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| Brand | TZTEK |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Domestic (China) |
| Model | Spector |
| Pricing | Available Upon Request |
| Optical Modes | Reflective & Transmissive |
| Illumination Options | Visible Light & UV (365 nm) |
| CD Measurement Range | Down to 300 nm |
| 3σ Repeatability | Sub-1 nm (typical) |
| Maximum Mask Size Supported | 14-inch (355 mm) square or custom-shaped reticles |
| Interface Standard | SECS/GEM compliant |
| Brand | TZTEK |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | VME222 |
| Operation Mode | Fully Automatic |
| Measurement Range | ≥200 × 200 × 200 mm |
| Encoders | 0.5 µm Industrial-Grade Linear Glass Scale |
| XY-Axis Speed | 500 mm/s |
| Z-Axis Speed | 100 mm/s |
| Optical Magnification | 25×–160× (Stepless Electronic Turret Recognition) |
| Camera | High-Resolution Color Industrial Digital Camera |
| Illumination System | Programmable 6-Ring 8-Zone LED Surface Illuminator, Adjustable LED Backlight, Coaxial Illumination Option |
| Brand | TZTEK |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | TB Series |
| Instrument Category | Optical Patterned Wafer Defect Inspection System |
| Primary Application | Semiconductor Wafer Defect Detection |
| Supported Wafer Diameters | 200 mm (8-inch), 300 mm (12-inch) |
| Compliance | Designed for integration into semiconductor front-end and back-end process lines |
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