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| [Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | ROUNDCOM Series |
| Type | CNC-Driven, Shop-Floor Hardened Coordinate Metrology System |
| Bearing Technology | Air-Bearing Spindle (Z & R Axes) |
| Rotation Accuracy | ≤0.01 µm (ROUNDCOM 65B), ≤0.02 µm (ROUNDCOM 60A/45A) |
| Max. Workpiece Load | 250 kg |
| Max. Measurable Diameter | Φ580 mm |
| Max. Measurable Height | 900 mm (Std.) |
| Control Mode | Fully Automatic CNC |
| Compliance | CE Marked |
| Standard Vibration Isolation | Integrated Air-Damped Granite Base |
| Sensor Mounting | Patented Dual-Axis Auto-Positioning Bracket (XY + YZ Rotational Degrees of Freedom) |
| Software Platform | TIMS — Total Integrated Measurement Suite] |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM Series |
| Type | CNC-Controlled Contact Profilometer with Dual-Mode Sensor Architecture |
| Axes | Up to 5-Axis Synchronized Motion |
| Max. Traverse Speed | 100 mm/s |
| Z-Range | Up to 60 mm (NEX040), 10 mm (CREST LP), 13 mm (CREST DX) |
| X-Range | Up to 200 mm |
| Vertical Resolution | 0.31 nm (CREST DX, laser interferometric sensor) |
| Z-Axis Resolution | 0.02 µm (NEX040, laser diffraction grating encoder) |
| Measurement Modes | Simultaneous roughness & contour (dual-sensor hybrid), upward measurement (with auto-stop), lateral tracing |
| Compliance | ISO 25178-605 (areal surface texture), ISO 4287/4288 (profile-based roughness), ISO 11562 (filtering), ISO 12781 (flatness), ISO 12780 (straightness) |
| Sensor Options | NEX001 (1000 µm range, 500,000× magnification), NEX030 (universal profilometry, high-accuracy linear scale), NEX040 (high-precision, auto-force adjustment), CREST LP (non-contact autofocus mode for low-reflectivity/color-insensitive surfaces) |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XYZAX Series |
| Operation Mode | Fully Automatic |
| Instrument Type | Shop-Floor CMM |
| Measurement Technology | High-Accuracy Cartesian Metrology with Dynamic Scanning & Real-Time Probe Compensation |
| Standard Software | CALYPSO v7.x (ZEISS) |
| Compliance | JIS B 7440-2:2003, ISO 10360-2, ISO 15530-3, ASTM E1378, GLP/GMP-ready audit trail support |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Type | CNC-Controlled Non-Contact + Contact Hybrid Profilometer |
| Axes | 5-Axis Synchronized Motion |
| Drive Speed | Up to 100 mm/s |
| Z-Range | 10 mm |
| X-Range | 200 mm |
| Vertical Resolution | 0.31 nm |
| Measurement Principle | High-Stability Homodyne Laser Interferometry (for CREST DX) + Dual-Sensor Tactile Stylus (for NEX 100 DX/SD) |
| Compliance | ISO 25178-605, ISO 4287, ISO 4288, ISO 11562, ISO 21920-1 |
| Operation Mode | Fully Automated |
| Sensor Options | Integrated Dual-Mode (Stylus + Auto-Focus Optical) |
| Software Platform | SURFPAK DX v8.x with Audit Trail & CFR 21 Part 11 Ready Configuration |
| Data Export | CSV, XML, STEP AP212, PDF Report (GLP/GMP Compliant Templates) |
| Brand | Biotage |
|---|---|
| Origin | Sweden |
| Model | Isolera Prime |
| Instrument Type | Automated Flash Chromatography System |
| Flow Rate | 1–100 mL/min |
| Maximum System Pressure | 10 bar (150 psi) |
| UV Detection Range | 200–400 nm (standard), optional 200–800 nm |
| Gradient Capability | Dual-solvent channels with TLC-driven gradient generation |
| Fraction Collection Options | 13 mm, 16 mm, 18 mm, 25 mm test tubes |
| Display | 10.4-inch capacitive touchscreen |
| Operating System | Embedded Linux |
