X-Ray Instruments
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| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor & Engineering Service Provider |
| Regional Classification | Domestic (PRC) |
| Model | Fully Custom-Engineered |
| Pricing | Upon Technical Specification Review |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor & System Integrator |
| Product Category | Domestic (PRC-Made) |
| Model | Custom-Engineered X-Ray Instrument Systems |
| Pricing | Available Upon Technical Consultation |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Customizable DAC |
| Pricing | Available Upon Request |
| Maximum Pressure | Up to 300 GPa (under proper operation and calibration) |
| Symmetric Configuration | Standard |
| High-Temperature Capability | Custom-integrated |
| Maximum Diffraction Angle | ≥50° |
| Alignment Precision | ≤3 µm |
| Interference Fringe Count (Post-Alignment) | ≤1.5 fringes |
| Dual-Function Compatibility | Simultaneous high-pressure and electrical transport measurements |
| Brand | GKinst |
|---|---|
| Model | GK-BSD Series |
| Material | Cu-Pb Composite |
| Diameter Range | 1.5–10 mm |
| Rod Diameter | 4 mm |
| Rod Length | 200 mm (customizable) |
| Compliance | ISO 17025-aligned installation practices |
| Mounting | Standard M4 threaded stem |
| Radiation Attenuation | Optimized for Cu Kα (8.04 keV) and Mo Kα (17.48 keV) X-ray sources |
| Brand | GKinst |
|---|---|
| Model | GK-DHS600 |
| Temperature Range | −195 °C to +600 °C |
| Diffraction Angle Coverage | 0°–164° |
| Chamber Type | Hermetic Sealed (Optional Vacuum Upgrade to 1 Pa) |
| Sample Stage Dimensions | 25 mm × 25 mm |
| Viewing Window Material | Kapton Polyimide Film |
| Origin | Anhui, China |
| Brand | GKinst |
|---|---|
| Model | GK-DLS-01 |
| Laser Wavelength | 633 ± 0.5 nm |
| Output Power | > 30 mW |
| Power Stability | < 0.5% |
| Spectral Linewidth | < 0.03 nm |
| Coherence Length | > 1 m |
| Detector Type | APD |
| Photosensitive Area | Φ0.5 mm |
| Spectral Response Range | 400–800 nm |
| Measurement Principle | Dynamic Light Scattering (DLS) |
| Molecular Weight Range | 10³–10⁸ g/mol |
| Hydrodynamic Diameter Range | 0.3 nm – 10 μm |
| Minimum Sample Volume | ≥ 0.5 μL |
| Origin | Anhui, China |
| Instrument Type | Benchtop DLS System |
| Brand | GKInst |
|---|---|
| Model | GK-GTS500/200/20 |
| Force Range | 0–500 N / 0–200 N / 0–20 N |
| Force Resolution | 0.01 N |
| Max. Extension | 80 mm |
| Displacement Resolution | 0.01 mm |
| Displacement Speed | 1–1000 µm/s |
| Force Control Modes | Constant Velocity, Constant Load, Position Hold, Jog, Cyclic Loading |
| Vacuum Compatibility | Customizable for Ultra-High Vacuum (≤10⁻⁵ Pa) |
| Brand | GKinst |
|---|---|
| Model | GK-TB01 |
| Construction Material | Stainless Steel |
| Coating Width Range | 15–25 mm (Default: 25 mm) |
| Doctor Blade Gap (Shim Thickness) | 100 µm |
| Stage Temperature Range | Up to 100 °C |
| Maximum Translation Stroke | 100 mm |
| Stage Velocity Range | 100 µm/s – 50 mm/s |
| Stage Flatness | <20 µm |
| Stage Surface Roughness | 3 µm |
| Maximum Substrate Thickness | 20 mm |
| Pump Integration | High-Precision Syringe Pump Compatible |
| Application Scope | R&D, Process Optimization, Ink Formulation, Small-Batch Film Fabrication |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | HPXRD |
| Configuration | Floor-Standing |
| X-ray Source | Liquid-Metal In Target (E1 Type) |
| High-Flux Mode | 90 μm focal spot, 1.9 × 10⁸ ph/s, divergence 3.15 mrad |
| Micro-Focus Mode | 15 μm focal spot, 1.8 × 10⁷ ph/s, divergence 12.6 mrad |
| Ultra-Micro Mode | 10 μm focal spot, 1.0 × 10⁶ ph/s, divergence 2 mrad |
| XY Stage Repeatability | ±0.2 μm, travel ±10 mm |
| Z Stage Repeatability | ±0.2 μm, travel ±10 mm |
| φ Axis Repeatability | 0.002°, travel ±135° |
| X₁Y₁ Stage Repeatability | ±0.2 μm, travel ±12.5 mm |
| Brand | GKInst |
|---|---|
| Model | LaScater 1.0 |
| Origin | Anhui, China |
| Instrument Type | Integrated SAS System |
| Laser Wavelength Range | 390–780 nm |
| Laser Power | 1–100 W (continuously adjustable) |
| Power Stability | < 1% RMS |
| Beam Divergence | < 0.015° |
| Sample Stage Travel (X/Y) | ±75 mm |
| Z-Travel | ±10 mm |
| Positioning Accuracy | 1 µm |
| Angular Axes (β/γ) | ±7.5°, Resolution: 0.001° |
| Rotational Axis (α) | 360°, Resolution: 0.001° |
| Detector | CCD/CMOS hybrid sensor |
| Pixel Size | 10 µm × 10 µm |
| SNR | >40 dB |
| Peak Quantum Efficiency | 0.65 A/W |
| Frame Rate (high-speed mode) | up to 60 fps |
| Cooling | Peltier-based thermoelectric cooling for low-noise acquisition |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | LFocus |
