Other Physical Property Test Instruments
Filter
Showing 1–30 of 196 results
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | HEMS & LT-AC/DC |
| Pricing | Upon Request |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LT-AFM/MFM |
| Price | Upon Request |
| Operating Temperature Range | 20 mK – 300 K |
| Magnetic Field Capability | Up to 16 T |
| Displacement Noise Floor | 15 fm/√Hz (fiber interferometer, standard configuration) |
| Magnetic Resolution | 10 nm at 4 K |
| Interferometer Wavelength | 1310 nm |
| Fabry–Pérot Interferometer Noise Floor | 1 fm/√Hz (4–300 K) |
| Theoretical Shot-Noise Limit | 0.51 fm/√Hz |
| Scan Head Z-Range | 10 mm (stick-slip piezo stage) |
| XY Travel | Ø3 mm |
| Positioning Sensitivity | 50 nm |
| Scan Area Options (X×Y×Z @ Temp) | Ultra-Large: 200×200×7.2 µm @ 300 K, 50×50×4.8 µm @ 77 K, 30×30×2.4 µm @ 4.2 K |
| Large | 150×150×7 µm @ 300 K, 36×36×1.8 µm @ 77 K, 18×18×0.8 µm @ 4.2 K |
| Standard | 52×52×4.8 µm @ 300 K, 14×14×1.2 µm @ 77 K, 6×6×0.5 µm @ 4.2 K |
| Cantilever Alignment | Tri-point alignment chip (compatible with commercial cantilevers, no optical alignment required) |
| Scanner Architecture | Dual concentric piezotubes — inner tube for scanning, outer tube for coarse sample positioning |
| Scanner Electrodes | Quadrant electrodes + integrated excitation piezo for cantilever actuation |
| Signal Output | Analog BNC outputs (deflection, error, Z-feedback), LEMO interface to microscope control unit |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LT-APO OBJECTIVES |
| Price | Upon Request |
| Clear Aperture (CA) | 4.7 mm |
| Focal Length (FL) | 2.8–2.9 mm |
| Numerical Aperture (NA) | 0.82 |
| Working Distance (WD) | 0.95 mm (up to 1.45 mm depending on configuration) |
| Transmission Coating | Broadband AR coating (>80% average transmission) |
| Spectral Range (Visible-NIR) | 400–1000 nm |
| Apochromatic Correction Range (Df < ±1 D) | 540–780 nm (visible), 650–970 nm (NIR), and 930–1365 nm (IR) |
| Environmental Rating | Designed for cryogenic temperatures, high magnetic fields (≥16 T), and ultra-high vacuum (UHV, ≤10⁻⁹ mbar) |
| Physical Dimensions | Ø24 mm × 49 mm L |
| Mass | 46 g |
| Mount Thread | RMS (0.80″ × 36 TPI, 3 mm engagement depth) |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LT-SHPM/STM |
| Price | Upon Request |
| Max Applied Magnetic Field | ~16 T |
| Operating Temperature Range | 10 mK to 300 K |
| Hall Probe Resolution | ~1 µm |
| STM Resolution | Atomic-scale |
| Scan Ranges (XYZ @ Temp) | 200×200×7.2 µm @ 300 K |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Model | MK-CONFOCAL/RAMAN MICROSCOPE (MK-CFM/RAMAN) |
| Objective | 0.82 NA, 0.95 mm working distance, cryo-compatible APO objective |
| Temperature Range | 10 mK to 300 K |
| Magnetic Field Compatibility | Up to 31 T |
| Scan Range | 50 × 50 × 25 µm @ 300 K / 30 × 30 × 15 µm @ 4 K |
| Sample Approach Range | XYZ ±6 × ±6 × ±12 mm, step size 50–700 nm |
| Closed-Loop Positioning | Resistive encoder, 200 nm resolution |
| Fine Scan Range | 7.5 µm @ 300 K / 1 µm @ 4.2 K |
| Max Sample Dimensions | 10 × 10 × 5 mm |
| Sample Holder | 8-pin electrical interface |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PIEZO ROTATOR |
| Price | Upon Request |
| Dimensions (L×W×H) | 35 mm × 35 mm × 11.5 mm |
| Weight | 65 g |
| Clear Aperture | 13 mm |
| Body Material | Titanium Alloy & Beryllium Copper (or Beryllium Copper Only for mK Operation) |
| Actuator | PZT Piezoceramic |
| Cabling | Insulated Twisted Pair — Copper for PZT, Phosphor Bronze for Resistive Sensor |
