Optrel
Filter
Showing all 3 results
| Brand | Optrel |
|---|---|
| Origin | Germany |
| Model | Multiskop |
| Type | Imported Instrument |
| Configuration | Ellipsometry + SPR + Waveguide Mode Analysis + Reflectometry + Brewster Angle Microscopy + SPR Microscopy + Imaging Ellipsometry + Contact Angle Analysis |
| Measurement Speed | Sub-millisecond time resolution (SPR mode) |
| Thickness Resolution | 0.1 nm (ellipsometry) |
| Lateral Resolution | 2 µm (imaging ellipsometry) |
| Vertical Resolution | 0.1 nm (imaging ellipsometry) |
| Typical Field of View (BAM) | 20–200 µm |
| Reflectivity Detection Limit | 10⁻⁶ (BAM) |
| Software Modules | Angle-resolved reflectance scan, Kinetic angle tracking, Reflectance time-series monitoring, Advanced data processing suite |
| Brand | Optrel |
|---|---|
| Origin | Germany |
| Model | Multiskop-CA |
| Type | Video-based Optical Contact Angle Measurement System |
| Integration | Modular add-on for Multiskop ellipsometry platform |
| Imaging | High-resolution CCD camera with programmable LED backlighting array |
| Sample stage | Motorized XYZ translation stage with thermal coupling capability |
| Analysis engine | Automated contour tracing algorithm based on Young–Laplace equation fitting |
| Compliance | Designed for ISO 19403-2, ASTM D7334, and ISO 21365-compliant surface energy evaluation workflows |
| Software | CAM (Contact Angle Module) with audit-trail-enabled data logging |
| Brand | Optrel |
|---|---|
| Origin | Germany |
| Model | Multiskop-SPR |
| Configuration | Kretschmann-based angular interrogation SPR system |
| Angular scanning range | 20–120° |
| Angular resolution | ≤0.002° (2 mdeg) |
| Kinetic sampling interval | ≥50 ms |
| Imaging capability | Integrated SPR imaging module |
| Sensor chip compatibility | Standard Au-coated glass prism substrates (e.g., 50 nm Au on SF10/BK7) |