Optical Instruments
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| Brand | Mitaka |
|---|---|
| Origin | Japan |
| Model | Micro-Visual Alignment System |
| Camera Sensor Size | 2/3″ |
| Resolution | 2 MP |
| Magnification Range | 0.3×–0.7× |
| Telecentricity | Object-Side Telecentric |
| Illumination | Integrated Coaxial White LED |
| Working Distance | 8 mm (customizable) |
| Alignment Accuracy | 1–10 µm |
| Brand | MiXran |
|---|---|
| Model | Meg1134 |
| Type | Zero-Order Quarter-Wave Plate (λ/4) |
| Construction | Air-Gap Retarder |
| Design Wavelengths | 257 nm to 1550 nm |
| Aperture | ≥8.0 mm (for Ø12.7 mm plates) or ≥15.0–18.0 mm (for Ø25.4 mm plates) |
| Thickness | 6.35 mm or 7.92 mm |
| Incident Angle | 0° |
| Surface Quality | λ/10 @ 633 nm |
| Wavefront Distortion | <λ/4 over clear aperture |
| Substrate Material | Fused Silica (UV-grade for ≤355 nm |
| Coating | Broadband AR coating (R<0.25% per surface, specified per wavelength band) |
| Damage Threshold | >5 J/cm² (10 ns, 10 Hz, 1064 nm) |
| Brand | Makeway |
|---|---|
| Model | MKW-3000 |
| Origin | Shanghai, China |
| Detector Type | Multi-probe EDS-compatible |
| Energy Resolution | 120 eV |
| Operating Environments | High Vacuum & Ambient Air |
| Maximum Beam Scan Area | 60 × 60 mm² |
| Sample Positioning | 4-axis Motorized Stage (Vacuum & Air) |
| Beam Control | Motorized Variable Aperture & Remote Focusing |
| Compliance | Designed for ISO/IEC 17025-aligned radiation effects testing workflows |
| Brand | MLOPTIC |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | Cylindrical Lens |
| Pricing | Upon Request |
| Component Type | Optical Element |
| Material Options | Schott, Ohara, Hoya, CDGM optical glasses |
| Max Diameter | 100 mm |
| Diameter Tolerance | +0/−0.01 mm |
| Surface Quality | 10–5 |
| Radius of Curvature | 5 mm to ∞ |
| Radius Tolerance | ±0.002 mm |
| Surface Figure Accuracy | λ/10 |
| Centering Error | ≤0.005 mm |
| Coating Options | Broadband AR, V-Coating, Custom Optical Coatings |
| Metrology | Zygo Interferometer with Computer-Generated Holography (CGH), Max Aperture φ95 mm, λ/10 verification |
| Brand | Moglabs |
|---|---|
| Model | CEL Series |
| Type | External-Cavity Diode Laser (ECDL) |
| Wavelength Range | 450–530 nm & 630–1620 nm |
| Output Power | Up to 250 mW (LD-dependent) |
| Linewidth | <100 kHz (typical), down to 20 kHz (configuration-dependent) |
| Tuning Range | >20 GHz mode-hop-free scan (with MOGLabs controller) |
| Beam Diameter (1/e²) | ~0.6 mm × 0.3 mm |
| Polarization | >100:1 vertical linear |
| Modulation Bandwidth | 20 MHz (AC/DC-coupled, 20 ns delay optional) |
| RF Modulation | >2.5 GHz bandwidth via bias-tee |
| Piezo Feedback | High-bandwidth PZT actuation with user-replaceable Cateye module |
| Thermal Control | TEC (±14.5 V / 3.3 A |
| Cooling | Air-cooled standard |
| Compliance | Designed for GLP/GMP-aligned lab environments |
| Brand | Galvanic |
|---|---|
| Origin | USA |
| Type | In-line Process Turbidimeter |
| Model | MoniTurb-F |
| Measurement Range | 0–500 NTU |
| Resolution | ±2% of full scale |
| Accuracy | ±0.5% of full scale |
| Operating Ambient Temperature | −10 °C to +60 °C |
| Process Temperature | up to 140 °C |
| Process Pressure | up to 220 psi (15 bar) at ambient temperature |
| Wetted Materials | 316L stainless steel (1.4404) standard, customizable |
| Optical Path Length | pipe-diameter-dependent |
| Cable Length | up to 100 m |
| Enclosure Rating | NEMA 4X / IP66 |
| Hazardous Area Options | Class I, Div. 1 |
| Output Interface | Compatible with Monitek® Messenger transmitter |
| Detection Principle | 12° forward scatter photometry |
| Optional Configurations | MoniTurb-S (90° side scatter), MoniTurb-FS (dual-angle scatter) |
| Calibration Interval | 12 months |
