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| Brand | OWIS |
|---|---|
| Origin | Germany |
| Model | MVT30-Z |
| Travel Range | ±3 mm (6 mm total) |
| Resolution/Sensitivity | 1 µm |
| Maximum Axial Load | 60 N / 90 N (selectable) |
| Maximum Load Capacity | 130 N / 200 N (selectable) |
| Maximum Tilt Moment | 2.5 N·m / 4 N·m (selectable) |
| Construction | Anodized Aluminum Alloy (Black), Self-locking Mechanism, Slide- and Pin-Mountable |
| Compliance | Designed for ISO/IEC 17025-aligned optical alignment workflows |
| Brand | OWIS |
|---|---|
| Origin | Germany |
| Type | Motorized Translation Stage |
| Model | NDT24-30 (and variants: NDT24-30-MSI, NAGO P24-8, NAGO T24-8, NHV24-6, NHV24-6-MSI, NLV24-7, NLV24-7-MSI, PT30-5, PT30-5-MSI) |
| Travel Range | Up to ±3.3° (angular), 6 mm (vertical), 7 mm (linear), continuous rotation (rotational) |
| Minimum Step Size | 20–40 µrad (angular), 50–300 nm (linear/vertical) |
| Maximum Step Size | 6–100 µrad (angular), 700–2000 nm (linear/vertical) |
| Load Capacity | 2–30 N |
| Bidirectional Repeatability | ≤0.1 µrad / ≤400 nm |
| Tilt Moment (Mx/My/Mz) | ≤0.1 N·m |
| Max. Angular Velocity | 100–300 mrad/s |
| Max. Linear Velocity | 0.3–2 mm/s |
| Construction Material | High-strength anodized aluminum (black, low-reflectivity finish) |
| Control Unit | NHS06 Manual Controller |
| Mounting Accessory | NMP50 Mounting Plate |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iKon-M (912 & 934 variants) |
| Sensor Format | 512 × 512 (iKon-M 912) / 1024 × 1024 (iKon-M 934) |
| Effective Pixels | 4 Megapixel (iKon-M 934) |
| Pixel Size | 24 µm (iKon-M 912) / 13 µm (iKon-M 934) |
| Quantum Efficiency | >90% (iKon-M 912), up to 95% (iKon-M 934) |
| Read Noise | ≤3 e⁻ RMS |
| Full Well Capacity | 300,000 e⁻ (iKon-M 912) |
| Cooling | TE-cooled UltraVac™ vacuum enclosure to –100 °C |
| Readout Speeds | 50 kHz to 5 MHz |
| Dark Current | <0.0001 e⁻/pix/sec at –100 °C |
| Compliance | CE, RoHS, ISO 9001 certified manufacturing |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | iKon-XL CCD |
| Price Range | USD 13,500 – 68,000 (est.) |
| Effective Pixels | 16.8 Megapixel |
| Pixel Size | 15 × 15 µm |
| Sensor Type | Back-Illuminated CCD (e2v CCD231-84 or CCD230-84) |
| Cooling Method | Thermoelectric (TE) with ColdSpace™ |
| Operating Temperature | −100 °C |
| Quantum Efficiency | Up to 95% (deep-depletion NIR-enhanced) |
| Read Noise | ≤ 2.1 e⁻ |
| Full Well Capacity | 350,000 e⁻ |
| Digitization | 18-bit ADC |
| Interface | USB 3.0 or Fiber Optic |
| Readout Modes | Single-channel or Quad-channel (quadrant-balanced) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iXon 888 |
| Pixel Size | 13 µm |
| Sensor Type | Back-Illuminated Electron-Multiplying CCD |
| Quantum Efficiency | >95% (peak) |
| Cooling | Thermoelectric (−80 °C typical operating temperature) |
| Readout Modes | EMCCD and conventional CCD |
| Frame Rate | Up to 30 fps at full resolution (configurable via ROI and binning) |
| Interface | USB 3.0 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | Marana 4.2B-6 |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm × 6.5 µm |
| Sensor Active Area | 13.3 mm × 13.3 mm |
| Onboard Memory | 1 GB |
| Readout Speed | 310 MHz |
| Dynamic Range | 34,000:1 |
| Quantum Efficiency | 95% |
| Cooling Temperature | −45 °C |
| Full-Frame Frame Rate | 74 fps |
| ROI (512 × 512) Frame Rate | 397 fps |
| Read Noise | 1.2 e⁻ |
| Vacuum-Sealed Housing | Yes |
| Mechanical Shutter | None |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Sona 4.2B-6 |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm × 6.5 µm |
| Sensor Dimensions | 13.3 mm × 13.3 mm |
| Onboard Memory | 1 GB |
| Readout Speed | 310 MHz |
| Dynamic Range | 34,000:1 |
| Quantum Efficiency | 95% |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | blueDrive |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Accessory |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES EC-AFM |
| Price Range | USD 340,000 – 410,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM), Materials-Focused |
| Position Detection Noise | 625 Hz (RMS, bandwidth-corrected) |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| XY Stage Scan Range | 180 µm × 180 µm (optical field of view), with full 180 mm × 180 mm motorized sample positioning area |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher S |
| Instrument Type | Materials-Focused AFM |
| Closed-Loop Noise (X,Y) | <0.06 nm |
| Closed-Loop Noise (Z) | <0.05 nm |
| Height Noise | <0.015 nm |