| Coarse Travel Range (Stepping Mode) | 360° Continuous |
| Max. Drive Speed (300 K) | ~32°/s |
| Input Voltage Range (PZT) | 0–60 V |
| Fine Angular Positioning Range (300 K) | 40 m° |
| Fine Angular Positioning Range (4 K) | 6 m° |
| Fine Positioning Resolution | µ° |
| DC Input Voltage Range (Sensor) | 0–100 V (300 K), 0–150 V (4 K) |
| Encoder Type | Cermet Resistive Sensor |
| Encoder Travel Range | 315° |
| Encoder Resolution | ~5 m° |
| Encoder Power Consumption (Active) | 10–100 µW |
| Repeatability (Unidirectional) | ±45 m° |
| Max. Static Load (RT) | 200 g |
| Max. Dynamic Torque about Axis | 2 N·cm |
| Environmental Compatibility | Ambient Temperature, Cryogenic (Down to 4 K), Ultra-High Vacuum (UHV), Bakeable to 100 °C |
| Brand | 3i |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NV-CENTRE CONFOCAL MICROSCOPY |
| Price | Upon Request |
| Objective NA | 0.82 |
| Working Distance | 0.95 mm @ 532 nm |
| Laser Source | SLM-stabilized 10 mW @ 532 nm |
| Scan Range | 30 × 30 × 15 µm at 4 K |
| Outer Diameter | 49 mm |
| Temperature Range | 10 mK – 300 K |
| Detector | Avalanche Photodiode (APD) |
| Sample Stage | XYZ Nanopositioning Platform, 6 × 6 × 12 mm travel |
| NV/QTF Sensor Stage | XYZ Nanopositioning Platform, 4 × 4 × 6 mm travel |
| Position Sensor Resolution | 200 nm |
| Controller | Ultra-low-noise FPGA-based AFM controller with high-speed USB interface |
| Real-time Processor | 32-bit, 128 MB DDR SDRAM |
| ADC | Dual-channel, 16-bit / 100 MHz |
| DAC | Dual-channel, 16-bit / 100 MHz |
| PID Loops | Seven digital PID controllers implemented on FPGA |
| Piezo Controller Channels | 19-channel |
| High-resolution ADC | 16-channel, 24-bit / 175 kHz |
| Scan Signal DAC | 24-bit XYZ output |
| High-voltage Amplifier | Low-noise design |
| Brand | 3nh |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM/ODM Manufacturer |
| Country of Origin | China |
| Model | NQ-10-100A (Standard ISO 12233, 1×) / NE-10-100A (Enhanced ISO 12233, 1×) |
| Material | High-resolution photographic paper, semi-matte surface finish |
| Active Area Dimensions | 200 mm × 356 mm |
| Contrast | Normative (ISO 12233-compliant 4:1 luminance ratio) |
| Compliance | ISO 12233:2017 “Photography — Electronic still picture imaging — Resolution and spatial frequency responses” |
| Brand | A.Krüss / A.Krüss Optronic |
|---|---|
| Origin | Germany |
| Model | DS7800 |
| Instrument Type | Laboratory Benchtop Oscillating U-Tube Densimeter |
| Sample Type | Liquid |
| Density Range | 0.0000–1.9999 g/cm³ |
| Density Accuracy | ±0.0001 g/cm³ |
| Temperature Control Range | 10–40 °C |
| Minimum Sample Volume | 2 mL |
| Compliance | ASTM D4052-18, ASTM D5002, ISO 12185:1996, ISO 2811-3:2011, SH/T 0604-2000, GB/T 21862.3-2008 |
| Brand | A&D |
|---|---|
| Origin | Japan |
| Model | EJ-120D |
| Weighing Capacity | 120 g |
| Readability | 0.01 g |
| Density Resolution | 0.01 g/cm³ |
| Repeatability | 0.01 g |
| Pan Size | 110 mm |
| Display | Backlit LCD, 16 mm digit height |
| Interface Options | RS-232 or driver-free USB |
| Power Supply | AC adapter and rechargeable battery dual mode |
| Compliance | GLP/GMP/GCP and ISO-compliant calibration reporting |
| Brand | A&D |
|---|---|
| Origin | Japan |
| Model | EK-300iD / EK-3000iD |
| Instrument Type | Benchtop Solid Density Analyzer |
| Measurement Principle | Archimedean Buoyancy Method (Air Weight / (Air Weight − Immersed Weight) × Reference Liquid Density) |
| Density Range | 0–2.000 g/cm³ |
| Density Resolution | 0.001 g/cm³ (EK-300iD) / 0.01 g/cm³ (EK-3000iD) |
| Temperature Range | 0–100 °C |
| Minimum Sample Mass | 0.001 g |
