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| Brand | ACCRETECH |
|---|---|
| Origin | Japan |
| Model | DM45514 |
| Type | Contact Stylus Surface Profilometer |
| Compliance | ISO 4287, ISO 4288, ISO 25178-2, JIS B 0601, ASME B46.1 |
| Probe Type | Diamond-tipped stylus (2 µm radius standard) |
| Vertical Resolution | Sub-nanometer (typical < 0.1 nm) |
| Scan Length | Up to 100 mm (configurable) |
| Measurement Speed | 0.01–5 mm/s (adjustable) |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | DM43827 |
| Type | Contact Stylus-Based Surface Profilometer |
| Compliance | ISO 4287, ISO 4288, ISO 25178-2 (areal parameters), JIS B 0601, ASTM E1092 |
| Measurement Principle | Inductive Linear Variable Differential Transformer (LVDT) with Diamond Stylus Scanning |
| Stylus Tip Radius | 2 µm (standard), optional 5 µm or 12.5 µm |
| Vertical Resolution | ≤ 0.1 nm (sub-nanometer analog signal processing) |
| Scan Length | Up to 100 mm (motorized precision stage) |
| Lateral Sampling Interval | Adjustable from 0.01 µm to 10 µm |
| Vertical Range | ±1 mm |
| Speed Control | 0.01–1.0 mm/s (programmable scan velocity) |
| Data Points per Profile | Up to 1,000,000 points |
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