KLA T150 UTM Micro-Nano Tensile Tester

Overview

The KLA T150 UTM Micro-Nano Tensile Tester is a high-precision, electromagnetic actuation–based mechanical testing system engineered for quasi-static and dynamic tensile/compressive characterization of micro- and nanoscale specimens. Operating on the principle of controlled Lorentz-force actuation, the T150 applies calibrated axial loads—down to sub-micronewton resolution—while simultaneously measuring displacement with capacitive sensing at sub-nanometer resolution. This dual-resolution architecture enables accurate stress–strain quantification across exceptionally wide strain ranges (up to 100% engineering strain), making it uniquely suited for materials exhibiting time-dependent mechanical behavior, such as viscoelastic polymers, biological fibers, and MEMS-compatible thin films. Unlike conventional macro-scale universal testing machines, the T150 eliminates parasitic bending and inertial artifacts through its monolithic, single-degree-of-freedom actuator design—achieved via a dual-spring constrained electromagnetic transducer. Its fundamental architecture adheres to the one-dimensional harmonic oscillator model, ensuring linear force–displacement coupling and minimizing phase lag in dynamic measurements.

Key Features

• Electromagnetic actuation system delivering force resolution < 100 nN and displacement resolution < 0.5 nm over full stroke range
• Capacitive displacement sensing with real-time feedback, independent from load application path—eliminating cross-talk error
• Continuous Dynamic Analysis (CDA) module enabling concurrent measurement of storage modulus (E′), loss modulus (E″), and loss tangent (tan δ) during ramped or stepped strain protocols
• Modular, field-upgradeable platform supporting interchangeable fixtures, environmental enclosures, and optical integration options
• Integrated XP actuator option featuring enhanced lateral stiffness (>10⁶ N/m) and optimized thermal drift compensation for extended-duration tests
• NanoSuite Professional software suite with pre-validated ASTM-compliant test methods (e.g., ASTM D3822 for single-fiber tensile testing)

Sample Compatibility & Compliance

The T150 accommodates specimens ranging from individual electrospun polymer nanofibers (diameter: 100 nm–5 µm) to MEMS-scale polymer films (thickness: 50 nm–50 µm), soft tissue scaffolds, spider silk filaments, and ultrafine metallic or ceramic microfibers. Sample mounting utilizes precision-aligned micro-gripping stages with adjustable clamping pressure and integrated alignment guides. All hardware and software workflows comply with GLP/GMP-relevant data integrity requirements: NanoSuite Professional supports audit-trail logging, electronic signatures, and 21 CFR Part 11–ready configuration. Test methodologies align with ASTM D3822 (tensile properties of single textile fibers), ASTM F2622 (mechanical testing of biomaterials), and ISO 178 (rigidity of plastics), with traceable calibration certificates available per NIST-traceable standards.

Software & Data Management

NanoSuite Professional provides a validated, scriptable environment for method development, execution, and post-processing. It supports both preconfigured test templates—including creep, stress relaxation, cyclic loading, and frequency-swept dynamic testing—and user-defined Python-based scripting via NanoSuite Explorer. All raw sensor data (load, displacement, phase, amplitude) are recorded at ≥10 kHz sampling rate with timestamp synchronization. Data export conforms to HDF5 and ASCII formats for third-party analysis (e.g., MATLAB, Python SciPy). The software includes built-in modules for modulus derivation, hysteresis loop analysis, strain-rate dependency modeling, and Weibull statistical failure analysis. Offline simulation mode allows method validation and parameter optimization without hardware connection.

Applications

• Single-fiber tensile testing of electrospun nanofibers, carbon nanotube yarns, and natural biopolymers (e.g., collagen, fibrin, spider silk)
• Mechanical phenotyping of hydrogel-based tissue scaffolds under physiological strain rates and hydration conditions
• Fracture energy quantification of ultrathin polymer packaging films and dielectric layers in flexible electronics
• Viscoelastic mapping of thermoplastic elastomers and shape-memory polymers across temperature and frequency domains
• In situ correlation of mechanical response with real-time optical imaging (via optional dynamic observation module with high-magnification stereo microscopy)
• Conversion to nanoindentation mode using optional indentation kit—enabling complementary hardness and modulus mapping on same platform

FAQ

What is the minimum measurable fiber diameter supported by the T150?
The system routinely characterizes fibers down to 100 nm in diameter, provided proper gripping and alignment protocols are followed.
Can the T150 perform compression testing on micro-pillars or thin films?
Yes—using flat-ended or spherical compression platens; the XP actuator option is recommended for optimal stability in compression mode.
Is the CDA function compatible with environmental chambers (e.g., humidity or temperature control)?
Yes—CDA operates synchronously with external environmental controllers when integrated via NanoSuite’s analog I/O interface.
Does the system support automated batch testing of multiple fibers?
Fully supported via NanoSuite’s sequence programming engine, including auto-focus, auto-alignment, and pass/fail logic based on real-time modulus thresholds.
How is calibration traceability maintained across instrument lifetime?
KLA provides annual NIST-traceable calibration services; all load and displacement calibrations are stored within NanoSuite’s metadata framework with version-controlled audit logs.