Auniontech 6317A Series High-Precision Tunable Laser Source for C-, L-, and U-Bands (1480–1680 nm)

Overview

The Auniontech 6317A Series is a high-stability, continuous-wave (CW) tunable laser source engineered for precision optical characterization across the C-band (1530–1565 nm), L-band (1565–1625 nm), and extended U-band (1625–1675 nm), with configurable models covering 1480–1680 nm. It operates on the principle of thermally and piezoelectrically controlled external cavity diode laser (ECDL) architecture, integrating a proprietary high-linearity mechanical actuator, a low-loss ultra-stable optical resonator, and a real-time picometer-scale wavelength lock module. This design ensures mode-hop-free tuning over the entire spectral range—critical for interferometric measurements, dense wavelength division multiplexing (DWDM) component testing, and silicon photonics wafer-level validation. Unlike grating-based or MEMS-tuned alternatives, the 6317A achieves sub-picometer resolution without interpolation, enabling direct traceability to NIST-traceable wavelength references under laboratory-grade environmental control (23 °C ±1 °C).

Key Features

• Mode-hop-free continuous wavelength scanning across up to 200 nm with linearity deviation <0.05% of full scale—validated per IEC 61280-2-9 for tunable laser source performance.
• Real-time wavelength locking with 0.1 pm setting resolution and ±20 pm absolute accuracy (typ. ±3 pm), compliant with ITU-T G.694.1 channel grid requirements for DWDM systems.
• High-speed spectral sweep capability: 1–200 nm/s sweep rate, synchronized via TTL/RS-232/Ethernet triggers for lock-in detection and swept-wavelength interferometry (SWI).
• Output power stability of ±0.01 dB over 10 minutes enables long-duration insertion loss and polarization-dependent loss (PDL) measurements without recalibration.
• Optical performance certified: linewidth ≤200 kHz (FWHM), SMSR ≥45 dB, and ASE noise floor ≥50 dB/nm—meeting Telcordia GR-468-CORE specifications for transmitter modules.
• Modular chassis architecture supports field-upgradable options including extended bandwidth modules (6317A-H01/H03/H04), integrated variable optical attenuators (VOA), and polarization controllers—enabling turnkey test system integration.

Sample Compatibility & Compliance

The 6317A is optimized for passive and active photonic device characterization under industry-standard test conditions. Its FC/APC output interface ensures low back-reflection coupling into single-mode fiber (SMF-28), minimizing measurement artifacts in reflection-sensitive applications such as optical time-domain reflectometry (OTDR) calibration or Fabry–Pérot cavity analysis. The instrument meets electromagnetic compatibility (EMC) requirements per EN 61326-1:2013 and safety standards per IEC 61010-1:2010. For regulated environments—including ISO/IEC 17025-accredited labs and GMP-compliant photonics manufacturing—the system supports audit-ready operation logs and optional 21 CFR Part 11-compliant software extensions for electronic signature and data integrity assurance.

Software & Data Management

Bundled Auniontech LaserControl™ GUI provides native support for SCPI command sets (IEEE 488.2), LabVIEW VIs, Python (PyVISA), and MATLAB drivers—enabling seamless integration into automated test executive platforms (e.g., NI TestStand, Keysight PathWave). All wavelength and power metadata are timestamped and stored in HDF5 format, preserving hierarchical traceability from raw scan data to final report generation. Built-in trigger synchronization allows co-acquisition with optical spectrum analyzers (OSAs), vector network analyzers (VNAs), and high-speed photodetectors—supporting full S-parameter extraction for photonic integrated circuits (PICs) per IEEE P370 guidelines.

Applications

• Photonic Integrated Circuit (PIC) Testing: On-wafer characterization of microring resonators, Mach–Zehnder interferometers (MZIs), and grating couplers using swept-wavelength transmission spectroscopy.
• DWDM Component Validation: Channel isolation, passband flatness, and group delay measurement of arrayed waveguide gratings (AWGs), thin-film filters (TFFs), and wavelength-selective switches (WSS).
• Fiber Optic Sensing: Interrogation of fiber Bragg gratings (FBGs) and distributed acoustic sensing (DAS) systems requiring sub-pm wavelength agility and thermal drift compensation.
• Optical Amplifier Characterization: Gain spectrum mapping and noise figure evaluation of EDFA, Raman, and semiconductor optical amplifiers (SOAs) across full C+L band.
• Calibration Reference Source: Primary wavelength reference for OSA calibration, optical power meter linearity verification, and photodetector responsivity mapping per NIST SP 250-97 protocols.

FAQ

What wavelength accuracy specifications apply under non-laboratory conditions?
Absolute wavelength accuracy degrades to ±50 pm outside controlled environments (23 °C ±1 °C); active temperature stabilization of the laser head is recommended for metrology-grade use.
Can the 6317A be used for coherent communication system testing?
Yes—its narrow linewidth (<200 kHz) and phase noise profile support local oscillator (LO) emulation in coherent receiver characterization, though external IQ modulator synchronization requires optional RF trigger modules.
Is firmware update support available after purchase?
Yes—Auniontech provides quarterly firmware releases via secure HTTPS portal, including enhancements to sweep linearity correction algorithms and compliance with updated ITU-T G.698.2 annexes.
Does the system include factory calibration documentation?
Each unit ships with a NIST-traceable calibration certificate covering wavelength, power, and sweep linearity—valid for 12 months from date of shipment.
How is thermal drift compensated during long-duration scans?
The internal wavelength lock module performs closed-loop feedback at 10 Hz using a stabilized reference etalon; residual drift is logged and compensatable in post-processing via included Python SDK.