| Color Compensation | Yes |
| Optional Air/Water Jet Cleaning System | Available |
| Process Connections | DIN, ANSI, SMS, NPT, APV, TH, Tri-Clamp |
| Units Supported | NTU, JTU, AU, EBC, ppm, g/L, % concentration |
| Brand | Galvanic |
|---|---|
| Origin | USA |
| Model | Monitek MoniSpec-AD |
| Measurement Principle | Dual-Wavelength Absorption Photometry |
| Housing Material | 1.4571 (316L Stainless Steel) |
| Enclosure Rating | NEMA 4X (IP66) |
| Process Connections | DIN, ANSI, SMS, NPT, APV, TH, Tri-Clover |
| Path Length Options | 10–150 mm (1/2"–6") |
| Max Operating Pressure | 15 bar at ambient temperature |
| Max Operating Temperature | 140 °C |
| Fiber Optic Cable Length | Up to 100 m |
| Spectral Range | 390–850 nm |
| Hazardous Area Certification | Class I Div. 1 |
| Compatible Transmitter | Monitek Messenger |
| Measurement Range | Up to 4 Absorbance Units (AU) |
| Accuracy | ±0.5% of reading |
| Repeatability | ±1% |
| Calibration Interval | 12 months |
| Optional Features | Pneumatic cleaning jet |
| Compliant Standards | APHA/Hazen, ASTM D1209, ASTM D1500, ISO 6271, EBC 201, Lovibond |
| Brand | Galvanic |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Form Factor | Benchtop/Laboratory |
| Measurement Ranges | 0–250 EBC (90° side scatter), 0–80 EBC (12° forward scatter) |
| Resolution | 0.01 EBC (sensitivity), 0.05 NTU (display resolution) |
| Operating Temperature | 0–30 °C |
| Accuracy | <2% of reading |
| Repeatability | <1% (with standardized cuvettes) |
| Power Supply | 230 V AC (115 V AC optional) |
| Power Consumption | 60 VA |
| Dimensions | 450 × 300 × 300 mm |
| Weight | 9 kg |
| Measurement Time | ~17 s |
| Interface | RS-232 |
| Cuvette Rotation | Motorized, 360° continuous |
| Automatic Surface Defect Compensation | Yes |
| Color Compensation Algorithm | Embedded |
| Brand | Galvanic |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Monitek Turbidimeter |
| Configuration | Online Process Turbidimeter |
| Measurement Range | 0–8000 mg/L (as SiO₂) |
| Resolution | 0.1 mg/L |
| Operating Ambient Temperature | −10 °C to +50 °C |
| Accuracy | ±1 % of reading |
| Optical Principle | 12° forward scatter detection |
| Wavelength Range | 390–900 nm |
| Repeatability | ±1 % |
| Process Connection | DN25–DN125 (½″–5″) |
| Max Process Pressure | PN16 / ANSI Class 150 |
| Max Process Temperature | 140 °C |
| Sensor Housing Material | 316L stainless steel (Ti, Mn-Co alloy optional) |
| Window Material | Sapphire or metal-backed glass |
| Gasket Options | FKM (FFKM, EPDM, silicone available) |
| Enclosure Rating | IP65 / NEMA 4X |
| Cleaning | Optional integrated spray nozzle |
| Sterilization | CIP-compatible |
| Hazardous Area Certification | ATEX Zone 1 or Zone 2 |
| Power Supply | 90–260 VAC, 50–60 Hz (24 VAC/DC optional) |
| Power Consumption | ≤50 VA |
| Analog Outputs | Up to 4 × 4–20 mA (isolated) |
| Digital Interface | RS-232C / RS-485 Modbus RTU (optional) |
| Relay Outputs | 4 programmable relays (48 V / 2 A) |
| Digital Inputs | 4 × 5 V (optional) |
| Brand | Galvanic |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Monitek Zinc Ion Online Analyzer |
| Price Range | USD 14,000 – 28,000 |
| Brand | Motic |
|---|---|
| Origin | Fujian, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | SMZ171 |
| Pricing | Upon Request |
| Brand | MSHOT |
|---|---|
| Origin | Guangdong, China |
| Model | MP41+KER3000 |
| Optical System | Infinity-Corrected |
| Objective Type | Strain-Free Long Working Distance Plan Apochromat |
| Eyepiece Field of View | Ø22 mm |
| Focusing Mechanism | Coaxial Coarse/Fine Adjustment (Fine Graduation: 2 µm |
| Polarizer & Analyzer | Rotatable 360°, Insertable/Removable from Light Path |
| Rotating Mechanical Stage | 360° Divided Scale, Vernier Resolution 6 arcmin, Center-Adjustable & Lockable, Vertical Travel 30 mm |
