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BrandAccretech
OriginJapan
ModelSURFCOM NEX 031SD
Measurement PrincipleStylus-based profilometry
Sensor TypeDual-purpose (contour + roughness)
Standard Stylus Force0.75 mN
Roughness Vertical Range±500 µm
Drive MechanismLinear motor
Temperature CompensationYes (20 ± 5 °C operational range)
Sensor MountingV-groove + three-point ball-pin定位
Quick-change ArmYes, with collision detection and auto-stop
Measurement OrientationUpward, downward, lateral (via bracket or stylus reorientation)
Compliance ReadyDesigned for ISO 4287, ISO 4288, ISO 25178-2, JIS B 0601, ASME B46.1, and GLP/GMP-aligned data integrity workflows
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BrandACCRETECH
OriginJapan
ModelSURFCOM NEX
TypeContact Profilometer / Surface Roughness Tester
Operating PrincipleStylus-Based Profilometry
CategoryImported Precision Geometric Measurement Instrument
Distributor StatusAuthorized General Distributor
Price RangeUSD 68,000 – 136,000 (FOB Japan)
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BrandAccretech (Tokyo Seimitsu)
OriginJapan
ModelSURFCOM 1800G
Z-Axis Range50 mm
X-Axis Range100 mm (200 mm optional)
Z-Axis Indication Accuracy±0.25% FS (±4 µm within 5 mm)
Z-Axis Resolution0.1 µm (±2.5 mm), 0.4 µm (10 mm), 1 µm (±25 mm)
X-Axis Indication Accuracy±(1 + 2L/100) µm (L in mm)
X-Axis Straightness(0.05 + 1.5L/1000) mm
Measurement PrincipleContact stylus profilometry with Moiré fringe interferometric X-axis positioning and differential voltage displacement sensing on Z-axis
Stylus Force0.75 mN (standard), ≤30 mN (max)
Stylus Tip Radius2 µm or 25 µm (interchangeable)
Stylus MaterialDiamond or superhard alloy
Traverse Speeds0.03–6 mm/s (8-step programmable)
Vertical Column Speed3 mm/s
Filter Types2RC standard, 2RC phase-corrected, Gaussian
Cutoff Wavelengths0.025–25 mm (7 standard values)
Standards ComplianceJIS B 0601:2001/1994/1982, ISO 4287, ISO 13565, DIN 4768, ASME B46.1, CNOMO
Roughness ParametersRa, Rq, Rv, Rp, Rc, Rz, Rmax, Rt, Rz(JIS), R3z, Sm, S, RDa, RDq, Rla, Rlq, Til, TA, lr, Pc, Rmr, tp2, Rmr2, Rdc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR
Profile EvaluationStraightness, flatness, roundness, curvature, slope, angle, radius, distance, coordinate difference, polar coordinate difference, symmetry (point-point, point-circle, line-line, circle-circle, etc.), envelope wave profile, motif analysis (roughness & waviness), load curve, power spectral density (PSD), amplitude distribution
Software FunctionsAuto-condition setup (patented AI function), CNC measurement sequence recording & playback, automatic feature recognition & dimensioning, shape synthesis, tilt compensation (linear, R-surface, front/rear/both-end, spline), macro programming, peak/valley search, workpiece trajectory mapping, design vs. actual comparison, mirror inversion
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BrandAccretech Tokyo Seimitsu
OriginJapan
Product TypeContact Profilometer / Surface Roughness Tester
Operating PrincipleStylus-Based Profilometry
Model Range1600G, S1400G, 1800G
ComplianceDesigned for ISO 25178, ISO 4287, ISO 4288, and JIS B 0601-compliant surface metrology
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BrandAccretech
OriginJapan
ModelDM45505
TypeContact Stylus Probe for Surface Profilometry and Roughness Measurement
ComplianceDesigned for ISO 25178, ISO 4287, ASME B46.1, and JIS B 0601-compliant profilometric systems
Mounting InterfaceStandard 8-32 UNC threaded shank (compatible with Accretech SJ-410/SJ-510/SJ-610 series, Formtracer series, and other OEM profilometers)
Tip GeometrySpherical diamond tip, nominal radius 2 µm or 5 µm (standard variant), 90° included angle conical backup geometry
Shank Diameter3.0 mm
Total Length25 mm
Maximum Tracking Force≤ 1.5 mN (adjustable via instrument feedback loop)
MaterialHigh-purity synthetic diamond tip bonded to hardened stainless steel shank
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BrandAccretech
OriginJapan
TypeContact Profilometer / Roughness Tester
ModelRondcom GRANDE DUO / GRANDE
Bearing TypeHigh-Precision Air Bearing
R-Axis FlexibilityAdjustable Radial Traverse for Small-to-Large Diameter Components
Application FocusRoundness, Cylindricity, Surface Roughness, and Form Error Measurement of Large-Heavy Industrial Parts
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