| Pricing | Available Upon Request |
| Target Applications | XRD, XRF |
| Anode Materials | Mo, Cu, W, Ag, Cr, Co, Fe, Ti |
| Tube Voltage Range | 20–60 kV |
| Tube Current Range | 5–40 mA |
| Max Power Output | 0.4–3.0 kW (material-dependent) |
| Beam Geometry | Linear focal spot (line focus) |
| Protection Features | Overvoltage, Overcurrent, Overpower shutdown |
| Thermal Management | Adaptive preheat algorithm based on idle time |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MFocus |
| Pricing | Available Upon Request |
| Maximum Tube Voltage | 50–65 kV |
| Maximum Power | 30–200 W |
| Focal Spot Size | 10–70 µm |
| Beam Divergence Angle | 10°–18° |
| Anode Target Materials | Cu, Mo, Ag, W |
| Integrated Features | Active Liquid Cooling System, Motorized X-ray Shutter, Dual-Color (Red/Green) Status Indicator, Hardware Safety Interlock Circuit |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | SAXSFocus |
| Price Range | USD 420,000 – 1,120,000 |
| Instrument Type | Small-Angle X-ray Scattering (SAXS) System |
| Measurement Dynamic Range | 32-bit, 1 × 10⁷ photons/s/pixel |
| Brand | GKinst |
|---|---|
| Model | GK-THMS600V |
| Temperature Range | −195 °C to +600 °C |
| Max. Heating Rate | 180 °C/min (customizable) |
| Temperature Resolution | 0.1 °C |
| Temperature Stability | <0.1 °C |
| Compatibility | Optical Microscopes, Raman Spectrometers, FTIR Microscopy Systems, UV-Vis Microspectrophotometers |
| Brand | GKinst |
|---|---|
| Model | GK-TST350V |
| Force Range | 0–500 N / 0–200 N / 0–20 N |
| Force Resolution | 0.01 N |
| Max. Extension | 80 mm |
| Displacement Resolution | 0.01 mm |
| Displacement Speed | 1–1000 µm/s |
| Force Control Modes | Constant Velocity, Constant Force, Position Hold, Jog, Cyclic Loading |
| Vacuum Compatibility | Customizable for Ultra-High Vacuum (≤1×10⁻⁵ Pa) |
| Temperature Range | –195 °C to +350 °C |
| Origin | Anhui, China |
| Brand | GKINST |
|---|---|
| Model | Customizable DAC Gas Loading System |
| Max Operating Pressure | 200 MPa |
| Compatible Gases | He, Ne, Ar, N₂, CH₄, H₂ (O₂ excluded) |
| DAC Compatibility | Modular Design for Standard & Custom DACs |
| Origin | Anhui, China |
| Supplier Type | Authorized Distributor |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | X-Ray Reflective Mirror |
| Pricing | Available Upon Request |
| Focal Length | 110 mm |
| Optimized Energies | 8.0 keV (Cu Kα), 17.24 keV (Mo Kα) |
| Output Beam Divergence | ΔΦ ≤ 0.4 mrad |
| Reflectivity | ≥ 65% (integrated, at optimized energy) |
| Dimensions (L × W × H) | 100 mm × 40 mm × 30 mm (custom sizes available) |
| Brand | GKINST |
|---|---|
| Model | XMS-P15-AP-Ta5 |
| Aperture Diameter | 10 mm |
| X-ray Energy Range | 12–30 keV |
| Operating Temperature | 10–50 °C |
| Control Interface | 6-pin aviation connector |
| Drive Voltage/Current | ≤30 V, ≤2 A |
| Supply Voltage | 18 VDC |
| Dimensions (L×W×H) | 200 × 70 × 34 mm |
| Weight | 0.6 kg |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | APD 2000 PRO |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Tube Power | 0.0001 kW (100 W) |
| Radiation Source | Fine-focus Ceramic X-ray Tube |
| Monochromator | Johannson-type Kα₁ monochromator |
| Detector Types | Scintillation Counter & Energy-Dispersive Detector |
| Goniometer Control | Optical Encoder |
| Sample Stage | Motorized Multi-Sample Rotating Stage with Low-Background Options |
| Safety System | Dual Redundant Interlock Circuit |
| Compliance | CE, IEC 61010-1, ISO 9001 |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | AreX D |
| X-ray Source | 50 W Mo microfocus tube with Zr filter |
| Cooling | Air-cooled |
| Detection | High-resolution USB camera for precise sample positioning |
| Safety | Interlocked X-ray shielding system |
| Measurable Diffraction Peaks | Austenite (220), (311) |
| Measurement Time | < 3 minutes per sample |
| Compliance | ASTM E975-22 Standard |
| Minimum Detectable Austenite Content | 0.5 vol% |
| Sample Compatibility | Flat, polished metallic specimens (steel, stainless steel, tool steels, bearing alloys) |
| Software | Integrated Windows-based analysis suite with peak integration, phase quantification, and report generation |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | AREX L |
| Compliance | ASTM E975 |
| Measurement Principle | X-ray Diffraction (XRD) |
| Detection Limit | ≤0.5% austenite |
| Target Material | Ferrous alloys (steel, cast iron, heat-treated components) |
| X-ray Source | High-power ceramic X-ray tube |
| Optics | High-focus single-capillary collimator |
