EMCrafts
Filter
Showing all 3 results
| Brand | EMCrafts |
|---|---|
| Origin | South Korea |
| Model | CUBE-1000/1100 |
| Instrument Type | Desktop SEM |
| Electron Source | Tungsten Filament |
| Pumping Time | 90 s (evacuation), 10 s (vent) |
| Gun Alignment | Auto-aligned, no manual adjustment required |
| Form Factor | Benchtop, footprint < 0.5 m² |
| Brand | EmCrafts |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | CUBE-II |
| Price Range | USD 140,000–210,000 |
| Instrument Type | Benchtop SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron (SE) Resolution | 1.0 nm at 30 kV |
| Magnification Range | 100× to 800,000× |
| Accelerating Voltage | 0.5–30 kV |
| Backscattered Electron (BSE) Resolution | 4.0 nm at 30 kV |
| Maximum Sample Dimensions | Ø80 mm × H53 mm |
| Stage Motion | X/Y: ±21 mm (42 mm travel), Z: 5–43 mm (38 mm travel), Tilt: –90° to +90° (manual), Rotation: 360° (motorized) |
| Standard Detectors | In-lens Secondary Electron Detector (SED), Solid-State Backscattered Electron Detector (BSED) |
| Brand | EMCrafts |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-made) |
| Model | Veritas |
| Price Range | USD 210,000 – 280,000 (FOB) |
| Instrument Type | Desktop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-Level Tungsten-Filament SEM |
| Secondary Electron Resolution | 1.0 nm @ 30 kV |
| Magnification Range | 100× – 800,000× |
| Accelerating Voltage | 0.5 – 30 kV |
| Backscattered Electron Resolution | 4.0 nm @ 30 kV |
| Sample Chamber Dimensions | Ø200 mm × H180 mm |
| Stage | 5-Axis Motorized Precision Stage (X/Y/Z/Tilt/Rotate) |
| Vacuum System | Fully Automated Dual-Pump Configuration (Rotary + Turbo Molecular Pump) |
| Imaging Modes | Focus Mode, Preview Mode, Slow-Scan Mode, Standard Imaging Mode |
| Auto Functions | Auto-Focus, Auto-Brightness/Contrast, Aperture Centering, Beam Alignment, Bias & Saturation Optimization |
| Detectors | In-Lens Secondary Electron Detector (SED), Solid-State Backscattered Electron Detector (BSE) |
| Optional Accessories | EDS Interface, Low-Vacuum Mode Kit, CCD Navigation Camera |