| Sample Diameter | <15 mm (standard), <7 mm (high-stability configuration) |
| XY Stage Travel Range | 180 mm × 180 mm |
| Imaging Speed | Up to 10–100× faster than conventional AFMs |
| Probe Compatibility | Supports ultra-small probes (e.g., 3 × 9 µm optical spot size, optional) |
| Environmental Flexibility | Upgradeable to Cypher ES (environmental control) and Cypher VRS (video-rate scanning) |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | Cypher VRS |
| Instrument Type | Material-Focused Atomic Force Microscope |
| XY Positional Noise | <60 pm |
| Z Positional Noise | <50 pm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤7 mm |
| Sample Stage Travel Range | 180 mm × 180 mm |
| Scan Speed | Up to 625 lines/sec |
| Frame Rate | >10 fps at 512×512 pixel resolution |
| Excitation Method | blueDrive™ Photothermal Actuation |
| Compliance | ASTM E2539, ISO/IEC 17025-compatible operation, GLP/GMP-ready data integrity architecture |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fast-Scan Scanning Capacitance Microscope (SCM) |
| Price Range | USD 25,000 – 65,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter XR |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | 35 pm |
| Maximum Sample Diameter | 210 mm |
| XY Stage Travel Range | 200 mm × 200 mm |
| Scan Range | Up to 100 μm (full closed-loop) |
| Imaging Speed | 5–20× faster than conventional large-sample AFMs |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MFP-3D |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Z-Axis Positioning Noise | < 0.06 nm (RMS, in air) |
| X/Y Closed-Loop Scanning Noise | < 0.5 nm (RMS) |
| Sample Diameter | ≤ 80 mm |
| Sample Thickness | ≤ 25 mm |
| Visual Field of View | 200 mm × 200 mm (XY stage travel with optical alignment) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Scanning Microwave Impedance Microscopy (sMIM) |
| Instrument Type | Scanning Probe Microscope |
| Application Domain | Nanoscale Electrical Characterization |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vero |
| Price | Upon Request |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | X&Y Sensor Noise < 60 pm, Z Sensor Noise < 50 pm |
| Sample Dimensions | Up to 15 mm in diameter, 7 mm in thickness |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecBattery |
| Detector Compatibility | Ultim Max / Xplore / UltimExtreme EDS detectors |
| Maximum Field Count | 10,000 fields per sample |
| Max Particle Count | 200,000 particles per sample |
| Throughput | Up to 30,000 particles/hour |
| EDS Count Rate Capability | Up to 400 kcps |
| Effective Detector Area | Up to 170 mm² |
| Software-Enabled Capabilities | Automated particle detection, multi-threshold contrast segmentation, morphology-based filtering, Z-focus stabilization across large-area scans, cross-field particle reconstruction, customizable classification logic, ASTM/ISO-compliant reporting templates, FDA 21 CFR Part 11-ready audit trail (optional configuration) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AZtecFeature |
| Instrument Type | Benchtop SEM-EDS System |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 1.0 nm @ 15 kV, WD = 4 mm |
| Magnification Range | 20–2,000× (low mag) |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV (low-vacuum mode) |
| Detector Configuration | Up to four Ultim Max SDDs supported |
| Real-time Particle Counting Capacity | Up to 200,000 particles per sample |
| Data Acquisition & Quantification Engine | Tru-Q® automated elemental identification and quantification |
| Peak Deconvolution | Advanced sum-peak correction for high-count-rate accuracy |
| Software Architecture | Native 64-bit multithreaded processing |
| Compliance | ASTM E1588–10e1 (GSR), ISO 16232 (cleanliness), VDA 19.1, USP <788>, GLP/GMP-aligned audit trail support |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecPharma |
| Compliance | FDA 21 CFR Part 11, EU Annex 11, GxP-aligned |
| Software Platform | AZtecLive-based |
| User Authentication | Integrated Windows Active Directory / LDAP |
| Audit Trail | Immutable, timestamped, user-attributed, inspector-accessible |
| Digital Signature | Enforced per action (acquisition, processing, reporting) |
| SOP Integration | Configurable acquisition profiles with version-controlled parameters |
| Real-time EDS Imaging | Elemental mapping with live spectral overlay comparison |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecTEM |
| Instrument Type | EDS Software Platform |
