Labthink CHY-C2A Mechanical Contact Thickness Gauge for Thin Polymer Films and Foils
| Brand | Labthink |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | CHY-C2A |
| Pricing | Upon Request |
| Measurement Principle | Mechanical Contact Displacement Sensing |
| Load Range | 0–2 mm (standard), optional 0–6 mm or 0–12 mm |
| Resolution | 0.1 µm |
| Measurement Speed | Adjustable up to 10 tests/min |
| Contact Area | 50 mm² (for films), 200 mm² (for paper/boards) |
| Measuring Pressure | 17.5 ± 1 kPa (film mode), 50 ± 1 kPa (paper mode) |
| Compliance Standards | ISO 4593, ISO 534, ISO 3034, GB/T 6672, GB/T 451.3, GB/T 6547, ASTM D374, ASTM D1777, TAPPI T411, JIS K6250, JIS K6783, JIS Z1702, BS 3983, BS 4817 |
| Interface | RS232 |
| Data System Compatibility | Lystem™ Laboratory Data Sharing Platform |
| Power Supply | 220 VAC 50 Hz / 120 VAC 60 Hz |
| Dimensions (L×W×H) | 461 × 334 × 357 mm |
| Net Weight | 32 kg |
Overview
The Labthink CHY-C2A Mechanical Contact Thickness Gauge is a precision metrology instrument engineered for high-resolution thickness measurement of thin, flexible planar materials—including polyimide (PI) films, polymer foils, plastic sheets, metallic foils, paper, board, silicon wafers, and separator membranes. Designed in strict adherence to international mechanical contact thickness standards, the CHY-C2A employs a calibrated displacement transducer coupled with a pneumatically stabilized loading system to deliver traceable, repeatable measurements under controlled contact force and defined foot geometry. Its core operating principle relies on direct mechanical indentation—where a precision-ground measuring anvil applies standardized pressure to compress the specimen against a fixed reference surface, and the resulting displacement is captured via a high-stability linear variable differential transformer (LVDT) sensor. This method ensures compliance with gravimetric and geometric constraints specified in ISO 4593 (plastics film and sheet), ISO 534 (paper and board), and ASTM D374 (electrical insulating materials), making it suitable for quality control laboratories operating under GLP, ISO/IEC 17025, or regulated manufacturing environments requiring documented measurement uncertainty.
Key Features
- Sub-micron resolution of 0.1 µm enables detection of thickness variations critical for high-value functional films such as polyimide used in flexible printed circuits and aerospace insulation layers.
- Configurable contact area (50 mm² for films; 200 mm² for paper/board) and dual-pressure calibration (17.5 ± 1 kPa for films; 50 ± 1 kPa for rigid substrates) ensure material-specific compliance with ISO and ASTM test protocols.
- Motorized auto-lift measuring head eliminates operator-induced variability during sample placement and retraction, reducing measurement drift and improving inter-operator reproducibility.
- Integrated microprocessor control with backlit LCD interface and tactile PVC membrane keypad supports intuitive operation without external computing hardware.
- Real-time statistical output—including mean, min, max, standard deviation, and coefficient of variation—is calculated and displayed per test sequence, supporting immediate pass/fail evaluation against internal specifications.
- Factory-calibrated using NIST-traceable stainless-steel reference blocks; user-accessible recalibration routine maintains long-term accuracy across extended service intervals.
- RS232 serial port enables bidirectional communication with host PCs for automated data logging, report generation, and integration into centralized LIMS or MES platforms.
Sample Compatibility & Compliance
The CHY-C2A accommodates specimens up to 400 mm in width and 2 mm in nominal thickness (extendable to 6 mm or 12 mm with optional load modules). It is validated for use with low-modulus, high-elasticity materials—including PI, PET, PEN, PTFE, and cellulose acetate films—as well as brittle substrates such as silicon wafers and ceramic separators. All mechanical parameters—including foot geometry, dwell time, and pressure ramp profile—are programmable to align with application-specific requirements outlined in USP , FDA 21 CFR Part 11 (when paired with Lystem™ software), and ISO 17025-accredited testing procedures. The instrument’s design conforms to the mechanical interface definitions in ISO 3034 (rubber and plastics), JIS K6783 (synthetic resin films), and TAPPI T411 (paper thickness), ensuring cross-laboratory comparability and audit readiness.
Software & Data Management
When connected to the optional Lystem™ Laboratory Data Sharing System, the CHY-C2A supports full electronic record retention—including timestamped raw data, operator ID, environmental metadata (temperature/humidity if linked to optional sensors), and digital signature workflows compliant with FDA 21 CFR Part 11 Annex 11 requirements. Lystem™ provides configurable test templates, automated report generation (PDF/Excel), trend analysis dashboards, and role-based access control. All measurement sessions are archived with immutable audit trails, including parameter changes, calibration events, and user logins—enabling full traceability from raw reading to final certificate of conformance.
Applications
- Quality assurance of polyimide films used in flexible electronics, where thickness uniformity directly impacts dielectric strength and thermal cycling reliability.
- In-process monitoring of extruded plastic sheet production lines to maintain gauge band consistency within ±0.5 µm tolerance windows.
- Incoming inspection of battery separator membranes, where thickness deviation correlates strongly with ionic resistance and dendrite penetration risk.
- R&D validation of coated substrates—including ALD-deposited barrier layers—where total stack thickness must be resolved independently of coating contribution.
- Regulatory submission support for medical device packaging (e.g., Tyvek® laminates) requiring thickness verification per ISO 11607-1 Annex B.
FAQ
What standards does the CHY-C2A comply with?
It meets ISO 4593, ISO 534, ASTM D374, ASTM D1777, GB/T 6672, JIS K6250, and nine additional national and industry-specific thickness standards.
Can the instrument measure non-flat or textured surfaces?
No—it requires macroscopically flat, dimensionally stable specimens; curvature or surface topography exceeding ±2 µm over the 50 mm² contact zone will compromise accuracy.
Is calibration traceable to national metrology institutes?
Yes—each unit ships with a certificate of calibration referencing NIST-traceable gauge blocks, and annual recalibration services include uncertainty budgets per ISO/IEC 17025.
Does the system support GMP/GLP documentation requirements?
When deployed with Lystem™ software, it provides full 21 CFR Part 11 compliance—including electronic signatures, audit trails, and secure data archiving.
What maintenance is required to sustain measurement accuracy?
Annual verification using certified reference blocks and cleaning of the anvil/reference surface with lint-free isopropyl alcohol; no consumables or periodic sensor replacement is required.



