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| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | P-17 |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Scan Range | Up to 200 mm (no image stitching required) |
| Step Height Range | 1 nm to 1000 µm |
| Stylus Force Control | 0.03–50 mg |
| Camera Resolution | 5 MP color, optical zoom |
| Compliance | SEMI E4, E5, E30, E37 |
| Software Platform | Apex Analysis Software (ISO/ASME-compliant), Offline Analysis Module, SECS/GEM & HSMS support |
| Brand | Keysight |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model Variants | LFH (Axial Fatigue), BFH (Portable Servo Actuator SERVO PAQ II), RFH (Torsional Fatigue), DFH (Static Torsion), FFH (Rotating Bending Fatigue) |
| Test Force Capacity | Configurable up to 250 kN (standard variants) |
| Frequency Range | 0.001–100 Hz (electromechanical) |
| Host Weight | 180–3,200 kg (model-dependent) |
| Actuation Type | Electro-hydraulic servo (LFH/RFH), electromechanical servo (BFH/DFH/FFH) |
| Waveform Capability | Sinusoidal, triangular, trapezoidal, rectangular, user-defined arbitrary waveforms |
| Control Mode | Closed-loop force, displacement, strain, or torque control |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | Zeta-20 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | Multi-Mode Optical Interferometry (ZDot™, White-Light Interferometry, Nomarski DIC, Shear Interference), Spectral Reflectometry |
| Key Capabilities | 3D Topography, True-Color Imaging, Step Height (0.008 nm – 10 mm), Surface Roughness (Ra down to sub-Å), Film Thickness (30 nm – 100 µm), Automatic Defect Detection (>1 µm), Wafer-Scale Warpage & Stress Analysis |
| Brand | Keysight |
|---|---|
| Origin | USA |
| Model Series | G200, T150, iNano, InSitu |
| Instrument Type | Nanoindentation and Scratch Tester |
| Maximum Load Capacity | 10 N |
| Load Resolution | <1 nN |
| Displacement Resolution | <0.02 nm |
| Indenter Types | Berkovich, Cube-Corner, Vickers, Spherical (radius down to 1 µm) |
| Standard Test Load | 500 mN |
| Core Technology | Continuous Stiffness Measurement (CSM), In-Situ Nanomechanical Testing, High-Resolution Scanning Probe Imaging |
| Compliance | ASTM E2546, ISO 14577, GB/T 22458 (Chinese National Standard incorporating K-T CSM patent) |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | HRP®-260 |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Horizontal Scan Range (Long-Range Stage) | 200 mm (no stitching required) |
| High-Resolution Stage Travel | 90 µm × 90 µm |
| Vertical Resolution | 1 nm |
| Stylus Normal Force Range | 0.03–50 mg |
| Step Height Measurement Range | <1 nm to 327 µm |
| Stylus Tip Radius Options | 20 nm – 50 µm |
| Stylus Included | DuraSharp® diamond stylus (40 nm radius) |
| Wafer Handling | Automatic robotic loading for 75–200 mm opaque (e.g., Si, GaAs) and transparent (e.g., sapphire) substrates |
| Compliance | SEMI E4, E5, E30, E37 |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | G200X |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Maximum Load Capacity | 10 N |
| Load Resolution | <1 nN |
| Displacement Range | ±50 µm |
| Displacement Resolution | <0.01 nm |
| Indenter Types | Over 30 interchangeable tip geometries (Berkovich, cube-corner, spherical, flat-punch, etc.) |
| Brand | Keysight Technologies |
|---|---|
| Origin | USA |
| Model Series | G200, T150, iNano, inSitu |
| Application Domain | In-situ nanomechanical characterization with CSM, high-resolution imaging integration, and multi-modal correlative testing |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | P-170 |
| Product Category | Contact Stylus Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-based Contact Profilometry |
| Brand | Keysight |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | G200 |
| Price Range | USD 270,000 – 405,000 (based on configuration) |
| Instrument Type | Integrated Nanoindentation & Scratch Tester |
| Indenter Types | Over 30 standardized and custom tip geometries (Berkovich, cube-corner, spherical, conical, wedge, etc.) |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | UTM T150 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Application Category | Surface & Interface Property Testing |
| Compliance | ASTM-compliant |
| Brand | Keysight Technologies |
|---|---|
| Origin | USA |
| Model Series | G200, iMicro, iNano, InSEM |
| Application Domain | In-situ Mechanical Characterization, Dynamic & Static Nanoindentation, Multi-modal Correlative Analysis |
| Brand | Keysight |
|---|---|
| Origin | USA |
| Model | G200 / InSEM / iMicro / iNano |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Indenter Types | Dozens of interchangeable tips (Berkovich, Cube-corner, Spherical, Conical, etc.) |
| Compliance | ASTM E2546, ISO 14577, USP <1062>, GB/T 22458–2008, GB/T 25898–2010 |
| Measurement Principle | Continuous Stiffness Measurement (CSM), Dynamic Contact Depth Control, Load-Displacement Feedback Loop |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | R50-4PP / R50-EC |
| Type | Imported Instrument |
| Distribution Channel | Authorized Distributor |
| Pricing | Available Upon Request |
| Brand | Keysight |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | D.T |
| Measurement Range | 5 nm – 1200 µm |
| Accuracy | ±1% |
| Probe Tip Radius | 2 µm |
