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Thermo Fisher Scientific Electron Microscopy

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BrandThermo Fisher Scientific
OriginNetherlands
ManufacturerThermo Fisher Scientific
Import StatusImported
ModelQuattro
ConfigurationFloor-standing (Conventional High-Performance SEM)
Electron SourceCold Field Emission Gun (CFEG)
Vacuum ModesHigh Vacuum / Low Vacuum / Environmental SEM (ESEM™)
Detector CompatibilityIn-lens SE, Solid-state BSE, STEM-in-SEM, Cathodoluminescence (CL), EDS (up to 3 detectors), EBSD, WDS
StageMotorized 5-axis eucentric stage with ±105° tilt
Temperature Range (In-situ)–165°C to 1400°C (with optional cryo/thermal stages)
Software PlatformThermo Scientific™ Avizo™-integrated SmartSEM™ with Python-based AutoScript API
ComplianceDesigned for GLP/GMP environments
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BrandThermo Fisher
OriginGuangdong, China
Manufacturer TypeOEM Manufacturer
Regional ClassificationDomestic (China)
ModelApreo ChemiSEM
QuotationUpon Request
Instrument Form FactorFloor-Standing
Electron Source TypeThermal Field-Emission Gun (TFEG)
Microscope ClassUltra-High-Resolution Field-Emission SEM
Secondary Electron Resolution0.7 nm @ 30 kV
Magnification Range29× to 200,000×
Accelerating Voltage Range200 V – 30 kV
Backscattered Electron Resolution0.8 nm @ 1 kV
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BrandThermo Fisher
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported
ModelAxia ChemiSEM
Instrument TypeFloor-Standing Conventional SEM
Electron SourceTungsten Filament
Secondary Electron Resolution3 nm @ 30 kV, 8 nm @ 3 kV
Accelerating Voltage0.2–30 kV
Backscattered Electron Imaging CapabilityIntegrated
Elemental Analysis IntegrationOn-platform EDS (Energy-Dispersive X-ray Spectroscopy)
Sample Weight CapacityUp to 10 kg
Automation LevelFully Automated Beam Alignment, Smart User Guidance, Undo Functionality
ComplianceDesigned for GLP/GMP environments with audit-trail-ready software architecture
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BrandThermo Fisher Scientific
OriginImported
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
ModelVolumescope 2
Instrument TypeFloor-standing SEM
Electron SourceCold Field Emission Gun (CFEG)
Accelerating Voltage1.0–30 kV
Vacuum ModesHigh Vacuum (HiVac) and Low Vacuum (LoVac) with VSDBS detector
Z-axis Optical Sectioning ResolutionUp to 10 nm
Sample HandlingAutomated ultramicrotome integration for seamless transition between conventional SEM and SBFI/AT workflows
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BrandThermo Fisher Scientific
OriginGuangdong, China
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Regional ClassificationDomestic Production
ModelApreo
Instrument TypeFloor-Model High-Performance SEM
Electron Gun TypeCold Field Emission (CFEG)
Microscope ClassUltra-High-Resolution Field-Emission SEM
Secondary Electron Resolution1.0 nm at 1 kV (in-lens detection, no beam deceleration or monochromator)
Accelerating Voltage Range200 V – 30 kV
Backscattered Electron Resolution≤1.5 nm at 30 kV (T1 in-lens BSE detector)
Chamber ConfigurationTriple EDS/WDS port capability
Vacuum SystemDual-mode (High Vacuum & Variable Pressure up to 500 Pa)
Software PlatformxT User Interface with SmartSCAN™, Drift Compensation Frame Integration (DCFI), and Charge Filtering Algorithms
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BrandThermo Fisher
OriginImported (Non-China)
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Electron Gun TypeCold Field Emission
ModelPrisma E SEM
Vacuum ModesHigh Vacuum, Low Vacuum, Environmental SEM (ESEM) Mode
Sample Chamber CapacityUp to 18 samples per load
Detector FlexibilityMultiple detector options including SE, BSE, EDS, and optional STEM-in-SEM
Software IntegrationColorSEM real-time elemental mapping, image navigation, customizable UI with Undo/Redo functionality
ComplianceDesigned for GLP/GMP environments
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BrandThermo Fisher Scientific
OriginCzech Republic
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported
ModelVerios XHR
Instrument TypeFloor-standing / Conventional High-Performance SEM
Electron SourceCold Field Emission Gun (CFEG)
Accelerating Voltage Range1–30 kV
Secondary Electron Resolution<0.7 nm at 1 kV, <0.4 nm at 30 kV (as specified in Thermo Fisher technical documentation)
Backscattered Electron Resolution<1.5 nm at 30 kV
Sample Chamber DimensionsØ340 mm × H280 mm
Maximum Sample Size200 mm wafer or 100 mm × 100 mm × 50 mm bulk specimen
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