X-Ray Instruments
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| Brand | GKINST |
|---|---|
| Model | GK-THMS350V |
| Max Temp | 350 °C |
| Min Temp | −195 °C |
| Max Heating Rate | 150 °C/min |
| Max Cooling Rate | 30 °C/min |
| Temp Resolution | < 0.05 °C |
| Temp Stability | < 0.05 °C |
| Control Algorithm | PID Dynamic Regulation |
| Sensor Type | PT100 Platinum Resistance Thermometer |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | 5000 Series |
| Max Anode Current | 1.0 mA |
| Max Anode Voltage | 50 kV |
| Max Power | 50 W |
| Filament Nominal Voltage | 2.0 V @ 50 kV, 1 mA |
| Filament Max Current | 1.7 A |
| Stability (4 hr) | ±0.2% |
| Nominal Focal Spot Size | 110 µm |
| Anode Material Options | W, Mo, Rh (custom anodes available) |
| Beryllium Window Thickness Options | 75 µm, 125 µm, 250 µm |
| Approx. Weight | 1.816 kg (4 lbs) |
| Cooling Method | Compressed Air @ 150 CFM |
| Beam Divergence Angle | 25° |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | General Distributor |
| Origin Category | Imported |
| Model | UltraBright |
| Price Range | USD 0 – 9,999 |
| Max Anode Current | 1.0 mA |
| Max Anode Voltage | 50 kV |
| Max Power | 50 W |
| Filament Nominal Voltage | 2.0 V @ 50 kV, 1 mA |
| Filament Max Current | 1.7 A |
| Stability (after 4 hrs) | ±0.2% |
| Nominal Focal Spot Size | 110 µm |
| Anode Materials | W, Mo, Rh (custom options available) |
| Beryllium Window Thickness | 125 µm (optional: 75 µm or 250 µm) |
| Approx. Weight | 1.816 kg (4 lbs) |
| Cooling Method | Compressed Air @ 150 CFM |
| Beam Divergence Angle | 25° |
| Brand | Persee |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic (China-made) |
| Model | XD-2 / XD-3 |
| Instrument Type | Powder X-ray Diffractometer |
| Price Range | USD 70,000 – 140,000 (FOB China) |
| Detector | Imported NaI Scintillation Counter |
| Goniometer Configuration | Vertical θ–θ geometry with hollow-axis design |
| X-ray Source Control | Fully digital, microprocessor-regulated high-voltage and tube current |
| Software | PDP Diffraction Data Processing Suite (Windows-based, multi-format export support) |
| Brand | Persee |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Line | XD-6 Series |
| Price Range | USD 42,000 – 70,000 |
| Brand | Princeton Instruments |
|---|---|
| Sensor Type | Back-illuminated or front-illuminated deep-depletion CCD |
| Energy Range | 3–20 keV |
| Window Material | Vacuum-integrated beryllium (Be) |
| Cooling | Thermoelectric (TE) cooling to –70 °C |
| Readout Architecture | Dual-amplifier selectable for low-noise or high-dynamic-range mode |
| Software Support | LightField v8.x, PICAM SDK, LabVIEW® and MATLAB® integration |
| Compliance | ASTM E1316, ISO/IEC 17025-compatible operation, FDA 21 CFR Part 11-ready audit trail (via LightField) |
| Brand | BosinTech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | FD-25 |
| Pricing | Available Upon Request |
| Brand | Pulstec |
|---|---|
| Origin | Japan |
| Model | s-Laue/m-Laue |
| X-ray Source | Tungsten anode |
| Voltage/Current | 30 kV / 1.6 mA |
| Cooling | Air-cooled |
| Irradiation Spot Size | φ0.8 mm (standard collimator) |
| Sample-to-Detector Distance | 33 mm |
| Typical Exposure Time | 15 s |
| Sample Stage | 6-axis (Θ, translation, radial, X, Y, Z) |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Max. Power Consumption | 150 W |
| Safety | Integrated door interlock |
| Dimensions (s-Laue) | 224 × 414 × 480 mm |
| Dimensions (m-Laue) | 800 × 600 × 600 mm |
| XY Translation Stage | Included on m-Laue only |
| Brand | RapidXAFS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Model | RapidXAFS 1M |
| Price Range | USD 420,000 – 700,000 |
| X-ray Source Power | 1.6 kW & 3.0 kW |
