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| Brand | ACCRETECH |
|---|---|
| Origin | Japan |
| Model | DM45514 |
| Type | Contact Stylus Surface Profilometer |
| Compliance | ISO 4287, ISO 4288, ISO 25178-2, JIS B 0601, ASME B46.1 |
| Probe Type | Diamond-tipped stylus (2 µm radius standard) |
| Vertical Resolution | Sub-nanometer (typical < 0.1 nm) |
| Scan Length | Up to 100 mm (configurable) |
| Measurement Speed | 0.01–5 mm/s (adjustable) |
| Brand | ACCRETECH |
|---|---|
| Origin | Japan |
| Model | DM43801 |
| Type | Imported CMM Probe Styli |
| Distributor Status | Authorized General Distributor |
| Pricing | Available Upon Request |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 31C |
| Rotary Axis (θ) | 6 rpm |
| Z-Axis Travel | 200 mm |
| R-Axis Radial Travel | 125 mm |
| Maximum Workpiece Diameter | Ø250 mm |
| Maximum Height (External) | 520 mm |
| Maximum Height (Internal) | 300 mm |
| Spindle Accuracy (ISO 4291 / JIS B7451) | (0.04 + 6H/10000) µm |
| Straightness (Z-axis) | 0.50 mm / 100 mm |
| Sensor Linear Range | ±400 µm |
| Stylus Tip | Ø1.6 mm sintered carbide sphere |
| Measuring Force | 70 mN |
| Filter Options | Digital 2RC & Gaussian filters |
| Rotational cutoffs | 15–500 undulations/rev |
| Axial cutoffs | 0.025–8 mm |
| Data Analysis | MZC, LSC, MIC, MCC, N.C. evaluation methods |
| Software Platform | ACCTee integrated measurement suite |
| Power Supply | AC 100 V, 50/60 Hz |
| Air Supply | 0.35–0.7 MPa, 30 L/min (NTP) |
| Dimensions (W×D×H) | 1800 × 1000 × 1700 mm |
| Mass | 120 kg |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM 1800G |
| Z-axis Range | 800 mm (Profile) / 50 mm (Roughness) |
| X-axis Range | 100 mm (standard), up to 200 mm (optional -22 system) |
| Z-axis Indication Accuracy | ±0.25% FS (±4 µm within 5 mm range) |
| Z-axis Resolution | 0.1 µm (±2.5 mm), 0.4 µm (10 mm), 1 µm (±25 mm) |
| X-axis Indication Accuracy | ±(1 + 2L/100) µm (L in mm) |
| Straightness Accuracy | (0.05 + 1.5L/1000) mm |
| Measurement Principle | Differential Voltage (Z), Moiré Interferometric Scale (X) |
| Stylus Force | 0.75 mN (roughness), ≤30 mN (profile) |
| Stylus Radius | 2 µm (roughness), 25 µm (profile) |
| Stylus Material | Diamond (roughness), Tungsten Carbide (profile) |
| Vertical Feed Direction | Upward/Downward |
| Horizontal Feed Direction | Pull/Push |
| Filtering Standards | JIS B 0601:2001, ISO 4287, ISO 13565, ASME B46.1, DIN 4768, CNOMO |
| Roughness Parameters | Ra, Rq, Rz, Rmax, Rt, Rv, Rp, Rc, R3z, Sm, S, RDa, RDq, Rla, Rlq, Til, TA, lr, Pc, Rmr, tp2, Rmr2, Rdc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR |
| Profile Evaluation | Coordinate transformation, symmetry analysis, intersection detection (line-line, line-circle, circle-circle, etc.), GD&T deviation mapping with on-graph dimensioning, shape synthesis, CNC measurement replay, AI-assisted feature recognition |
| Software Compliance | Supports audit trail, user access control, and data integrity per FDA 21 CFR Part 11 requirements for regulated environments |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | DM43827 |
| Type | Contact Stylus-Based Surface Profilometer |
| Compliance | ISO 4287, ISO 4288, ISO 25178-2 (areal parameters), JIS B 0601, ASTM E1092 |
| Measurement Principle | Inductive Linear Variable Differential Transformer (LVDT) with Diamond Stylus Scanning |
| Stylus Tip Radius | 2 µm (standard), optional 5 µm or 12.5 µm |
| Vertical Resolution | ≤ 0.1 nm (sub-nanometer analog signal processing) |
