X-Ray Instruments
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Showing 211–240 of 786 results
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XMS |
| Form Factor | Benchtop / Floor-Standing |
| Application Type | General-Purpose |
| Elemental Range | Mg (Z=12) to U (Z=92) |
| Quantitative Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (at Mn Kα, −20 °C) |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Powder X-ray Diffractometer |
| Model | JV QC3 |
| Application Focus | Compound Semiconductor Epitaxial Layer & Substrate QC |
| Automation Level | Fully Automated Wafer Handling (Optional Robotic Arm) |
| Sample Capacity | Up to 4 × 100 mm wafers per batch |
| Compliance | Designed for ISO/IEC 17025-aligned semiconductor manufacturing environments |
| Software Platform | Bruker JV-RADS (Bede RADS) with automated peak fitting, strain/relaxation quantification, and multi-layer compositional analysis |
| X-ray Source Protection | XRG Protect™ tube longevity technology |
| Power Mode | Eco-standby with reduced idle power consumption |
| Brand | COX Analytical Systems |
|---|---|
| Origin | Sweden |
| Model | Itrax XRF |
| Configuration | Benchtop/Floor-standing |
| Application Domain | Geological & Sediment Core Analysis |
| Elemental Range | Na (11) – U (92) |
| Detection Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | D-POWER |
| Price Range | USD 42,000 – 210,000 |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Rating | 3 kW |
| Angular Accuracy | 0.0001° |
| Brand | GKINST |
|---|---|
| Model | DAC-HTP700 |
| Origin | Anhui, China |
| Press Type | BX90 (optional) |
| Press Material | Inconel 718 superalloy |
| Temperature Range | RT to 700 °C |
| Temperature Control Accuracy | ±1 °C |
| DAC Components | Tungsten Carbide gasket, Type-Ia diamond anvils |
| Temperature Regulation | PID dynamic feedback control |
| Thermocouple | K-type |
| Vacuum Chamber Leak Rate | <1×10⁻⁸ Pa·L/s |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | DDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W Air-Cooled Cu Anode Tube |
| Scan Speed | Up to 200× Faster Than Conventional θ-Scanning |
| Orientation Measurement Time | Full 3D Lattice Orientation Determined in ≤10 s |
| Angular Resolution | ≤0.01° (0.01 degree) |
| Sample Capacity | Wafers 2–12 inches |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, compatible with GLP/GMP documentation workflows |
| Brand | DECTRIS |
|---|---|
| Origin | Switzerland |
| Model | EIGER2 R |
| Detector Module Count | 1 / 2 / 4 |
| Active Area (W×H) | 77.2×38.6 mm² / 77.1×79.7 mm² / 155.1×162.2 mm² |
| Pixel Size | 75×75 µm² |
| Point Spread Function | 1 pixel |
| Energy Thresholds | 2 |
| Threshold Range | 3.5–30 keV |
| Maximum Count Rate | 6.9×10⁸ cps/mm² |
| Counter Depth | 2×16 bit per threshold |
| Frame Rate | 50 / 100 / 20 Hz |
| Readout Mode | Simultaneous read/write, zero dead time |
| Image Bit Depth | 32 bit |
| Vacuum Compatibility | Optional |
| Cooling | Air / Water / Water |
| Dimensions (W×H×D) | 100×140×93 mm³ / 114×133×240 mm³ / 235×235×372 mm³ |
| Weight | 1.8 / 4.7 / 15 kg |
| Brand | Dexela |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | CMOS X-ray Camera |
| Pricing | Upon Request |
| Effective Area | 114.9 × 64.6 mm |
| Resolution | 1536 × 864 pixels |
| Pixel Size | 74.8 µm (1×1), 149.6 µm (2×2), 299.2 µm (4×4) |
| Frame Rate | Up to 65 fps at full resolution (Camera Link) |
| MTF @ 6 lp/mm | >20% (with 150 µm high-resolution CsI scintillator, no binning) |
| DQE | ~0.7 at 0.5 lp/mm (28 kV, W/Al filtration) |
| Binning Modes | 1×1, 1×2, 2×2, 1×4, 2×4, 4×4 |
| Dynamic Range | 6400:1 (low-noise mode), 2400:1 (high-dynamic-range mode) |
| ADC Resolution | 14-bit |
| Interface | Camera Link or Gigabit Ethernet |
| Max. X-ray Energy | Standard ≤220 kV |
| Scintillator Options | Gd₂O₂S (Gadox) or columnar CsI, thickness customizable per application |
