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| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-8230 |
| Accelerating Voltage | 0.2–30 kV (0.1 kV step) |
| Beam Current Range | 1×10⁻¹² – 1×10⁻⁵ A |
| Beam Current Stability | ±5% / h, ±0.3% / 12 h |
| Secondary Electron Resolution | 6 nm (W filament, WD = 11 mm, 30 kV) |
| Magnification | ×40 – ×300,000 |
| Max. Sample Size | 100 mm × 100 mm × 50 mm (H) |
| WDS Elemental Range | Be*¹–U (Be requires optional crystal) |
| EDS Elemental Range | B–U |
| WDS Wavelength Range | 0.087–9.3 nm |
| EDS Energy Range | 0–20 keV |
| WDS Spectrometers | 1–5 channels (configurable) |
| EDS Detector | 1 SDD (optional fanless digital pulse processor) |
| Display | Dual LCDs (1280×1024), dedicated for EPMA analysis and SEM/EDS operation |
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