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| Brand | ACCRETECH |
|---|---|
| Origin | Japan |
| Model | DM45514 |
| Type | Contact Stylus-Based Surface Profilometer |
| Measurement Principle | Inductive Displacement Sensing with Diamond Stylus |
| Vertical Resolution | Sub-nanometer (typical) |
| Lateral Resolution | ≤ 0.1 µm (dependent on scan speed and stylus tip radius) |
| Scan Length | Up to 100 mm (standard configuration) |
| Vertical Range | ±1 mm |
| Compliance | ISO 25178-2, ISO 4287, ISO 4288, ASME B46.1 |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | DM43827 |
| Type | Contact Stylus for Geometric Metrology |
| Application | Roundness, Surface Roughness, and Profile Measurement Systems |
| Compliance | Designed for Integration with Accretech Roundness/Cylindricity Testers (e.g., RA-2200, RA-1200), PGI Profilometers, and Compatible CMM Platforms |
| Mounting Interface | Standard M2.5 × 0.45 mm Threaded Shank |
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