RHK Technology
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| Brand | RHK Technology |
|---|---|
| Origin | USA |
| Model | PanScan Freedom STM/qPlus AFM |
| Instrument Type | Ultra-High Vacuum Scanning Tunneling Microscope / qPlus Atomic Force Microscope |
| Position Detection Noise | <1 pm |
| Sample Size | 10 × 10 mm |
| Coarse XYZ Travel Range (RT) | 5 × 5 × 8 mm |
| Fine Scan Range (15 K) | 2 × 2 × 0.5 µm |
| Operating Temperature Range | 9 K – 400 K |
| XY Drift | 0.2 Å/hour |
| Z Drift | 0.2 Å/day |
| Magnetic Field Options | 5 T perpendicular or 1 T vector field (in-plane) |
| Brand | RHK Technology |
|---|---|
| Origin | USA |
| Model | R10 |
| Type | Integrated Digital SPM Control Platform |
| FPGA Architecture | Reconfigurable Xilinx UltraScale+ |
| Data Channels | 64+ synchronized analog/digital I/O |
| Scan Speed | Up to 5× faster than R9 |
| HV Output Noise | ≤25% of R9 baseline |
| Dual SPM System Support | Yes |
| Position Resolution (Z modulation) | Down to 10 pm RMS |
| Bias Modulation | 10 µV–10 Vpp, DC–10 MHz |
| ADC/DAC Resolution | 16–24 bit, adaptive sampling up to 100 MS/s |
| Compliance | Fully compatible with ASTM E2531, ISO/IEC 17025 workflows, and GLP/GMP data integrity requirements (21 CFR Part 11 audit trail ready via optional software module) |