| Scan Length | Up to 100 mm (motorized precision stage) |
| Lateral Sampling Interval | Adjustable from 0.01 µm to 10 µm |
| Vertical Range | ±1 mm |
| Speed Control | 0.01–1.0 mm/s (programmable scan velocity) |
| Data Points per Profile | Up to 1,000,000 points |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EM46000-S302 |
| Price Range | USD 140–7,200 |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | RONDCOM NEX |
| Measurement Capabilities | Roundness, Cylindricity, Straightness (axis & surface), Parallelism, Perpendicularity, Coaxiality, Concentricity, Taper, Diameter, Radial Runout, Total Radial Runout, Straightness of Cylindrical Generatrix, Face Straightness, Face Runout, Flatness, Wall Thickness Variation, Angular Deviation, Small-Arc Radius, Piston Profile Geometry |
| Compliance | ISO 1101, ISO 12181, ISO 12180, ASME Y14.5, JIS B 0621 |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 43C |
| Maximum Measuring Diameter | Ø250 mm |
| Z-Axis Vertical Travel | 300 mm |
| R-Axis Radial Travel | 125 mm |
| Maximum Workpiece Height (OD/ID) | 520 mm / 300 mm |
| Spindle Accuracy (ISO 4291/JIS B7451) | (0.02 + 6H/10000) µm |
| Minimum Zone Circularity Deviation | (0.01 + 3H/10000) µm |
| Z-Axis Straightness | 0.25 µm/100 mm |
| Sensor Linear Range | ±400 µm |
| Stylus Tip | Ø1.6 mm Sintered Carbide Sphere |
| Measurement Force | 70 mN |
| Rotation Speed (θ-axis) | 6 rpm |
| Z-Axis Feed Speed (Measuring) | 0.6–6 mm/s |
| Air Supply | 0.35–0.7 MPa, 30 L/min (NTP) |
| Power | AC 100 V, 50/60 Hz, 600 VA |
| Dimensions (W×D×H) | 1800 × 1000 × 1700 mm |
| Mass | 130 kg |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | SURFCOM NEX |
| Type | Contact Stylus Profilometer |
| Measurement Principle | Mechanical Stylus Tracing (ISO 3274, ISO 4287 compliant) |
| Vertical Resolution | Sub-nanometer (typical ≤0.1 nm) |
| Vertical Range | ±5 mm |
| Scan Length | Up to 100 mm (standard), extendable to 200 mm |
| Stylus Tip Radius | 2 µm (standard diamond tip, 90° included angle) |
| Force | Adjustable from 0.5 mN to 15 mN |
| Surface Roughness Parameters | Ra, Rz, Rq, Rp, Rv, Rt, Rsk, Rku, Rmr, etc. (per ISO 4287/ISO 25178-2) |
| Profile Analysis | Form error, waviness, slope, radius, step height, angle, bearing ratio (Abbott-Firestone curve) |
| Compliance | Fully supports ISO, JIS, ASME B46.1, and DIN standards |
| Software | SURFPAK-SV with GLP/GMP-compliant audit trail, user permission levels, and 21 CFR Part 11-ready electronic signatures |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 41C |
| Rotary Axis (θ-axis) Speed | 6 rpm |
| Z-axis Travel | 200 mm |
| R-axis Radial Travel | 125 mm |
| Maximum Workpiece Diameter | Ø250 mm |
| Maximum Height (External) | 520 mm |
| Maximum Height (Internal) | 300 mm |
| Spindle Accuracy (ISO 4291 / JIS B7451) | (0.04 + 6H/10000) µm |
| Straightness (Z-axis) | 0.50 mm / 100 mm, 15 mm / 300 mm |
| Sensor Linear Range | ±400 µm |
| Stylus Tip | Ø1.6 mm Tungsten Carbide Sphere |
| Measuring Force | 70 mN |
| Filter Options | Digital 2RC & Gaussian |
| Cutoff Frequencies | 15–500 cycles/rev (rotary), 0.025–8 mm (axial) |
| Data Analysis | MZC, LSC, MIC, MCC, N.C. methods |
| Software Platform | ACCTee Integrated Measurement Suite |
| Power Supply | AC 100 V, 50/60 Hz |
| Air Supply | 0.35–0.7 MPa, 30 L/min (NTP) |
| Dimensions (W×D×H) | 1800 × 1000 × 1700 mm |
| Mass | 120 kg |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | 248881006 |