| Reference Liquids | Water, Kerosene, or User-Defined Liquids (Density Input Range: 0.000–2.000 g/cm³) |
| Temperature Compensation | Automatic |
| Data Storage | 200 Records |
| Interface | RS-232 |
| Compliance | GLP/GMP/GCP Audit Trail Ready, ISO/IEC 17025 Support Enabled |
| Software | WinCT Data Acquisition Suite (Windows-compatible, Excel export, statistical analysis, graphing) |
| Brand | A2PS / A2 Photonic Sensors |
|---|---|
| Origin | France |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | B-POP |
| Pricing | Available Upon Request |
| Brand | ABET Technologies |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QE Measurement Systems |
| Pricing | Available Upon Request |
| Light Source | LED-based monochromatic source (DC to high-frequency modulation, no mechanical chopper required) |
| Focal Length | 250 mm |
| Monochromator Drive | Direct-drive grating mechanism |
| Spectral Range | 300–1800 nm |
| Output Coupling | Fiber-coupled, uniform beam profile |
| Detection | Dual-channel lock-in amplifier |
| Device Compatibility | Single-junction and multi-junction photovoltaic devices |
| Measurable Parameters | External Quantum Efficiency (EQE), Incident Photon-to-Current Efficiency (IPCE), Internal Quantum Efficiency (IQE) |
| Bias Voltage Range | ±10 V |
| Current Measurement Range | Up to 100 mA (I–V characterization) |
| Auxiliary Light Source | Optional broadband (white) or custom spectral source |
| Control & Processing | Integrated Windows OS with embedded DSP-based lock-in amplifier |
| Software | Photor™ — full-featured quantum efficiency analysis suite |
| Brand | ABTEC |
|---|---|
| Origin | Shenzhen, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | A5 |
| Pricing | Available Upon Request |
| THD+N (Typical) | –108 dB |
| Max Input Voltage (Balanced) | 300 Vrms |
| Analog Output Amplitude | 21 Vrms |
| Supported Bluetooth Codecs | SBC, aptX, aptX-LL, aptX-HD, AAC, LHDC (HWA) |
| Digital Interface Options | SPDIF, TOSLINK, AES/EBU, I²S, HDMI, BT, PDM (optional), DSI-O (optional, higher sample rate support) |
| Software API Support | VB.NET, C#.NET, LabVIEW |
| Measurement Capabilities | Level/Gain/Phase, Channel Balance, Frequency Response, THD+N, IMD, SNR, Noise, Crosstalk, Interchannel Phase, DC Level, Frequency Measurement, CMRR, Oscilloscope & Spectrum Monitoring, Stepped Level/Frequency Sweep, DC Level Sweep, Q-Peak Noise |
| Brand | ACM |
|---|---|
| Origin | Austria |
| Model | LAB.N2 |
| Measurement Range | 0–3 bar |
| Accuracy | ±0.05 bar |
| Repeatability | ±0.02 bar |
| Measurement Time | ≤60 s |
| Data Interface | ACM QUATROL System Integration |
| Power Supply | 24 VDC, 1.5 A |
| Dimensions | Ø32 cm × H56 cm |
| Weight | 8.20 kg |
| Brand | AD Systems |
|---|---|
| Origin | France |
| Model | ST10 |
| Compliance | ASTM D4740 |
| Operating Temperature | Filter Paper 100 °C ±0.2 °C, Fuel Sample 93 °C ±0.2 °C |
| Display | 7-inch capacitive touchscreen |
| Data Storage | Up to 100,000 test records with full image metadata |
| Connectivity | RJ45 Ethernet port, 4× USB 2.0 ports |
| Dimensions (W×D×H) | 420 × 350 × 222 mm |
| Weight | 9 kg |
| Power Supply | 230 V AC, 2 A, 50 Hz |
| Sample Handling | Manual droplet deposition via supplied micro-pipette |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | F-PEM |
| Operating Atmosphere | Ambient Air |
| Temperature Range | Room Temperature to 600 °C (Heating Zone) |
| Sample Size | Square, 40 mm × 40 mm × (5–30) mm Thickness |
| Power Supply | AC200V, 5 kW (Main Unit) |
| Dimensions | W600 × D600 × H1700 mm |