| Monochromatic X-ray Photon Flux | 1,000,000 photons/s/eV |
| Minimum Detectable Elemental Concentration | 1 wt% |
| Tunable X-ray Absorption Energy Range | 4.5 keV – 15 keV (extendable) |
| Brand | RapidXAFS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | RapidXAFS 2M |
| Price Range | USD 700,000 – 1,400,000 |
| X-ray Source Power | 1.6 kW & 3.0 kW |
| Monochromatic X-ray Photon Flux | > 2,000,000 photons/s/eV at 8 keV |
| Minimum Detectable Elemental Concentration | 0.5 wt% (on CN-supported matrix) |
| Tunable X-ray Absorption Energy Range | 4.5 keV – 20 keV |
| Brand | RapidXAFS (Anhui Absorption Spectrometer) |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic |
| Model | RapidXAFS In Situ Cell |
| Price Range | USD 280,000–420,000 |
| X-ray Source Power | ≤100 W |
| Minimum Detectable Elemental Concentration | 1 wt% |
| X-ray Absorption Energy Range | 2.5–5 keV |
| XAFS Spectrum Acquisition Speed | 1 spectrum/s |
| Brand | RapidXAFS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | RapidXAFS Emission Spectrometer |
| Price Range | USD 390,000 – 490,000 |
| X-ray Source Power | ≤100 W |
| Minimum Detectable Elemental Content | ≤1 wt% |
| Tunable X-ray Absorption Energy Range | 2.5–5 keV |
| Fluorescence Detection Energy Range | 5–15 keV |
| Detectable Edges | 3d transition metal K-edges, 5d transition metal L-edges, actinide L-edges |
| Energy Resolution | ≤1.5 eV @ Cu Kα |
| Detector Efficiency | ≥1×10¹¹ counts per photon |
| Spectral Reproducibility | Energy drift <50 meV across repeated scans |
| Ambient Control | Helium-purged measurement chamber |
| Monochromator | High-purity Si or Ge single-crystal analyzer |
| In Situ Capability | Modular reaction cells for high/low temperature, multiphase catalysis, electrocatalysis, and operando studies |
| Data Acquisition | Real-time XES spectral output during acquisition |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Micro-Z |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 40 W |
| Elemental Range | S (Sulfur) |
| Compliance | ASTM D2622, ISO 20884, JIS K 2541-7 |
| Cooling | Air-cooled (no water or gas required) |
| Power Supply | 220 V AC, 2 A |
| Sample Preparation | None required |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Mini-Z |
| Detection Principle | Wavelength Dispersive X-Ray Fluorescence (WDXRF) |
| Sample Throughput | 6-position automated sample changer |
| Power Requirement | 220 V AC, 2 A |
| Dimensions | 640 × 580 × 580 mm (W × D × H) |
| Weight | 65 kg |
| Detection Limit for S | 0.3 ppm |
| Precision (S at 10 ppm in gasoline) | σ = 0.17 ppm |
| S Quantification Range | 1 ppm – 4 wt% |
| Compliant Standards | ASTM D2622, ISO 20884, JIS K2541-7 |
| Cooling | Air-cooled (no water or gas required) |
| Operation Interface | Touchscreen control panel |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Miniflex 600 |
| X-ray Tube Power | 600 W |
| Dimensions (W×H×D) | 560 × 700 × 395 mm |
| Weight | 80 kg |
| Goniometer Accuracy | ±0.01° 2θ |
| Safety | Interlocked X-ray shutter with automatic beam cutoff during sample loading |
| Detector | Standard scintillation counter |
| Sample Stage | Manual stage standard |
| Software Suite | PDXL (with ICDD PDF-4+ database), Qualitative & Quantitative Analysis modules, Multi-scan acquisition, Dust-specific quantification (e.g., respirable crystalline silica per ISO 16258-1, NIOSH 7500) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex600 |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | 0.0001 kW |
| Dimensions | 560 W × 460 D × 700 H mm |
| Detector Type | Advanced Semiconductor Detector |
| Software Suite | PDXL (Phase Identification, Quantitative Analysis, Rietveld Refinement, Crystal Structure Visualization) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Primus |
