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| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM 1800G |
| Z-axis Range | 800 mm (Profile) / 50 mm (Roughness) |
| X-axis Range | 100 mm (standard), up to 200 mm (optional -22 system) |
| Z-axis Indication Accuracy | ±0.25% FS (±4 µm within 5 mm range) |
| Z-axis Resolution | 0.1 µm (±2.5 mm), 0.4 µm (10 mm), 1 µm (±25 mm) |
| X-axis Indication Accuracy | ±(1 + 2L/100) µm (L in mm) |
| Straightness Accuracy | (0.05 + 1.5L/1000) mm |
| Measurement Principle | Differential Voltage (Z), Moiré Interferometric Scale (X) |
| Stylus Force | 0.75 mN (roughness), ≤30 mN (profile) |
| Stylus Radius | 2 µm (roughness), 25 µm (profile) |
| Stylus Material | Diamond (roughness), Tungsten Carbide (profile) |
| Vertical Feed Direction | Upward/Downward |
| Horizontal Feed Direction | Pull/Push |
| Filtering Standards | JIS B 0601:2001, ISO 4287, ISO 13565, ASME B46.1, DIN 4768, CNOMO |
| Roughness Parameters | Ra, Rq, Rz, Rmax, Rt, Rv, Rp, Rc, R3z, Sm, S, RDa, RDq, Rla, Rlq, Til, TA, lr, Pc, Rmr, tp2, Rmr2, Rdc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR |
| Profile Evaluation | Coordinate transformation, symmetry analysis, intersection detection (line-line, line-circle, circle-circle, etc.), GD&T deviation mapping with on-graph dimensioning, shape synthesis, CNC measurement replay, AI-assisted feature recognition |
| Software Compliance | Supports audit trail, user access control, and data integrity per FDA 21 CFR Part 11 requirements for regulated environments |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | SURFCOM NEX |
| Type | Contact Stylus Profilometer |
| Measurement Principle | Mechanical Stylus Tracing (ISO 3274, ISO 4287 compliant) |
| Vertical Resolution | Sub-nanometer (typical ≤0.1 nm) |
| Vertical Range | ±5 mm |
| Scan Length | Up to 100 mm (standard), extendable to 200 mm |
| Stylus Tip Radius | 2 µm (standard diamond tip, 90° included angle) |
| Force | Adjustable from 0.5 mN to 15 mN |
| Surface Roughness Parameters | Ra, Rz, Rq, Rp, Rv, Rt, Rsk, Rku, Rmr, etc. (per ISO 4287/ISO 25178-2) |
| Profile Analysis | Form error, waviness, slope, radius, step height, angle, bearing ratio (Abbott-Firestone curve) |
| Compliance | Fully supports ISO, JIS, ASME B46.1, and DIN standards |
| Software | SURFPAK-SV with GLP/GMP-compliant audit trail, user permission levels, and 21 CFR Part 11-ready electronic signatures |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | DM45505 |
| Type | Contact Profilometer Stylus |
| Operating Principle | Mechanical Stylus Scanning |
| Compliance | Designed for ISO 4287, ISO 11562, and ASME B46.1 surface texture measurement standards |
| Stylus Tip Radius | 2 µm (nominal) |
| Shank Diameter | 3.2 mm |
| Total Length | 25 mm |
| Material | Single-crystal diamond |
| Mounting Interface | Standard M2.5 threaded shank |
| Compatibility | Interchangeable with Accretech SE300/SE350/SP150 series profilometers and compatible third-party CMM-based surface metrology systems |
| Brand | Accretech Tokyo Seimitsu |
|---|---|
| Origin | Japan |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Model Variants | 1600G, S1400G, 1800G |
| Distribution Status | Authorized Distributor Supply |
| Compliance Context | Designed for ISO 4287, ISO 4288, ISO 25178-2, and JIS B 0601-compliant surface metrology |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Type | Contact Profilometer & Roundness/Cylindricity Measuring Instrument |
| Model | Rondcom GRANDE DUO / GRANDE |
| Bearing System | High-Precision Air Bearing Spindle |
| R-Axis | Flexible Radial Traverse Mechanism (Small to Large Diameter Workpieces) |
| Application Focus | Precision Evaluation of Large-Scale Bearings for Wind Turbines and Heavy Machine Tools |
| Compliance | Designed for ISO 1101, ISO 5436-1, and ASME B89.3.1 standards |
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