| Illumination | 6 V / 30 W Halogen, Brightness-Adjustable |
| Trinocular Port | Dual-View Path (100% Light Transmission for Imaging) |
| Heating Stage | KER3000 Thermally Isolated Digital Heating Stage |
| Temperature Range | Ambient to 400 °C |
| External Casing Max Temp (at 400 °C stage) | ≤70 °C (ambient 25 °C) |
| Control Mode | Adaptive Fuzzy Logic PID |
| Temperature Accuracy | ±0.5% FS |
| System Stability | ±1 °C |
| Ramp Rate Adjustable | 0.5–36 s/°C |
| Instant Hold Response Time | ≤0.01 s |
| Power Input | AC 220 V ±10%, 45–60 Hz |
| Max Power Consumption | 75 W |
| Safety | Low-Voltage DC Heating, No Water Cooling Required |
| Brand | A.L.S. GmbH / Advanced Laser Diode Systems |
|---|---|
| Origin | Germany |
| Model | MSM UltraFast-20 / UltraFast-35 |
| Bandwidth | DC–20 GHz / DC–35 GHz |
| Wavelength Range | 400–1600 nm |
| Detector Structure | Metal–Semiconductor–Metal (MSM) |
| Capacitance | Low |
| Series Impedance | Low |
| Active Area | Optimized for High-Speed Operation |
| Bias Voltage | 6 V (typ.) |
| Output Interface | 50 Ω RF coaxial |
| Compliance | RoHS, CE |
| Mounting Options | SM-fiber-coupled (UltraFast-20/35 SM) and free-space (UltraFast-20/35 FS) with integrated focusing lens |
| Brand | MX-AFM |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MX-plorer Premium |
| Instrument Type | Atomic Force Microscope (AFM) |
| Position Detection Noise | ≤ 50 pm |
| XY Sample Stage Travel Range | ≥ 5 mm |
| Operating Modes | Contact, Tapping, Phase Imaging, Conductive AFM (C-AFM), Kelvin Probe Force Microscopy (KPFM), Force Spectroscopy, Nanolithography |
| Control Architecture | Closed-Loop Piezoelectric Scanning System |
| Brand | Luqi Technology |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | OEM Manufacturer |
| Model | NAGA |
| Price | Upon Request |
| Spectral Range | 200–1100 nm |
| Optical Architecture | Crossed Czerny-Turner |
| F-number | f/4 |
| Slit Width Options | 10 / 25 / 50 / 75 / 100 µm |
| Grating Options | 300 / 600 / 900 / 1200 / 1800 lines/mm |
| Stray Light | <1% |
| Weight | 200 g |
| Interface | USB 2.0 Type-B, Digital I/O |
| Fiber Optic Connector | Standard SMA 905, Customizable |
| Brand | Nano analytik |
|---|---|
| Origin | Germany |
| Model | AFM Series (SmartProbe Platform) |
| Instrument Type | Atomic Force Microscope |
| Vertical Position Detection Noise | 0.01 nm RMS |
| Maximum Sample Diameter | ≤10 cm |
| Scanner Range (Adeona) | 15 µm × 15 µm × 4 µm |
| Dimensions (Vacuum-Compatible Version) | 140 mm × 100 mm × 60 mm |
| Integrated Actuation & Sensing | Piezoresistive readout + bimaterial excitation on SmartProbe |
| XYZ Nanopositioning Range (Vacuum Variant) | 20 µm × 10 µm × 10 µm |
| Brand | Nano analytik |
|---|---|
| Origin | Germany |
| Model | SPL |
| Instrument Type | Atomic Force Microscope-based Scanning Probe Lithography System |
| Positioning Detection Noise | 0.01 nm (X, Y, Z) |
| Maximum Sample Diameter | 150 mm (6 in) |
| Stage Travel Range | 18 mm × 18 mm (expandable to 150 mm × 150 mm) |
| Minimum Feature Size | 5 nm (verified) |
| Direct-Write Speed | 300 µm/s |
| Overlay Accuracy | < 7 nm |
| Stitching Accuracy | < 10 nm |
| Maximum Writing Area per Field | 200 µm × 200 µm |
| Footprint | 80 cm × 100 cm × 190 cm |
| AFM Imaging Range | 10 µm × 10 µm × 5 µm (expandable to 200 µm × 200 µm) |
| Vertical RMS Noise | 0.01 nm |
| Closed-Loop Scan Linearity | 99.7% |
| Real-Time FPGA Feedback Bandwidth | 8 MHz |
| Data Acquisition Resolution | 16-bit (amplitude/phase) |
| Output Formats | BMP, PNG, JPG, TXT |
| Brand | Nanolnsights |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-made) |
| Model | SpinX |
| Pricing | Available Upon Request |
| Resolution | X-Y = 140 nm, Z = 450 nm |
