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| Brand | TZTEK |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | TB Series |
| Instrument Category | Optical Patterned Wafer Defect Inspection System |
| Primary Application | Semiconductor Wafer Defect Detection |
| Supported Wafer Diameters | 200 mm (8-inch), 300 mm (12-inch) |
| Compliance | Designed for integration into semiconductor front-end and back-end process lines |
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