| Dimensions | 241 × 150 × 42 mm |
| Weight | 1.9 kg |
| Brand | Dongxi Analysis |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | XD-8010 |
| Form Factor | Benchtop/Floor-standing |
| Industry Application | Geological & Mineralogical Analysis |
| Elemental Range | S (Z=16) to U (Z=92) |
| Quantification Range | ppm to wt% |
| Filter Options | 15-position automatic filter wheel |
| Beam Diameter | 1–7 mm adjustable |
| Sample Chamber | Large-volume, non-destructive chamber |
| Software | Integrated EDXRF workstation with real-time video imaging, report customization (PDF/Excel), spectral comparison, and GLP-compliant data archiving |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Custom-Engineered DAC Dynamic Actuation System |
| Pricing | Available Upon Technical Inquiry |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | Custom-Engineered System |
| Pricing | Available Upon Request |
| Brand | easyXAFS |
|---|---|
| Origin | USA |
| Model | XAFS300 / XAFS300+ |
| X-ray Source Power | XAFS mode: 2500 W |
| XES mode | 100 W |
| Monochromatic X-ray Flux | 3–4 × 10⁶ photons/sec |
| Elemental Energy Range | 4.5–25 keV |
| Energy Resolution | 0.5–1.5 eV |
| Testable Elements | ~70 elements |
| Brand | easyXAFS |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | XES150 |
| X-ray Source Power | XAFS Mode: 1.2 kW (Mo/W anode, for XRD-compatible operation) |
| XES Mode | 100 W (Pd/W anode, air-cooled microfocus tube) |
| Monochromatic X-ray Flux | XAFS: 300,000–500,000 photons/s (7–9 keV) |
| XES | 100,000–150,000 photons/s (7–9 keV) |
| Minimum Detectable Elemental Concentration | 0.1 wt% |
| Tunable X-ray Absorption Energy Range | 4.9–20.5 keV |
| XAFS Scan Speed | 0.1–2.0 eV/s |
| Brand | GKINST |
|---|---|
| Model | EC120 |
| Temperature Range | –50 °C to +120 °C |
| Max. Heating/Cooling Rate | 30 °C/min |
| Temp. Stability | < 0.05 °C |
| Temp. Resolution | 0.01 °C |
| Sensor | PT100 Platinum Resistance Thermometer |
| Control Algorithm | PID Dynamic Regulation |
| Compatibility | Liquid-phase electrochemical cells (e.g., coin-cell, pouch-cell, fuel cell configurations) |
| Compliance | Designed for integration with X-ray diffractometers (XRD), synchrotron beamlines, and in situ/operando electrochemical characterization platforms |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Model | EC150 |
| Temperature Range | −50 °C to +150 °C |
| Max. Heating/Cooling Rate | 30 °C/min |
| Temp. Stability | < 0.05 °C |
| Temp. Resolution | 0.01 °C |
| Sensor | PT100 Platinum Resistance Thermometer |
| Control Algorithm | PID Dynamic Regulation |
| Compliance | Designed for ASTM D3418, ISO 11357, and IEC 62660-2 thermal cycling protocols in electrochemical cell characterization |
| [Origin | Beijing, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (PRC) |
| Model | EDX 2800B |
| Form Factor | Benchtop / Floor-Standing |
| Industry-Specific Use | Electronics Manufacturing & QC |
| Elemental Range | S (16) to U (92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | 149 ± 5 eV (at Mn Kα) |
| Repeatability (RSD) | ≤ 0.1% for major elements |
| Measurement Time | 100–300 s per sample |
| Operating Temperature | 15–30 °C |
| Relative Humidity | 40–50% RH |
| Power Supply | AC 220 V ± 5 V, 50/60 Hz |
| Detector | Si-PIN semiconductor, Peltier-cooled |
| X-ray Tube | 50 kV max, 1 mA max, air-cooled, 50 W nominal |
| Multichannel Analyzer | 2048-channel MCA with digital pulse processing |
| Collimator Options | 8 automatic sizes (0.2–8 mm Ø) |
| Filter Options | 6 programmable primary beam filters |
| Calibration | Auto-curve selection, matrix-matched standards included |
| Software | XRAYAnalyzer v3.x, compliant with GLP data integrity requirements] |
| Brand | ELDICO Scientific AG |
|---|---|
| Origin | Switzerland |
| Model | ED-1 |
| Instrument Type | Single-Crystal Electron Diffractometer |
| Sample Size Range | < 1000 nm |