| Excitation Wavelength Range | 400–750 nm |
| Detection Channels | Fluorescence + Brightfield |
| Fluorescence Detector | Scientific CMOS (sCMOS) Camera |
| Objective Lenses | 10×, 20×, 40×, 60×, 100× (oil/water immersion compatible) |
| Microscope Host | Fully Automated Motorized Platform |
| Illumination Source | Metal Halide Lamp / High-Power LED |
| Control Software | Dual-Mode Intelligent Suite (Beginner & Advanced Modes) |
| Vibration Isolation Table | 1.2 × 1.2 m Dedicated Anti-Vibration Platform |
| XY Stage Drive | Precision Motorized Linear Actuation |
| Brand | Nanosurf |
|---|---|
| Origin | Switzerland |
| Model | FLEX-AFM |
| Instrument Type | Atomic Force Microscope |
| XY Positioning Noise | ≤ 0.15 nm (RMS, in air & liquid) |
| Sample Dimensions | Ø ≤ 100 mm, Thickness ≤ 5 mm |
| Sample Stage Travel Range | 300 mm × 300 mm |
| Scan Range | 100 µm × 100 µm × 10 µm (XY × Z) |
| XY Drive Resolution | 0.152 nm |
| Z Drive Resolution | 0.046 nm |
| Minimum Z Noise Floor | 0.15 nm (RMS, closed-loop) |
| Compatible Environments | Ambient air, liquid, controlled atmosphere (e.g., inert gas, low-oxygen), temperature-controlled stages |
| Controller | C3000 (24-bit, dual-channel lock-in amplifiers, digital feedback) |
| Optical Integration | Fully compatible with inverted optical microscopes |
| Modular Add-ons | ECS 204 electrochemical stage, ATS 204 automated translation stage, Isostage active vibration isolation, acoustic enclosure, glovebox integration kit |
| Brand | Nanosurf |
|---|---|
| Origin | Switzerland |
| Model | FlexAFM |
| Instrument Type | Material-Focused AFM |
| Position Detection Noise | <35 pm |
| Maximum Sample Diameter | ≤120 mm |
| Control Electronics | C3000i (24-bit), upgradeable to CX (28-bit) |
| Software | Nanosurf Software Suite |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments, supports GLP/GMP audit trails via optional software modules |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Model | NCC Series |
| Price Range | USD 700 – 1,400 (FOB) |
| Compatibility | Cylindrical Optics (Ø4–50 mm) |
| Mounting Interface | Standard Ø6 mm or M6 Rod Compatibility |
| Base Design | NCC50 with Counterbored Holes for Optical Table Integration |
| Clamping Mechanism | Slit-Type Spring-Loaded V-Groove with Three-Point Contact Geometry |
| Brand | NCS |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | FE-1050 Series |
| Instrument Form Factor | Floor-Standing |
| Electron Gun Type | Thermal Field Emission |
| Secondary Electron (SE) Resolution | 1.5 nm @ 1 kV, 0.9 nm @ 15 kV |
| Magnification Range | 10× to 1,000,000× |
| Accelerating Voltage | 0.02–30 kV |
| Backscattered Electron (BSE) Resolution | 2.5 nm @ 1 kV, 1.5 nm @ 15 kV |
| Sample Chamber Port Count | 27 |
| Stage Motion | 5-Axis Motorized (X = 140 mm, Y = 140 mm, Z = 60 mm, Rotation = 360°, Tilt = −10° to +80°) |
| Standard Detectors | In-Column SE Detector, Everhart-Thornley SE Detector, Optional Insertable BSE Detector, Optional STEM Detector, Triple-Channel IR CCD Chamber Monitoring System |
| Brand | LQ Tech |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | NEVE |
| Pricing | Available Upon Request |
| Spectral Range | 200–1100 nm |
| Optical Architecture | Symmetric Czerny-Turner |
| F-number | f/7.5 |
| Slit Width Options | 10, 25, 50, 75, or 100 µm |
| Grating Options | 300, 600, 900, 1200, or 1800 lines/mm |
| Stray Light | <1% |
| Weight | 400 g |
| Interface | USB 2.0 Type-B, Digital I/O |
| Fiber Optic Connector | Standard SMA 905 (customizable) |
| Brand | Nexcope |
|---|---|
| Origin | Zhejiang, China |
| Model | NCF1000 |
| Instrument Type | Point-Scanning Confocal Microscope |
| Field of View | Φ25 mm (25 mm diameter circular field, square imaging area up to 8192 × 8192 pixels) |