| Type | Portable Contact-Type Profilometer |
| Measurement Principle | Stylus-Based Inductive Displacement Sensing |
| Standard Compliance | ISO 4287, ISO 4288, ISO 13565-1/2/3, ASME B46.1, JIS B 0601 |
| Probe Type | Diamond Tip (2 µm Radius, 90° Included Angle) |
| Vertical Resolution | ≤ 0.001 µm |
| Scan Length | Up to 16 mm (Standard), Expandable via Multi-Trace Mode |
| Cutoff Wavelengths | 0.08, 0.25, 0.8, 2.5, 8.0 mm (Selectable) |
| Evaluation Parameters | Ra, Rz, Rq, Rp, Rv, Rt, Rsk, Rku, Rsm, Rmr, Rdc, RΔq, Rk, Rpk, Rvk, Mr1, Mr2 |
| Data Storage | Internal Flash Memory (≥ 10,000 Profiles), USB Export |
| Display | High-Contrast Monochrome LCD with Backlight |
| Power | Rechargeable Li-ion Battery (≥ 10 h Continuous Operation) |
| Environmental Rating | IP54 (Dust and Splash Resistant) |
| Operating Temperature | 5–40 °C |
| Calibration | Traceable to NMIJ/JCSS Standards |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 60A |
| Maximum Measurable Diameter | Ø420 mm |
| Radial (R-axis) Travel | 220 mm |
| Vertical (Z-axis) Travel | 500 mm |
| Maximum Workpiece Height (for roundness/coaxiality) | 700 mm |
| Maximum Workpiece Diameter | Ø680 mm |
| Spindle Accuracy per JIS B7451 | (0.020 + 6H/10000) mm (H = height in mm from turntable surface) |
| Digital Filter Options | 2RC/Gaussian (Rotational: 15–500 cyc/rev |
| Linear | 0.025–8 mm) |
| Probe Force | 70 mN |
| Spherical Tip | Ø1.6 mm Tungsten Carbide |
| Measurement Modes | Rotational (θ), Linear (Z), Combined Cylindricity |
| Software | Real-time Shape Display, Re-analysis of up to 40 Cross-sections, GD&T Compliant Reporting (ISO 1101, ASME Y14.5) |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | DM45505 |
| Type | Contact Profilometer Stylus |
| Operating Principle | Mechanical Stylus Scanning |
| Compliance | Designed for ISO 4287, ISO 11562, and ASME B46.1 surface texture measurement standards |
| Stylus Tip Radius | 2 µm (nominal) |
| Shank Diameter | 3.2 mm |
| Total Length | 25 mm |
| Material | Single-crystal diamond |
| Mounting Interface | Standard M2.5 threaded shank |
| Compatibility | Interchangeable with Accretech SE300/SE350/SP150 series profilometers and compatible third-party CMM-based surface metrology systems |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 44DX |
| Bearing Type | Hydrostatic Air Bearing |
| Radial Spindle Accuracy | (0.02 + 4H/10000) µm |
| Mounting Configuration | Offset-Type Chuck |
| Control Mode | Manual (R44), CNC-Enabled (with TIMS Software) |
| Software Platform | TIMS v8.x (Standard & Optional Modules) |
| Footprint Reduction | 25% vs. Prior Generation |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | NEX Rs |
| Measurement Capabilities | Roundness, Cylindricity, Straightness (axis & surface), Parallelism, Perpendicularity, Coaxiality, Concentricity, Taper, Diameter, Radial Runout (single & total), Linearity of Cylindrical Generatrix, Surface Straightness (face), Face Runout, Flatness, Wall Thickness Variation, Angular Deviation, Small-Arc Radius, Piston Profile Analysis |
| Sensor Mount | Patented Offset-Type Holder (eliminates R-axis interference) |
| Software Platform | ACCTee Integrated Metrology Software (file-centric workflow, Windows-native GUI with icon-driven measurement, analysis, and reporting) |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 54 |
| Measurement Range | Max. Diameter Φ300 mm |
| Radial Travel (R-axis) | 170 mm |
| Vertical Travel (Z-axis) | 300 mm (500 mm with high column) |