| Beam Energy | 160 keV |
| Detector | DECTRIS QUADRO |
| Angular Precision | Sub-micrometer five-axis goniometer |
| Resolution | 0.82 Å |
| Chamber Geometry | Octagonal sample chamber |
| Brand | ELDICO Scientific AG |
|---|---|
| Origin | Switzerland |
| Model | ED-1 |
| Instrument Type | Single-Crystal Electron Diffractometer |
| Configuration | Floor-Standing |
| Resolution | 0.82 Å |
| Detector | DECTRIS QUADRO |
| Beam Energy | 160 keV |
| Sample Size Range | < 1000 nm |
| Origin | Switzerland |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MED-1 |
| Price | €200,000 |
| Origin | United Kingdom |
|---|---|
| Distribution Model | Authorized Distributor |
| Import Status | Imported |
| Model | sCMOS_4MP |
| Pricing | Available Upon Request |
| Active Area (Single Module) | 22.5 × 22.5 mm to 95.5 × 95.5 mm |
| Multi-Module Array Configurations | 134 × 134 mm, 268 × 67 mm, 191 × 191 mm, 382 × 95.5 mm |
| Scintillator Options | Gd₂O₂S:Tb (1–55 keV), CsI:Tl (20–300 keV) |
| Pixel Array | 2048 × 2048 |
| Pixel Size | 11 × 11 µm |
| Full-Well Capacity | 80,000 e⁻ |
| Read Noise | 1.8 e⁻ rms |
| Dark Current | <1 e⁻/pixel/s |
| Quantum Efficiency (Peak) | 58% @ scintillator emission wavelength (no microlens) |
| Exposure Time Range | 50 µs – 60 s |
| Operating Sensor Temperature | −20 °C (water-cooled) |
| Bit Depth | 16-bit |
| Dynamic Range | 20,000:1 |
| Spatial Resolution | Gd₂O₂S:Tb — 25 lp/mm |
| CsI | Tl — 20 lp/mm |
| Frame Rate | 18 fps (full frame), 4.5 fps (full frame, no binning) |
| Interface | Gigabit Ethernet / GenICam-compliant |
| Brand | ESI |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | EDX9000B PLUS |
| Configuration | Benchtop/Floor-standing |
| Industry-Specific Application | Non-Ferrous Metals |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability (RSD) | ≤0.05% |
| Detector | Peltier-Cooled Fast Silicon Drift Detector (FSDD) |
| Brand | Evident (formerly Olympus) / EVDENT |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | DELTA DPO-2000 |
| Application | Handheld / Portable |
| Industry-Specific Use | Non-Ferrous & Specialty Alloys |
| Elemental Range | Mg to U |
| Quantification Range | ppm to wt% |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability | ≤0.1% RSD |
| Brand | Excillum |
|---|---|
| Origin | Sweden |
| Manufacturer Type | General Distributor |
| Origin Category | Imported |
| Model | Excillum |
| Price | Upon Request |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | XAN-DPP |
| Configuration | Benchtop/Free-standing |
| Excitation Source | Rhodium anode X-ray tube |
| Detector | Peltier-cooled Si-PIN diode (≈ −30 °C) |
| Energy Resolution | 180 eV (Mn Kα) |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Collimators | Motorized, programmable: Ø0.2 mm, Ø0.6 mm, Ø1.0 mm, Ø2.0 mm |
| Measurement Chamber Internal Dimensions (incl. sloped door) | W 318 mm × D 307 mm × H 29–86 mm |
| Usable Height Zone (full-height region) | W 318 mm × D 203 mm × H 86 mm |
| Distance Compensation | Patented DCM (Distance Controlled Measurement) algorithm |
| Calibration | Standardless quantitative analysis enabled via fundamental parameters method |
| Simultaneous Output | Elemental concentration (ppm–wt%) and substrate thickness (µm) |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fischer XUL / XULM / XAN110 / XAN120 / XDL / XDLM / XDAL / XDC-SDD / SDV-U / XDV-Vacuum / X-RAY 4000 / X-RAY 54000 |
| Price | Upon Request |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | XDV-SDD |
| Form Factor | Benchtop |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 100 wt% |
| Energy Resolution | ≤140 eV (Mn Kα) |
| Repeatability | ≤5% RSD |
| Sample Stage | Motorized XYZ with Programmable XY Translation and Z-Axis Lift |
| X-ray Source | Microfocus Tungsten Anode Tube with Beryllium Window |
| High Voltage | 3-step Adjustable (up to 50 kV) |
| Filter Options | 6 Interchangeable Primary Filters |