| Detector | High-resolution CCD detector |
| Stability Control | Precision closed-loop feedback circuit for HV/current regulation |
| Data Acquisition | Multi-peak intensity ratio analysis (austenite {220}, {311} / ferrite {200}, {211}) |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | EDGE |
| Compliance | ASTM E915, EN 15305 |
| Detector | Linear silicon strip detector with single-photon counting technology |
| Cooling | Air-cooled |
| X-ray Source | Interchangeable microfocus X-ray tubes |
| Fluorescence Suppression | Integrated X-ray fluorescence rejection |
| Measurement Time | Minutes per point (vs. hours for conventional systems) |
| Portability | Fully integrated into carry-on compliant transport case |
| Safety Options | Optional radiation shielding enclosure for benchtop operation |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | EXPLORER |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | 0.0001 kW |
| Optical Configuration | Switchable Bragg-Brentano focusing / Johansson monochromator / Parabolic mirror monochromator |
| Beam Geometry | Parallel-beam optics with low-angle reflection capability |
| Thin-film Thickness Detection Range | 1–500 nm |
| Degrees of Freedom for Sample Manipulation | 5 |
| Modular Units | 7 |
| Primary Applications | Phase identification & quantification, crystallite size and microstrain analysis, residual stress measurement, texture analysis, thin-film characterization, depth profiling, nanocrystalline material assessment |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | HORIZON |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | Na (11) to Pu (94) |
| Quantification Range | 10 pg – 100% |
| Energy Resolution | 124 eV (at Mn Kα) |
| Repeatability | ≤ 0.1% RSD |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | MagStress5c |
| Measurement Principle | Magnetic Barkhausen Noise (MBN) |
| Sample Type | Ferromagnetic Metals (e.g., carbon steel, alloy steel, cast iron) |
| Portability | Integrated battery-powered handheld system with touch-screen interface and USB connectivity |
| Output | Quantitative residual stress in MPa, graphical trend visualization, calibration curve support |
| Compliance Context | Designed for field-deployable non-destructive evaluation (NDE) in accordance with ASTM E1447, ISO 20956, and EN 10328 guidelines for magnetic methods of stress assessment |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | STRESS-X |
| Compliance | ASTM E915, EN 15305 |
| Motion System | 6-axis robotic arm |
| Deployment Options | Benchtop shielded enclosure or mobile four-wheel alloy cart |
| Measurement Principle | Sin²ψ X-ray diffraction (XRD) |
| Application Scope | Non-destructive residual stress mapping on metallic components |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | TX 2000 |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | Na (11) to Pu (94) |
| Quantification Range | 10 pg – 100% |
| Energy Resolution | 124 eV (at Mn Kα) |
| Repeatability | 0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Excitation Source | Switchable Mo/W anode X-ray tube |
| Angular Control | High-precision optical encoder stepper motor |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Model | VGHS200 |
| Maximum Temperature | 200 °C |
| Minimum Temperature | Room Temperature (RT) |
| Max. Heating Rate | 30 °C/min |
| Temperature Stability | < 0.5 °C |
| Temperature Resolution | 0.1 °C |
| Temperature Sensor | PT100 Platinum Resistance Thermometer |
| Temperature Control | PID Dynamic Regulation |
| Application Domain | In-situ XRD for Materials Science, Semiconductor Characterization, Battery Research, Pharmaceutical Solid-State Analysis, and Mineralogical Studies |
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | C4575-03 |
| Pricing | Upon Request |
| Spectral Response Range | 10 eV to 10 keV |
| Temporal Resolution | < 0.5 ps (FWHM, calculated) |
| Sweep Repetition Rate | Single-shot to 100 Hz max |
| Dynamic Range | > 1:10 |
| Sweep Duration | 35 ps to 2 ns |
| Effective Photocathode Length | 8.6 mm |
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | FOS Series |
| Pricing | Available Upon Request |
| Scintillator Material | Thallium-doped Cesium Iodide (CsI:Tl) |
| Substrate | Fiber Optic Plate (FOP) |
| Standard Thickness | 150 µm |
| Available Formats | Rectangular and Circular Configurations |
| Effective Area Range | 15 × 15 mm to 47 × 47 mm |
| Optical Coupling | Direct fiber-optic coupling to CCD/CMOS sensors |
| Spectral Emission Peak | ~550 nm (matches silicon-based detector quantum efficiency) |