Aolong ALYX-700 X-ray Crystal Ingot Orientation Instrument

Overview

The Aolong ALYX-700 X-ray Crystal Ingot Orientation Instrument is a dedicated Bragg-angle-based orientation metrology system engineered for rapid, non-destructive crystallographic axis determination in single-crystal ingots—particularly sapphire (Al₂O₃) boules grown via the Kyropoulos or heat exchanger method. Unlike general-purpose X-ray diffractometers, the ALYX-700 employs a fixed-geometry, monochromatic Cu-Kα radiation source (λ = 1.5418 Å) and a collimated Geiger–Müller detector to perform precise angular scans around predefined Bragg reflection conditions (e.g., the 0006 reflection for sapphire C-axis identification). Its design prioritizes operational robustness, repeatability under industrial QC environments, and compatibility with large-diameter (>150 mm), high-aspect-ratio crystal rods that exceed the mechanical envelope of conventional lab-scale orienters. The instrument operates on standard 220 V / 50 Hz utility power and integrates safety interlocks compliant with IEC 61010-1 and national GB/T 18801-2019 requirements for X-ray generating equipment.

Key Features

• Fixed-angle Bragg geometry optimized for sapphire C-axis (0006) and R-plane (101̅2) identification—enabling sub-0.1° angular reproducibility across repeated measurements
• Motorized rotary stage with ±180° continuous rotation and 0.01° incremental resolution, coupled with programmable angular dwell and scan profiles
• Automated sample positioning system with Z-axis lift and radial centering capability—accommodating ingots up to Ø200 mm × 600 mm length
• Electrically actuated beam shutter synchronized with detector gating and motion control—ensuring strict radiation exposure compliance during alignment sequences
• Digital angle readout via integrated LED display panel; no external PC required for basic operation—reducing dependency on software infrastructure in cleanroom or production-floor settings
• Air-cooled Cu-target X-ray tube (30 kV / 0–5 mA) with thermal overload protection and stable output regulation over extended duty cycles
• Three selectable time constants (0.1 s, 0.4 s, 3 s) for pulse integration—allowing optimization between signal-to-noise ratio and throughput depending on crystal quality and surface finish

Sample Compatibility & Compliance

The ALYX-700 supports orientation analysis of optically transparent and semi-transparent single crystals including sapphire (Al₂O₃), silicon carbide (SiC), lithium niobate (LiNbO₃), and yttrium aluminum garnet (YAG). It is routinely deployed in sapphire substrate manufacturing lines where C-axis alignment accuracy directly impacts downstream wafer slicing yield and epitaxial layer uniformity. The instrument conforms to ISO 14001 environmental management protocols for energy-efficient operation and meets mandatory Chinese Class II radiation device registration requirements (NMPA Regulation No. 129). While not certified to FDA 21 CFR Part 11, its manual operation mode—with immutable angle logs recorded on the display panel—supports GLP-compliant documentation when integrated into validated SOPs.

Software & Data Management

The ALYX-700 operates in standalone mode without proprietary software dependencies. All measurement parameters—including applied voltage/current, selected time constant, and final angular position—are retained in volatile memory and visible on the front-panel display. For traceability, users may manually record results in laboratory notebooks or export data via optional RS-232 interface (available as factory add-on) to external SCADA or MES systems. No cloud connectivity, remote access, or audit-trail functionality is embedded—aligning with semiconductor fab security policies restricting networked instrumentation in process-critical zones.

Applications

• Pre-slicing verification of sapphire boule C-axis orientation prior to multi-wire sawing
• Quality control of crystal growth homogeneity by mapping angular deviation along ingot length
• Orientation validation of regenerated or re-melted crystal segments used in optical window fabrication
• Teaching and training in crystallography laboratories—demonstrating Bragg’s law, lattice symmetry, and Miller index interpretation
• Supporting ISO/IEC 17025-accredited calibration labs performing angular reference verification against NIST-traceable standards

FAQ

Is the ALYX-700 suitable for measuring non-sapphire crystals?
Yes—it supports any single crystal with accessible Bragg reflections within the Cu-Kα energy range and sufficient diffracted intensity; users must verify reflection angles using standard crystallographic databases (e.g., ICDD PDF-4+).
Does the instrument include radiation shielding certification?
The unit incorporates lead-lined housing and interlocked door switches meeting GBZ 117-2020 requirements; full site-specific shielding validation must be performed by qualified health physics personnel.
Can the rotary stage be upgraded for automated indexing?
Factory-installed motorized indexing modules are available with programmable step angles and TTL trigger inputs for integration into automated handling lines.
What maintenance is required for the Geiger counter?
The detector requires annual sensitivity verification using a calibrated ¹³⁷Cs source; replacement tubes are field-swappable with standard vacuum connectors.
Is technical support available outside China?
Aolong provides remote diagnostics and English-language documentation; on-site service is coordinated through authorized regional partners in Southeast Asia, Turkey, and Eastern Europe.