| Pricing | Upon Request |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix15 |
| Instrument Type | Simultaneous Multi-Channel WDXRF |
| X-ray Tube Power | 4 kW |
| Elemental Range | Beryllium (Be, Z=4) to Uranium (U, Z=92) |
| Simultaneous Channels | Up to 40 elements |
| Detector System | High-speed pulse-height-analyzed proportional counters with background subtraction circuitry |
| Vacuum System | Dual-stage vacuum pump with auto-stabilized vacuum control |
| Software | Multi-tasking, multi-window FP (Fundamental Parameters) quantification software with Chinese GUI (localized for operator interface only) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Model | SmartLab |
| X-ray Source | 3 kW or 9 kW sealed-tube generator |
| Anode Materials | Cu, Cr, Fe, Co, Ni, Mo, Ag, Au (selectable) |
| Goniometer Radius | 300 mm |
| Detector | HyPix-3000 2D pixel array detector |
| Optics | CBO-Auto (automated beam optics switching) and CBO-μ (high-resolution micro-beam optics) |
| Primary Source | PhotonMax high-brilliance X-ray tube |
| Software | SmartLab Studio II (with in-situ analysis modules) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Model | SmartLab SE |
| X-ray Generator Power | 3 kW |
| Goniometer Radius Options | 185 mm (standard), 285 mm (optional), 280 mm (TTR configuration) |
| Optical Configurations | Automated切换 between Bragg-Brentano (focused beam) and parallel-beam geometries |
| Detector | Rigaku HyPix-400 or equivalent high-speed 2D photon-counting detector |
| Safety Enclosure | Interlocked, fail-safe shutter-equipped X-ray housing |
| Goniometer Orientation | Horizontal |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini200 |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 200 W |
| Elemental Range | O (8) to U (92) |
| Cooling | Air-cooled (no liquid nitrogen or external water cooling required) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus II |
| Excitation Source | End-window Rh-target X-ray tube (3 kW or 4 kW) |
| High-voltage Generator | High-frequency inverter type |
| Max. Output | 60 kV / 150 mA (4 kW) |
| Stability | ±0.005% (against ±10% AC line fluctuation) |
| Cooling | Integrated water-cooling system |
| Sample Changer Capacity | Up to 48 positions |
| Sample Dimensions | Ø51 mm × 40 mm (H) |
| Analyzed Area | Up to Ø35 mm |
| Sample Rotation | 30 rpm |
| Primary Beam Filters | Al, Ti, Cu, Zr (4-position auto-switch) |
| Collimators | 6 automatic apertures (Ø35, 30, 20, 10, 1, 0.5 mm) |
| Divergence Slits | 3 types (standard, high-resolution, ultra-light-element option) |
| Receiving Slits | SC and F-PC compatible |
| Goniometer | Independent θ–2θ drive |
| Angular Range | SC: 5°–118°, F-PC: 13°–148° |
| Max. Scan Speed | 1400°/min (2θ) |
| Continuous Scan Rate | 0.1–240°/min |
| Crystal Changer | 10-position auto-exchange |
| Standard Crystals | LiF(200), Ge, PET, RX25 |
| Optional Crystals | LiF(220), RX4, RX9, RX35–RX80, RX61F, TAP |
| Vacuum System | Dual-chamber rapid evacuation (dual-pump configuration) |
| Detectors | SC scintillation counter (1000 kcps linearity) for heavy elements |
| Pulse Height Analyzer (PHA) | Auto-adjustment (PAS, Rigaku patent) |
| F-PC Anode Wire Cleaning | Automatic thermal cleaning (ACC, Rigaku patent) |
| Optional Accessories | He purge module (with baffle), temperature-controlled sample stage (36.5 °C), CCD-based micro-imaging (100 µm resolution, 0.5 mm micro-area analysis & mapping), r-θ sample stage (Rigaku patent) |
| Software | NEW SQX (qualitative ID, background subtraction, smoothing, peak deconvolution, calibration curve method per JIS, matrix correction, standardless quantification, EZ-scan templates, auto-aperture selection, precision testing, email reporting, multi-standard management) |