| Connectivity | Ethernet-enabled for remote control, data logging, and network printing |
| Compliance | Compatible with GLP/GMP workflows via audit trail-ready software architecture |
| Origin | Germany |
|---|---|
| Manufacturer | Elementar Analysensysteme GmbH |
| Type | vario Series |
| Compliance | ASTM D5373, ISO 10694, USP <28>, EPA Method 405.1, EN 15148 |
| Detection Range | C/H/N/S/O/Cl |
| Sample Mass | 0.1 mg – 800 mg |
| Combustion Temperature | up to 1200 °C (1800 °C peak with tin foil) |
| Gas Supply | He or Ar carrier gas, O₂ for combustion |
| Data System | Windows-based software with audit trail, 21 CFR Part 11 optional |
| Brand | Teledyne CETAC |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrumentation |
| Model Series | CETAC Nebulizer Systems |
| Pricing | Available Upon Request |
| Brand | Struers |
|---|---|
| Origin | France |
| Model | PSM-5 / PSM-10 |
| Magnification | up to 400× (PSM-5), up to 600× (PSM-10) |
| Illumination | Integrated battery-powered LED |
| Construction | Lightweight aluminum housing |
| Accessories | Digital camera adapter, eyepiece micrometer, thin-film thickness gauge, magnetic cross-stage (PSM-10 only), high tripod base (PSM-10 only) |
| Carrying case | Rugged aluminum transport case with integrated tool storage |
| Compliance | Designed for field-deployable non-destructive evaluation in accordance with aerospace surface inspection best practices |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | SXES |
| Energy Resolution | 0.3 eV (at Al-L edge, 73 eV) |
| Detection Energy Range | 50–170 eV (JS50XL grating) / 70–210 eV (JS50XL grating) |
| Mounting Interface | EPMA WDS Port #2 (front right) or FE-SEM WDS port (front left-rear) |
| Dimensions (W×D×H) | 168 mm × 348 mm × 683 mm (including CCD distance from interface) |
| Weight | 25 kg |
| Compatible Instruments | EPMA — JXA-8530F, JXA-8230, JXA-8500F, JXA-8200 |
| Brand | TA Instruments |
|---|---|
| Origin | USA |
| Model | Discovery |
| Instrument Type | Dynamic Mechanical Analyzer (DMA/DMTA) |
| Compliance | ASTM D4065, ASTM D7028, ISO 6721, ISO 11359, USP <1031> |
| Cooling Range | –100 °C to 600 °C |
| Force Range | 0.1 mN to 18 N |
| Displacement Resolution | 0.1 nm over 25 mm dynamic range |
| Environmental Options | Dual configurable environmental chambers (inert gas, humidity, vacuum) |
| Control Architecture | Non-contact voice-coil motor with continuous force control |
| Bearing System | Low-compliance air bearing |
| Strain Sensing | Direct optical encoder-based strain measurement |
| Software Platform | TRIOS v5.x with 21 CFR Part 11 compliant audit trail and GLP/GMP-ready workflows |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-8230 |
| Accelerating Voltage | 0.2–30 kV (0.1 kV step) |
| Beam Current Range | 1×10⁻¹² – 1×10⁻⁵ A |
| Beam Current Stability | ±5% / h, ±0.3% / 12 h |
| Secondary Electron Resolution | 6 nm (W filament, WD = 11 mm, 30 kV) |
| Magnification | ×40 – ×300,000 |
| Max. Sample Size | 100 mm × 100 mm × 50 mm (H) |
| WDS Elemental Range | Be*¹–U (Be requires optional crystal) |
| EDS Elemental Range | B–U |
| WDS Wavelength Range | 0.087–9.3 nm |
| EDS Energy Range | 0–20 keV |
| WDS Spectrometers | 1–5 channels (configurable) |
| EDS Detector | 1 SDD (optional fanless digital pulse processor) |
| Display | Dual LCDs (1280×1024), dedicated for EPMA analysis and SEM/EDS operation |
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