GuanCe Instruments GDW-250B High-Temperature Dielectric Constant Tester
| Brand | GuanCe Instruments |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | GDW-250B |
| Price | USD 410 (converted from ¥2888 at 1 USD = ¥7.03) |
Overview
The GuanCe Instruments GDW-250B High-Temperature Dielectric Constant Tester is a modular, temperature-controlled measurement system engineered for precise characterization of dielectric properties—specifically relative permittivity (εr) and dissipation factor (tan δ)—of solid insulating and conductive materials across a controlled thermal range. Unlike conventional room-temperature meters, the GDW-250B integrates a programmable environmental chamber (−40 °C to +250 °C) with standardized electrode configurations and high-impedance AC/DC measurement interfaces. It operates on the principle of impedance spectroscopy using guarded three-terminal or parallel-plate capacitor geometry, enabling compliant evaluation of bulk dielectric response under thermally stabilized conditions. The system is designed to support ASTM D150, IEC 60250, and GB/T 1409 standards for dielectric constant and loss tangent measurements, making it suitable for R&D laboratories, quality control departments, and material certification facilities requiring traceable, temperature-dependent permittivity data.
Key Features
- Programmable temperature chamber with ±0.5 °C thermal stability and user-defined ramp rates (0.1–5 °C/min), supporting continuous operation up to 250 °C
- Modular electrode interface accommodating standard ASTM-compliant test fixtures—including guarded electrodes for surface leakage suppression and coaxial parallel-plate assemblies for low-loss materials
- Integrated high-voltage AC/DC source (up to 1000 V DC / 300 V AC RMS) with selectable test voltage levels and frequency sweep capability (100 Hz–1 MHz)
- Real-time dual-axis plotting: resistivity vs. temperature and dielectric constant vs. temperature, synchronized with thermal profiling
- Rugged sheet-metal enclosure with electrostatic powder coating (600 × 400 × 400 mm W×D×H), optimized for vibration-dampened laboratory environments
- Compliance-ready architecture supporting audit trails, user access levels, and electronic signature functionality aligned with GLP and FDA 21 CFR Part 11 requirements (when used with validated software configuration)
Sample Compatibility & Compliance
The GDW-250B accommodates flat, rigid specimens (e.g., ceramics, polymer films, composites, sintered oxides, and metallized substrates) with thicknesses between 0.1 mm and 25 mm and lateral dimensions up to 80 mm × 80 mm. Electrode contact is achieved via spring-loaded brass or gold-plated electrodes with adjustable pressure calibration. The system supports both volumetric resistivity (ρ) and surface resistivity (ρs) calculations per ASTM D257, as well as complex permittivity extraction in accordance with IEC 60250 Annex B. All thermal and electrical calibrations are traceable to national metrology institutes (NIM, China) and include documented uncertainty budgets. Environmental compliance includes CE marking for EMC Directive 2014/30/EU and Low Voltage Directive 2014/35/EU.
Software & Data Management
The proprietary GDW Control Suite (v3.2+) provides full instrument orchestration via USB 2.0 or Ethernet. Software functions include: automated thermal ramping with hold-step sequencing; dynamic electrode parameter definition (diameter, gap, guard width); real-time LCR-derived εr and tan δ computation; multi-curve overlay for comparative analysis; CSV/XLSX export with metadata stamping (operator ID, timestamp, calibration ID, ambient RH/Temp); and PDF report generation with embedded plots, raw datasets, and pass/fail flags against user-defined specification limits. Audit logs record all parameter changes, measurement triggers, and export actions—enabling full data integrity for ISO/IEC 17025-accredited testing labs.
Applications
- Thermal stability assessment of high-k dielectrics for semiconductor packaging and MEMS encapsulation
- Quality screening of aerospace-grade polyimide films and ceramic matrix composites under thermal cycling
- Development of battery separator materials (e.g., PVDF-HFP, ceramic-coated PE) across operating temperature bands
- Validation of insulation integrity in high-voltage transformer bushings and cable terminations
- Correlation of microstructural evolution (e.g., phase transitions, moisture ingress) with dielectric dispersion behavior
- Support for DOE-driven material qualification per automotive AEC-Q200 or MIL-STD-202 test protocols
FAQ
What temperature range does the GDW-250B support, and how is thermal uniformity ensured?
The chamber operates from −40 °C to +250 °C with axial uniformity better than ±1.5 °C across a 50 mm diameter test zone, verified per IEC 60068-3-5 using calibrated PT100 sensors.
Can the system measure both DC resistivity and AC dielectric properties in a single run?
Yes—software-synchronized switching between DC voltage application (for volume/surface resistivity) and AC impedance spectroscopy (for εr/tan δ) is supported without manual reconfiguration.
Is third-party calibration documentation included with shipment?
Each unit ships with a factory calibration certificate covering temperature sensor accuracy, voltage source linearity, and impedance reference verification, traceable to NIM Standard No. JJG 508-2018.
What are the minimum infrastructure requirements for installation?
A stable floor with <0.5 g vibration amplitude, ambient RH <50 %, temperature 22–27 °C, single-phase 220 V ±5 %, 50 Hz power supply, and clean compressed air (0.5 MPa) for optional purge mode.
Does the software support integration with LIMS or MES platforms?
Yes—the GDW Control Suite offers OPC UA and RESTful API interfaces for bidirectional data exchange with laboratory information management systems (LIMS) and manufacturing execution systems (MES), including sample ID mapping and result auto-posting.