| Compatibility | JEOL 200 kV & 300 kV Transmission Electron Microscopes equipped with JED EDS detectors |
| Key Features | Point-and-ID analysis, LineScan, Elemental Mapping (TruMap, QuantMap), Drift Correction (AutoLock), Real-time Dynamic Imaging (AZtecLive) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecWave |
| Detector Type | Wavelength Dispersive Spectrometer (WDS) with Integrated EDS Compatibility (Ultim Max) |
| Roland Circle Radius | 210 mm |
| Energy Resolution | <10 eV (Mn Kα, typical) |
| Detection Limit | <100 ppm (matrix-dependent) |
| Peak-to-Background Ratio | >10,000:1 (typical for major elements) |
| Optical Geometry | Focusing Johann-type spectrometer with bent crystals |
| Incident Slit | Motorized, variable width |
| Installation | Tilt-mounted for minimal working distance dependency |
| Software Platform | AZtecWave v4.x or later |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-Blue One |
| Image Resolution | 0.5 MP (812 × 612), 1.7 MP (1608 × 1104), or 7.1 MP (3208 × 2200) |
| Pixel Size | 9 µm (0.5 MP & 1.7 MP variants), 4.5 µm (7.1 MP variant) |
| Sensor Diagonal | 9.6 mm (0.5 MP), 17.6 mm (1.7 MP & 7.1 MP) |
| Interface | CoaXPress 2.0 or SFP+ 10 GigE |
| Bit Depth | 14-bit |
| Quantum Efficiency | >70% @ peak (550–650 nm) |
| Read Noise | <1.5 e⁻ (typical, correlated double sampling) |
| Shutter Type | Global shutter |
| Compliance | GigE Vision v2.0, GenICam3 |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-Blue One UV |
| Image Resolution | 2848 × 2848 |
| Pixel Size | 2.74 µm |
| Sensor Diagonal | 11.2 mm |
| Interface | CoaXPress 2.0 or SFP+ 10GigE |
| Bit Depth | 14-bit |
| Quantum Efficiency | >70% (peak in UV) |
| Shutter Type | Global Shutter |
| Spectral Range | 200–1000 nm |
| Cooling | Active thermoelectric stabilization down to 0 °C |
| Lens Mount | CS-mount (with C-mount adapter) |
| ADC Modes | 8-bit / 12-bit selectable |
| Analog Gain | up to 24 dB |
| Digital Gain | up to 48 dB |
| ROI & Multi-Window Support | Yes |
| Compliance | GigE Vision v2.0, GenICam v3.x |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Nano |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Maximum Pattern Acquisition Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED 2 ER |
| Effective Pixels | 640 × 512 |
| Pixel Size | 15 µm |
| Frame Rate | 600 fps (full frame), up to 32,066 fps (region-of-interest) |
| Spectral Range | 1.1–1.9 µm (C-RED 2 ER 1.9) or 1.2–2.2 µm (C-RED 2 ER 2.2) |
| Read Noise | < 50 e⁻ (1.9 µm version), < 40 e⁻ (2.2 µm version) |
| Cooling | Integrated dual-stage thermoelectric cooler (ΔT ≤ 60 °C vs. ambient) |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED 2 Lite |
| Effective Resolution | 640 × 512 |
| Pixel Size | 15 µm |
| Detector Type | InGaAs PIN photodiode array |
| Electronic Shutter Pulse Width | < 5 µs |
| Cooling | Passive thermoelectric stabilization (fanless) + optional water-cooled cold plate |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED 2 |
| Effective Resolution | 640 × 512 pixels |
| Pixel Size | 15 µm |
| Frame Rate | up to 600 fps |
| Read Noise | <30 e⁻ |
| Electronic Shutter Pulse Width | <5 µs |
| Maximum Exposure Time | 60 s |
| Dynamic Range | 93 dB |
| ADC Resolution | True 16-bit |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED 3 |
| Resolution | 640 × 512 pixels |
| Pixel Size | 15 µm |
| Readout Speed | Up to 600 fps (full frame) |
| Integration Time | < 5 µs (electronic shutter) |
| Cooling | Uncooled |
| Form Factor | Compact OEM-ready design |
| Power Consumption | < 5 W |
| Interface | Camera Link HS or 10 GbE |
| Spectral Range | 0.9–1.7 µm |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | C-RED New Space |
| Effective Pixels | 640 × 512 |
| Pixel Size | 15 µm |
| Full-Frame Frame Rate | 600 fps |
| Windowed Mode (32 × 4) | 32,066 fps |
| Read Noise | <30 e⁻ |
| Dynamic Range | 93 dB (True 16-bit mode) |
| Operating Temperature Range | -40 °C to +65 °C |
| Sensor Material | InGaAs (VGA array) |
| Cooling | Advanced passive/thermoelectric hybrid thermal management |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED One |
| Sensor Format | 320 × 256 |
| Pixel Size | 24 µm |
| Spectral Range | J/H/K bands (0.9–2.5 µm) |
| Readout Noise | Sub-electron |
| Max Frame Rate | 3500 fps (full frame) / 10 kHz (ROI) |
| Cooling | Integrated pulse-tube cryocooler to 90 K |
| Vacuum System | Sealed, autonomous regeneration |
| Vibration Reduction | 10× active suppression |
| Readout Modes | Global reset, rolling reset, single readout, CDS, multiple non-destructive reads (MDR) |