| Max. Workpiece Diameter | Φ580 mm |
| Max. Height (OD) | 300 mm (500 mm with high column) |
| Spindle Accuracy (Rotational) | (0.02 + 4H/10000) µm per JIS B 7451-1997 (H = height from table to measurement point) |
| Axial Accuracy | (0.02 + 4H/10000) µm per JIS B 7451-1997 (H = distance from rotation center to probe point) |
| Z-axis Straightness | 0.12 µm/100 mm |
| R-axis Straightness | 0.8 µm/150 mm |
| Z-axis Parallelism | 0.8 µm/290 mm (1.18 µm/490 mm with high column) |
| R-axis Parallelism | 1.0 µm/150 mm |
| Radial Indication Accuracy | (2 + L/170) µm (L = measured length) |
| Rotation Speed (θ-axis) | 2–10 rpm (measurement) |
| Z-axis Traverse Speed | 0.5–6 mm/s (max 50 mm/s) |
| R-axis Traverse Speed | 0.5–6 mm/s (max 25 mm/s) |
| Auto-stop Positioning Accuracy | ±5 µm |
| Rotating Table Diameter | Φ220 mm |
| Centering/Tilt Adjustment Range | ±2 mm / ±1° |
| Max. Load Capacity | 30 kg |
| Stylus Force | 30–100 mN (adjustable) |
| Stylus Tip | Φ1.6 mm steel ball, 53 mm length |
| Data Points per Revolution | 14,400 |
| Digital Filter Types | Gaussian, 2RC, Multi-groove |
| Low-pass cutoffs | 15–1500 cycles/rev (rotational), 0.025–8 mm (axial) |
| Band-pass | 15–150, 15–500, 15–1500 cycles/rev (user-definable) |
| Measurement Range | ±1000 µm / ±200 µm |
| Evaluation Methods | MZC (Minimum Zone Circle), LSC (Least Squares Circle), MIC (Maximum Inscribed Circle), MCC (Minimum Circumscribed Circle), N.C. (No Correction), Multi (composite specification) |
| Measurable Parameters | Roundness, Flatness (single/multi-plane), Parallelism, Concentricity, Coaxiality, Cylindricity, Radial Runout, Perpendicularity, Thickness Variation, Total Runout, Radius Measurement, Partial Arc Analysis, Z-axis & R-axis Straightness, Axial Linearity, Cylindrical Surface Deviation |
| Analysis Functions | Auto-centering & auto-tilt correction, Groove profiling (vertical/angular/cursor-based), Combined roundness evaluation modes, Design nominal comparison, 3D cylindrical surface visualization (wireframe, shaded, contour), Real-time profile display, Profile-derived curves (bearing ratio curve, amplitude distribution, power spectral density), Wide-range assessment capability |
| Standard Features | Offset-type chuck holder included |
| Display | 17″ LCD showing measurement conditions, parameters, print settings, 2D/3D profiles, annotations, error logs |
| Output | Color or laser printer (SD card option for data export) |
| Power Supply | AC 220 V, 50–60 Hz ±10%, ~470 VA (excl. printer) |
| Pneumatic Supply | 0.35–0.7 MPa supply pressure |
| Dimensions (W×D×H)/Weight | DX type: 1500×925×1600 mm (1800 mm with column), 500 kg (510 kg) |
| SD type | 2050×900×1700 mm (1900 mm), 194 kg (204 kg) |
| Brand | ACCRETECH |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Authorized Distributor |
| Category | Imported Precision Geometric Measurement Instrument |
| Model | Rondcom 65B |
| Measurement Capabilities | Roundness, Cylindricity, Straightness (axial & radial), Parallelism, Perpendicularity, Coaxiality, Concentricity, Taper, Diameter, Radial Runout, Total Radial Runout, Generatrix Straightness of Cylinders, Face Straightness, Face Runout, Flatness, Wall Thickness Variation, Angular Deviation, Short Arc Evaluation, Piston Profile Analysis |
| Spindle Accuracy | (0.01 + 4H/10000) µm (radial, per JIS B 7451:1997) |
| Bearing Type | Air-bearing Spindle |
| Max. External Diameter | 420 mm |
| Rotational Speed | 2–10 rpm (up to 20 rpm during rapid positioning) |