| Weight | ~120 kg |
| Contact Force | Up to 160 kgf (via Constant-Pressure Spring Mechanism) |
| Measured Parameters | Maximum Output Power (P<sub>max</sub>), Heat Flow Rate (Q), Thermoelectric Conversion Efficiency (η) |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | Mini-PEM |
| Operating Temperature Range (Hot Side) | 50–500 °C |
| Sample Dimensions | 2–10 mm × 1–20 mm (square/rectangular bulk) |
| Atmosphere | Vacuum-compatible |
| Measured Parameters | Thermoelectric conversion efficiency (η), electrical power output, heat flux |
| Measurement Principle | Simultaneous four-probe electrical characterization + calibrated heat flux sensor (thermopile-based) |
| Compliance | Designed for ASTM E3049–22 (Standard Practice for Measuring Thermoelectric Module Efficiency) and ISO 14405-1:2016 (Geometrical product specifications) alignment |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | Peltier Evaluation System |
| Measurement Atmosphere | Vacuum |
| Temperature Range | 27–80 °C |
| Sample Dimensions | Square, 10–25 mm side length, thickness ≤ 3 mm |
| Measured Parameters | ΔTₘₐₓ (maximum temperature difference), Qc,ₘₐₓ (maximum cooling power), COP (coefficient of performance) |
| Compliance | Designed for thermoelectric module characterization per ISO 14405-1 and ASTM D5470 practices |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | PEM-2 |
| Maximum Temperature Gradient | 500 °C (up to 800 °C heating surface) |
| Sample Geometry | Square, 20/30/40 mm × 5–30 mm thickness |
| Contact Pressure | 2 MPa (at 30 mm square sample) |
| Atmosphere | Inert gas compatible |
| Measurement Method | One-dimensional heat flux input method |
| Measured Parameters | Thermoelectric conversion efficiency (η), electrical power output (P), thermal input flux (Q) |
| Heating System | High-precision infrared gold-mirror furnace |
| Cooling System | Integrated water-cooled lower stage |
| Load Control | Automated variable resistive load adjustment |
| Software | Fully integrated control with thermal stability detection, real-time data logging, and automated test sequencing |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | WET-1200 |
| Temperature Range (Static Drop) | Ambient to 1500 °C |
| Temperature Range (Extrusion Drop, optional) | Ambient to 1200 °C |
| Sample Substrate | Ø10 mm × 2 mm |
| Measurement Atmospheres | Vacuum, Controlled Gas Flow, Ambient Air |
| Measurement Methods | Static Drop Method, Optional Extrusion Drop Method |
| Application Scope | High-temperature wettability analysis of molten metals, alloys, glasses, and ceramics against solid substrates |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | ZEM-3 |
| Temperature Range | 50–800 °C (ZEM-3M8) / 50–1000 °C (ZEM-3M10) |
| Sample Geometry | Square (2–4 mm × 6–22 mm L) or Circular (Ø2–4 mm × 6–22 mm L) |
| Heating Method | Infrared gold-coated furnace with micro-heater for ΔT control |
| Max. Sample ΔT | 50 °C |
| Atmosphere | Ultra-high-purity helium (99.999%) |
| Automation | Fully computer-controlled measurement with background EMF compensation |
| Contact Verification | Real-time V–I curve analysis for ohmic contact validation |
| Optional Accessories | Thin-film adapter, cryogenic module (−100 to 200 °C), high-resistivity kit (up to 10 MΩ) |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | ZEM-d |
| Temperature Range | Up to 200 °C (sample surface) |
| Sample Cross-Section | Ø20 mm (max) |
| Sample Thickness | 10 µm – 20 mm |
| Measured Properties | Seebeck coefficient (S), electrical resistivity (ρ) |
| Atmosphere | Air or inert gas (N₂, Ar) |
