe Material | Tungsten Carbide (WC) |
| Probe Lifetime | >500,000 touchdowns |
| Standard Calibration Wafers Included | NIST-traceable set of 6 wafers |
| Measurement Range | 1 mΩ/□ to 5 MΩ/□ |
| Vertical Resolution for Probe Landing Control | 0.01 mm (software-adjustable) |