| Brand | Accretech Tokyo Seimitsu |
|---|---|
| Origin | Japan |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Model Variants | 1600G, S1400G, 1800G |
| Distribution Status | Authorized Distributor Supply |
| Compliance Context | Designed for ISO 4287, ISO 4288, ISO 25178-2, and JIS B 0601-compliant surface metrology |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Type | Contact Profilometer & Roundness/Cylindricity Measuring Instrument |
| Model | Rondcom GRANDE DUO / GRANDE |
| Bearing System | High-Precision Air Bearing Spindle |
| R-Axis | Flexible Radial Traverse Mechanism (Small to Large Diameter Workpieces) |
| Application Focus | Precision Evaluation of Large-Scale Bearings for Wind Turbines and Heavy Machine Tools |
| Compliance | Designed for ISO 1101, ISO 5436-1, and ASME B89.3.1 standards |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | R73A |
| Bearing Type | Pneumatic (Air) |
| Measurement Principle | Radial Method with Rotating Sensor Table |
| Z-Axis Travel | 1000 mm |
| Radial (R-Axis) Auto-Zero Function | Yes |
| Tilt & Centering | Fully Automatic Compensation |
| Software Platform | ACCTee |
| Measurement Magnification | 50× to 10,000× (8 selectable steps) |
| Compliance | Designed for ISO 1101, ISO 12181 (Roundness), ISO 12180 (Cylindricity), and ASME Y14.5 geometric tolerance evaluation |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | HANDYSURF+ |
| Measurement Principle | Stylus-based contact profilometry |
| Measurement Method | Contact (diamond stylus) |
| Filter Type | 2RC |
| Evaluation Length | 0.2–16 mm |
| Vertical Resolution | 0.0007 µm |
| Maximum Specimen Height Range | −210 to +160 µm |
| Display | 2.4-inch color LCD with Chinese/Japanese/English interface support |
| Compliance | ISO 4287, ISO 4288, ISO 13565-1/2/3, JIS B 0601, ASME B46.1 |
| Brand | Thermo Fisher |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ELEMENT™ Series ICP-MS |
| Price Range | USD 200,000–270,000 |
| Instrument Type | Sector Field Magnetic Sector ICP-MS |
| Mass Resolution (at 10% peak height, m/Δm) | >10,000 |
| Detection Limit (in aqueous solution, 3σ) | <0.2 fg L⁻¹ for ²³⁸U |
| Sensitivity (for ²³⁸U at 1 µg L⁻¹) | >1 × 10⁹ cps per µg L⁻¹ |
| Dynamic Range | 0.2 cps (SEM) to >1 × 10¹² cps (Faraday) |
| Brand | ACCRETECH |
|---|---|
| Origin | Japan |
| Model | NEX |
| Measurement Range (Max. Diameter) | Φ300 mm |
| Max. Height | 500 mm |
| Spindle Radial Accuracy | (0.02 + 3.2H/10000) µm (per JIS B 7451-1997) |
| Z-axis Straightness | 0.23 µm/500 mm |
| R-axis Straightness | 0.7 µm/180 mm |
| Table Load Capacity | 30 kg |
| Table Diameter | Φ235 mm |
| Rotational Speed (θ-axis) | 1–10 rpm |
| Z/R-axis Traverse Speed | 0.5–10 mm/s |
| Brand | PAMAS |
|---|---|
| Origin | Germany |
| Model | S40 |
| Instrument Type | Optical Particle Counter |
| Measurement Principle | Light Obscuration (LO) |
| Particle Size Channels | 8 user-configurable thresholds |
| Compliance Standards | ISO 4406:1987 / ISO 4406:1999 / SAE AS4059D / NAS1638 |
| Power Supply | 90–230 V AC, 50 Hz |
| Weight | ~9 kg |
| Dimensions | 300 × 140 × 300 mm |
| Display | Backlit touchscreen LCD |
| Data Interface | RS-232C (ASCII 8-bit) |
| Internal Storage | 500 measurement records |
| Sampling Pressure Range | 0–420 bar |
| Viscosity Limit | ≤200 cSt (unpressurized), ≤350 cSt (pressurized), ≤1000 cSt (lubricating oil systems) |
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