| Normal Force | 1–15 mg |
| Scan Length | 55 µm |
| Step Height Repeatability | <4 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 200 mm |
| Brand | Keysight |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | UTM 150 |
| Maximum Test Force | ±500 mN |
| Force Resolution | 50 nN |
| Actuator Displacement Range | ±1 mm |
| Displacement Resolution | 0.1 nm |
| Dynamic Displacement Resolution | < 0.001 nm |
| Crosshead Travel | 150 mm |
| Tensile Resolution | 35 nm |
| Tensile Rate | 0.5 µm/s to 5 mm/s |
| Dynamic Frequency Range | 0.1 Hz to 2.5 kHz |
| Loading Modes | Constant Load Rate, Constant Displacement Rate, Constant Strain Rate, Step Loading |
| Compliance | ASTM E8/E21, ISO 6892-1, USP <1042>, GLP/GMP-ready data audit trail |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | Zeta-300 |
| Product Type | Non-contact profilometer / surface roughness analyzer |
| Measurement Principle | Multi-mode optical interferometry (ZDot™, white-light interferometry, Nomarski differential interference contrast, shear interferometry) |
| Optical Capabilities | Simultaneous high-resolution 3D topography and true-color surface imaging |
| Vertical Resolution | Sub-nanometer (ZIC/ZSI), <0.1 nm (PSI), ≤1 nm (VSI) |
| Step Height Range | 0.8 nm to 1 mm |
| Surface Roughness Range | <0.05 nm RMS to >100 µm Sa |
| Film Thickness Range (ZFT) | 30 nm – 100 µm (transparent films) |
| Defect Detection Limit | ≥1 µm lateral resolution |
| Maximum Sample Size | Up to 280 mm Z-height |
| Compliance | ISO 25178, ISO 4287/4288, ASME B46.1, NIST-traceable calibration standards |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Model Range | D-500, D-600, P-7, P-17 |
| Compliance | Designed for ISO 25178, ISO 4287, ASTM E1093, USP <1056>, and GLP/GMP-aligned workflows |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | F20 |
| Wavelength Range | 380–1050 nm |
| Thickness Measurement Range | 1 nm – 10 mm |
| Measurement Accuracy | ±0.02 nm |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | D-500 |
| Measurement Principle | Contact Stylus Profilometry |
| Vertical Measurement Range | 0.002 µm to 1200 µm |
| Vertical Resolution | Sub-nanometer (typical) |
| Probe Tip Radius | 0.7 µm (standard), optional tips available |
| Normal Force Range | 0.03–15 mg |
| Scan Length | 55 mm |
| Horizontal Sample Stage | 140 mm manual X-Y stage |
| Max Sample Size | 100 mm × 100 mm |
| Step Height Repeatability | < 0.1% of measured height (RMS) |
| Surface Roughness Parameters | Ra, Rq, Rz, Rt, Rsk, Rku, with ISO 4287/4288 and ASME B46.1 compliant filtering |
| Optical System | Integrated 5 MP color camera with trapezoidal distortion correction and arc error compensation |
| Software | Alpha-Step Analysis Suite with GLP-compliant audit trail, report generation, and 21 CFR Part 11 ready configuration options |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | NanoFlip |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Environmental Operation | Vacuum and Controlled Atmosphere (including Glovebox-Compatible) |
| Actuator | InForce 50 Electromagnetic Force Actuator with Capacitive Displacement Sensing |
| Controller | InQuest High-Speed Digital Controller (100 kHz Data Acquisition, 20 µs Time Constant) |
| Motion System | Motorized XYZ Stage (X/Y: 21 mm Travel, Z: 25 mm Travel) |
| Sample Orientation | Flip Mechanism for SEM/FIB Imaging Alignment |
| FIB-to-Test Capability | 90° Sample Tilt for Seamless Transition from FIB Milling to Nanomechanical Testing |
| Software | InView™ v6.x (Windows® 10 Compatible), Includes ISO 14577 Compliance Module, User Method Development Toolkit, Real-Time SEM Video Synchronization, Integrated Tip Calibration Suite |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | P-7 |
| Measurement Principle | Contact Stylus Profilometry |
| Vertical Measurement Range | 1 nm to 1000 µm |
| Vertical Resolution | Sub-nanometer (typical) |
| Lateral Resolution | Determined by stylus tip radius (0.1–50 µm selectable) |
| Stylus Tip Radius | 0.7 µm (standard), down to 100 nm optional |
| Normal Force Range | 0.03–50 mg (force-controlled feedback) |
| Scan Length | Up to 150 mm (single-pass, no stitching required) |
| Wafer/Specimen Max Size | 150 mm diameter |
| Step Height Repeatability | < 0.2% of measured height (1σ) |
| Surface Flatness Calibration | Arc correction algorithm integrated |
| Imaging System | 5 MP color CCD with motorized zoom and focus |
| Software Platform | Apex™ v6.x with ISO/ASME-compliant analysis modules |
| Compliance | SEMI E4, E5, E30, E37 |
| Brand | Keysight (Distributed by Sakaguchi) |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | DiM |
| Instrument Type | Advanced Driving Simulator (Fatigue & Dynamic Response Testing Platform) |
| Frequency Range | 0.1–30 Hz |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | Profilm3D |
| Product Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry |
| Measurement Modes | Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI) |
| Z-Stage Travel | 100 mm |
| Objective Turret | 5×–100× (Michelson 5×, Mirau 10×/20×/50×/100×) |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | K-T G200 / I-Nano / Insitu |
| Application | In-situ nanomechanical characterization with optical, electrical, and structural correlation |
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