| Measurement Orientation | Through-thickness (z-direction) |
| Brand | Aerospace |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | ZJD-87 Dielectric Constant and Dissipation Factor Analyzer |
| Price Range | USD 11,200 – 21,000 (FOB Beijing) |
| Brand | Aerospace |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | ZJD-87 |
| Price Range | USD 7,000 – 14,000 |
| Brand | Aerospace |
|---|---|
| Origin | Beijing, China |
| Model | ZJD-A Dielectric Constant and Dissipation Factor Analyzer |
| Frequency Range | 10 kHz – 60 MHz (DDS Synthesized) |
| Capacitance Tuning Range | 30–500 pF |
| Q Factor Range | 1–1000 |
| Q Resolution | 0.1 (4-digit effective) |
| Q Measurement Accuracy | < ±5% |
| Inductance Measurement Range | 15 nH – 8.4 H |
| Inductance Resolution | 0.1 nH |
| Inductance Accuracy | < ±5% |
| Frequency Accuracy | ±3×10⁻⁵ ±1 digit (6-digit display) |
| Frequency Coverage Ratio | 6000:1 |
| Standard Compliance | GB/T 1409, IEC 60250, JB 7770 |
| Brand | Aerospace |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Model | ZJD-A Dielectric Constant and Impedance Analyzer |
| Frequency Range | 10 kHz – 70 MHz (DDS Synthesized) |
| Q Factor Range | 1–1000 (Auto/Manual Scaling) |
| Q Resolution | 0.1 (4-digit display) |
| Frequency Accuracy | ±3×10⁻⁵ ±1 digit (6-digit precision) |
| Inductance Measurement Range | 15 nH – 8.4 H |
| Capacitance Tuning Range | 30–500 pF |
| Capacitance Resolution & Error | ±1.5 pF or <1% |
| tanδ Measurement Capability | Yes |
| εᵣ (Relative Permittivity) Calculation | Supported via parallel-plate fixture |
| Fixture Electrode Diameter | Φ50 mm / Φ38 mm (selectable) |
| Electrode Spacing Adjustment | ≥15 mm |
| Micrometer Resolution | 0.001 mm |
| Fixture Loss Tangent (1 MHz) | ≤4×10⁻⁴ |
| Brand | Aerospace |
|---|---|
| Origin | Beijing, China |
| Model | ZJD-A |
| Frequency Range | 10 kHz – 110 MHz |
| Q Measurement Range | 1–1000 |
| Tanδ Accuracy | 1×10⁻⁴ |
| εr Accuracy | 0.001 |
| Electrode Diameter | Φ38 mm or Φ50 mm (selectable) |
| Electrode Spacing Adjustment | ≥15 mm |
| Sample Thickness Range | 0.1–10 mm |
| Residual tanδ of Fixture | ≤4×10⁻⁴ @ 1 MHz |
| Power Supply | 220 V ±10%, 50 Hz ±2.5 Hz |
| Operating Temperature | 0–40 °C |
| Power Consumption | ~25 W |
| Compliance | GB/T 1409–2006, GB/T 1693–2007, ASTM D150–11, IEC 60250 |
| Brand | Aerospace |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | ZJD-B |
| Price Range | USD 4,200 – 11,200 (FOB Beijing) |
| Frequency Range | 1 kHz – 1 GHz (standard) |
| Dielectric Constant (ε′) Range | 1.0 – 35.0 (resolution: 0.1%) |
| Loss Tangent (tan δ) Range | 1×10⁻⁵ – 1.0 (resolution: 1×10⁻⁵) |
| Sample Compatibility | Solid discs (Ø20–100 mm, thickness 0.1–10 mm), liquids (parallel-plate or coaxial probe), thin films (3-electrode configuration) |
| Temperature Range | Ambient (23 °C ±1 °C) |
| optional thermal chamber | −50 °C to +150 °C |
| Voltage Gradient | 10–500 V/mm (adjustable per sample thickness) |
| Compliance | IEC 60250:2020, ASTM D150-18, GB/T 1409-2006 |
| Calibration | Open/short/load with NIST-traceable polystyrene reference dielectric and certified standard capacitors |
| Brand | Aerospace |
|---|---|
| Origin | Beijing, China |
| Model | ZJD-C |
| Frequency Range | 50 Hz – 1 MHz |
| Test Voltage | 0.1 kV – 10 kV |
| Temperature Control | Ambient to 300 °C |
| Sample Compatibility | Solid discs (Ø25–100 mm, thickness 0.1–10 mm), liquids, thin films |
| Measurement Accuracy | ε ≤ ±1%, tanδ ≤ ±1×10⁻⁴ |
| Compliance | IEC 60250, ASTM D150, GB/T 1409, IEEE 286 |
| Calibration | CNAS-accredited traceability |