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| [Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | ROUNDCOM Series |
| Type | CNC-Driven, Shop-Floor Hardened Coordinate Metrology System |
| Bearing Technology | Air-Bearing Spindle (Z & R Axes) |
| Rotation Accuracy | ≤0.01 µm (ROUNDCOM 65B), ≤0.02 µm (ROUNDCOM 60A/45A) |
| Max. Workpiece Load | 250 kg |
| Max. Measurable Diameter | Φ580 mm |
| Max. Measurable Height | 900 mm (Std.) |
| Control Mode | Fully Automatic CNC |
| Compliance | CE Marked |
| Standard Vibration Isolation | Integrated Air-Damped Granite Base |
| Sensor Mounting | Patented Dual-Axis Auto-Positioning Bracket (XY + YZ Rotational Degrees of Freedom) |
| Software Platform | TIMS — Total Integrated Measurement Suite] |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM Series |
| Type | CNC-Controlled Contact Profilometer with Dual-Mode Sensor Architecture |
| Axes | Up to 5-Axis Synchronized Motion |
| Max. Traverse Speed | 100 mm/s |
| Z-Range | Up to 60 mm (NEX040), 10 mm (CREST LP), 13 mm (CREST DX) |
| X-Range | Up to 200 mm |
| Vertical Resolution | 0.31 nm (CREST DX, laser interferometric sensor) |
| Z-Axis Resolution | 0.02 µm (NEX040, laser diffraction grating encoder) |
| Measurement Modes | Simultaneous roughness & contour (dual-sensor hybrid), upward measurement (with auto-stop), lateral tracing |
| Compliance | ISO 25178-605 (areal surface texture), ISO 4287/4288 (profile-based roughness), ISO 11562 (filtering), ISO 12781 (flatness), ISO 12780 (straightness) |
| Sensor Options | NEX001 (1000 µm range, 500,000× magnification), NEX030 (universal profilometry, high-accuracy linear scale), NEX040 (high-precision, auto-force adjustment), CREST LP (non-contact autofocus mode for low-reflectivity/color-insensitive surfaces) |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XYZAX Series |
| Operation Mode | Fully Automatic |
| Instrument Type | Shop-Floor CMM |
| Measurement Technology | High-Accuracy Cartesian Metrology with Dynamic Scanning & Real-Time Probe Compensation |
| Standard Software | CALYPSO v7.x (ZEISS) |
| Compliance | JIS B 7440-2:2003, ISO 10360-2, ISO 15530-3, ASTM E1378, GLP/GMP-ready audit trail support |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Type | CNC-Controlled Non-Contact + Contact Hybrid Profilometer |
| Axes | 5-Axis Synchronized Motion |
| Drive Speed | Up to 100 mm/s |
| Z-Range | 10 mm |
| X-Range | 200 mm |
| Vertical Resolution | 0.31 nm |
| Measurement Principle | High-Stability Homodyne Laser Interferometry (for CREST DX) + Dual-Sensor Tactile Stylus (for NEX 100 DX/SD) |
| Compliance | ISO 25178-605, ISO 4287, ISO 4288, ISO 11562, ISO 21920-1 |
| Operation Mode | Fully Automated |
| Sensor Options | Integrated Dual-Mode (Stylus + Auto-Focus Optical) |
| Software Platform | SURFPAK DX v8.x with Audit Trail & CFR 21 Part 11 Ready Configuration |
| Data Export | CSV, XML, STEP AP212, PDF Report (GLP/GMP Compliant Templates) |
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