| Compliance | Designed for GLP/GMP environments |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | ZSX Primus IV |
| Price Range | USD 210,000 – 280,000 (FOB Yokohama) |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 4 kW |
| Elemental Coverage | Beryllium (Be, Z=4) to Curium (Cm, Z=96) |
| Brand | Semicircle-Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM/ODM Producer |
| Model | DPAE-VSDD-Pro |
| Detection Area | 20 mm² / 30 mm² / 50 mm² (selectable) |
| Thickness | 450 µm |
| Energy Resolution | 125–140 eV FWHM @ 5.9 keV (⁵⁵Fe) |
| Peak Time | 1 µs (max cooling) |
| Count Rate Capability | up to 2,000 kcps |
| Peak-to-Background Ratio | 15,000:1 |
| Window Options | 1 µm graphene or 8 µm beryllium |
| Ultimate Vacuum | 10⁻⁷ Torr |
| Operating Temperature Range | 0–50 °C |
| Storage Conditions | –10–30 °C, 10–90% RH (non-condensing) |
| Power Supply | 4.5–9 VDC |
| Gain Stability | <20 ppm/°C |
| Interface Options | USB 2.0, RS-232, Ethernet |
| Cooling | Peltier-based, cryogen-free |
| Warranty | 12 months |
| Expected Service Life | 5–10 years under standard lab use |
| Brand | Semicircle-Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Model | TUB0011-CS1B/2B |
| Max Anode Voltage | 50 kV |
| Max Anode Current | 1 mA |
| Max Power | 50 W |
| Focal Spot Size | 1.0 × 1.0 mm (CS1B) / 0.1 × 0.1 mm (CS2B) |
| Filament Current | ≈1.7 A @ 50 kV/1 mA |
| Filament Voltage | ≈2.0 V |
| X-ray Exit Angle | 17° |
| Anode Target Materials | W, Rh, Mo, Ag, Cu (customizable) |
| Beryllium Window Thickness | 125 µm or 200 µm (selectable) |
| Electrical Configuration | Anode at positive high voltage, cathode grounded |
| Cooling Method | Forced-air cooling (>150 CFM), max housing temperature ≤55 °C |
| Weight | 2.5 kg |
| Brand | Haoyuan |
|---|---|
| Origin | Jilin, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | XAFS2300+ |
| X-ray Source Power (XAFS mode) | 3 kW |
| X-ray Source Power (XES mode) | 50 W |
| Monochromatic Photon Flux | > 2 × 10⁶ photons/sec (at 7–9 keV) |
| Minimum Detectable Elemental Concentration | ≥ 1 wt% |
| Tunable X-ray Absorption Energy Range | 4.5–25 keV |
| Energy Resolution | 0.5–3 eV |
| Energy Scale Drift Reproducibility | < 50 meV per measurement session |
| Monochromator Architecture | Spherical-bent crystal on high-precision Rowland-circle geometry |
| Detector | High-resolution silicon drift detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | ALTRACE |
| Configuration | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (PRC) |
| Model | EDX-7200 |
| Configuration | Benchtop or Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantitative Concentration Range | 0.1 ppm – 100 wt% |
| Energy Resolution | ≤140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under standardized conditions) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-8100 |
| Configuration | Benchtop & Floor-Standing Options |
| Application Scope | General-Purpose Elemental Analysis |
| Elemental Range | C (Z=6) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability | <0.1% RSD (Relative Standard Deviation) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-LE |
| Configuration | Benchtop / Floor-standing |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (EDXRF) |
| Sample Forms | Solid, Liquid, Powder |
| Elemental Range | Al (13) to U (92) |
| Sample Chamber Dimensions | Max. W370 mm × D320 mm × H155 mm |
| Detector | Peltier-cooled Si-PIN Semiconductor Detector |
| Primary Beam Filters | 5-position automatic filter changer + OPEN position |
| Analysis Modes | Screening, Qualitative, Quantitative |
| Regulatory Compliance Focus | RoHS Directive (EU 2011/65/EU), ELV Directive (2000/53/EC), China RoHS II (SJ/T 11364-2014) |