| Collimators | Motorized, Switchable Apertures |
| Optical Alignment | Integrated HD Video System with 20× Digital Zoom, Crosshair Overlay, and Laser Spot Locator |
| Software Platform | WinFTM® v8.x (FDA 21 CFR Part 11 Compliant, Audit Trail Enabled, GLP/GMP-Ready) |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | MiX5 500 |
| Form Factor | Handheld / Portable |
| Target Materials | Ferrous Alloys |
| Pre-installed Alloy Libraries | AISI, DIN, JIS, GB (1600+ grades) |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | High-Performance Microfocus Tube |
| Display | 4.3-inch Color Touchscreen |
| Weight | 1.5 kg |
| Battery Life | 10–12 hours |
| IP Rating | IP54 |
| Data Storage | Up to 100,000 results with spectra and optional images |
| Output Formats | CSV, PDF |
| Connectivity | USB, Wi-Fi, Bluetooth |
| Compliance Support | GLP/GMP audit trail capability, FDA 21 CFR Part 11–ready software architecture |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MiX5 Pro |
| Form Factor | Handheld / Portable |
| Application Scope | General-Purpose Metal & Alloy Analysis |
| Elemental Range | Mg (12) to U (92) |
| Detection Limits | Sub-ppm to % level (matrix-dependent) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Energy Resolution | ≤145 eV at Mn Kα |
| Repeatability | RSD < 1% for major elements (typical alloy matrix, ≥10 s measurement) |
| Operating Temperature | –10 °C to 50 °C |
| IP Rating | IP54 |
| Battery Life | Up to 12 hours (standard Li-ion pack) |
| Display | 5.5-inch capacitive touchscreen with sunlight-readable brightness |
| Connectivity | Wi-Fi 802.11 a/b/g/n, USB-C, optional integrated 5 MP macro camera |
| Software Compliance | Supports audit trail, user access control, and data export compliant with GLP/GMP documentation requirements |
| Brand | GBC |
|---|---|
| Origin | Australia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Emma |
| Price Range | USD 135,000 – 205,000 (FOB Australia) |
| Instrument Type | Powder X-ray Diffractometer |
| Power Consumption | <0.1 W (standby), <150 W (operational) |
| Beam Geometry | Variable parallel-beam and Bragg–Brentano focusing geometry |
| Sample Stage | Motorized variable-height powder stage + Eulerian cradle (χ, φ, ω rotation) |
| Detector Configuration | Dual fixed-position detectors — one parallel-beam detector with 0.4° Soller slit collimator, one focusing detector with variable slits and graphite monochromator |
| X-ray Source Optics | XOS polycapillary optic delivering 10 × 10 mm quasi-parallel beam |
| parallel-beam radius | 250 mm |
| focusing radius range | 175–250 mm |
| Optional Integrated Detection | Simultaneous XRD/XRF capability via integrated Si-PIN or SDD X-ray fluorescence detector |
| Portability | Modular chassis with integrated handles |
| Goniometer | Harmonic drive-based θ–2θ goniometer with <0.001° angular reproducibility |
| Radiation Safety | Lead-acrylic interlocked viewing window (large-format, wide-field), software-controlled actuation |
| Electronics | Industrial-grade FPGA-based control architecture with GLP-compliant event logging |
| Brand | GKInst (Anhui GK Instrument Co., Ltd.) |
|---|---|
| Origin | Anhui, China |
| Model | AIR-SL-A30 / HV-SL-A30 / UHV-SL-A30 |
| Max Aperture | 30 mm × 30 mm |
| Resolution | 1 µm |
| Repeatability | 1 µm |
| Positioning Accuracy | ±2 µm |
| Blade Material | Tungsten Carbide (2 mm thick) |
| Housing Material | Anodized Aluminum (AIR/HV) / Stainless Steel (UHV) |
| Weight | 3.8 kg / 4.0 kg / 26 kg |
| Motor | Bipolar Stepper Motor |
| Vacuum Compatibility | Up to 10⁻⁵ mbar (AIR), 10⁻⁹ mbar (UHV), customizable to 10⁻⁶ mbar or lower |
| Flange Options | KF, CF (standard CF100), custom |
| Encoder Options | Absolute or Incremental (optional) |
| Customizable Aperture Shape | Rectangular, elliptical, or user-defined profiles |
| Optional Blade Materials | GaAs, Si, Cu, Ge |