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| Brand | -- |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Authorized Distributor |
| Regional Classification | Domestic (PRC) |
| Model | CS-810 |
| Price Range | USD 4,200 – 7,000 |
| Instrument Type | Benchtop |
| Product Category | Spectrophotometric Colorimeter |
| Illuminant | CLEDs (Full-Spectrum Balanced LED Source) |
| Geometry | D/0 (Diffuse Illumination / 0° Viewing) |
| Transmission Measurement Range | 0–200% (UV-Enhanced Silicon Photodiode) |
| Color Scales Supported | Platinum-Cobalt (Hazen/APHA), Gardner, CIE L*a*b*, L*C*h*, ΔE*ab, ΔE*00, XYZ, Yxy, RGB, sRGB, Hunter Lab |
| Sample Compatibility | Transparent & Near-Transparent Liquids, Glass Substrates |
| Compliance | ASTM D1209, ASTM D5386, ASTM E308, ISO 7724-1, ISO 11664-4, USP <631>, JIS Z 8722 |
| Brand | — |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Authorized Distributor |
| Regional Classification | Domestic (China) |
| Model | CS-821N |
| Price Range | USD 4,200 – 7,000 |
| Product Category | Spectrophotometric Colorimeter |
| Instrument Type | Desktop |
| Optical Geometry | d/8° Integrating Sphere |
| Illumination Sources | Pulsed Xenon Lamp & LED |
| Repeatability | ΔE*ab ≤ 0.015 |
| Brand | Accurion |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EP4 |
| Pricing | Upon Request |
| Brand | Accurion |
|---|---|
| Origin | Switzerland |
| Model | RSE Referenced Spectroscopic Ellipsometry Fast Inspection System |
| Spectral Range | 450–900 nm |
| Spot Size | 50 × 100 µm (at 60° incidence) |
| Thickness Measurement Range | <1 nm to 10 µm |
| Acquisition Rate | 200 full spectroscopic ellipsometric spectra per second |
| Mapping Area | 100 mm × 100 mm in ≤12 min |
| Data Processing | Real-time look-up table (LUT)-based fitting |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, supports GLP/GMP traceability via audit-ready software logs |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Model | TM4000II / TM4000PlusII |
| Accelerating Voltage | 5 kV / 10 kV / 15 kV (4-step current adjustment per voltage) |
| Magnification Range | 10× to 100,000× |
| Detector Configuration | Quad-segment backscattered electron detector (BSE) |
| Sample Chamber Dimensions | Ø80 mm × 50 mm (max. height) |
| Imaging Modes | Conductive mode (TM4000PlusII), Standard mode, Charge-free mode |
| Software Features | SEM-MAP navigation, report-generation export (PDF/HTML), real-time BSE + SE image overlay (TM4000PlusII) |
| Camera Resolution | 2560 × 1920 (CCD) |
| EDS Compatibility | Integrated EDX interface |
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