| Lasers | 405 nm, 488 nm, 561 nm, 640 nm |
| Detectors | 4-channel PMT (standard), spectral detector (400–750 nm, 1 nm tuning resolution, up to 4 GaAsP PMTs), transmission PMT detector |
| Scan Modes | X, Y, Z, λ (spectral), and T (time-lapse) — fully combinable |
| Pinhole | Motorized continuous adjustment |
| Objective Lenses | 4×/0.16, 10×/0.45, 20×/0.75, 40×/0.95, 60×/1.42, 100×/1.45 & 100×/1.49 (oil immersion, coverslip-corrected) |
| Microscope Host | NIB1000-AT motorized inverted research-grade platform with NIS60 infinity optical system |
| Illumination | Epifluorescence LED light source (4-band, 6-position motorized filter turret: B/G/U standard |
| Software | Nomis Pro X-C (confocal scanning control, multi-dimensional acquisition, channel presets, hardware-integrated operation, 16-bit image output, real-time deconvolution & basic filtering) |
| XY Stage | Motorized grating-based, 130 mm × 100 mm travel, 0.1 µm positioning accuracy, 0.5 µm repeatability |
| Z Focus | Motorized, 10 mm range, 0.02 µm minimum step, 0.1 µm repeatability |
| Adaptive Focus Stabilization (AFS) | Real-time focal plane maintenance during time-lapse imaging |
| Optional Modules | SR-SIM super-resolution upgrade (2D-SIM lateral resolution ≤85 nm, 3D-SIM axial resolution ≤270 nm |
| Brand | Nexcope |
|---|---|
| Origin | Zhejiang, China |
| Model | NE900 Multi-Observer |
| Price Range | USD 42,000 – 70,000 |
| Observer Capacity | 2–10 stations |
| Integrated Teaching Pointer | Dual-color LED, 360° rotatable, brightness-adjustable |
| Camera Interface | Standard C-mount |
| Software Compatibility | Proprietary microscopy imaging suite (measurement, counting, fluorescence channel merging, real-time projection) |
| Ergonomic Design | Adjustable eyepiece height, low-fatigue viewing posture, modular station expansion |
| Optical Path | Shared objective/camera path with beam-splitting architecture ensuring zero image distortion and uniform luminance across all observation ports |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Model | NFP-2561T / NFP-2561TL |
| Handedness | Right-Hand (NFP-2561T), Left-Hand (NFP-2561TL) |
| Compatibility | Designed for integration with NFP-3561 / NFP-3561L Ultra-High-Precision 3D Manual Translation Stages |
| Mounting Interface | Integrated dovetail rail for optical component carriers |
| Adjustability | Independent angular adjustment about Y-axis and Z-axis |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | NFPG Series |
| Pricing | Available Upon Request |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | NFPR Series |
| Pricing | Available Upon Request |
| Brand | Nikon |
|---|---|
| Origin | Japan |
| Model | Eclipse Ni-E / Ni-U |
| Optical System | CFI60 / CFI75 Infinity-Corrected |
| Illumination | 12V 100W Halogen with Fly-Eye Lens Array |
| Objective Compatibility | CFI Plan Apochromat λ Series (350–850 nm) |
| Fluorescence Performance | Noise Terminator™ High-S/N System |
| Focus Mechanism | Motorized Coaxial Fine/Coarse (Ni-E, 0.05 µm encoder resolution) / Manual with Re-Positioning Function (Ni-U) |
| Stage | Ceramic-Coated Mechanical or Motorized XY (66 × 52 mm, 0.1 µm step) |
| Eyepiece Options | Widefield UW10× (25 mm FOV), Photomask-Compatible, Ergonomic Tilting Binoculars (10°–30°) |
| Compliance | Designed for ISO 10993-compliant sample handling workflows |
| Brand | Nikon |
|---|---|
| Origin | Japan |
| Model | PF10545MF-UV |
| Spectral Range | 220–900 nm |
| Transmission | >70% across full range |
| Focus Shift Compensation | None required from visible to UV |
| Magnification Range | ∞ to 0.5× |
| Image Distortion | <0.1% across entire magnification range |
| Mount Type | Nikon F-mount (mechanical coupling compatible with manual-focus and AF-compatible bodies via adapter) |