X-Ray Instruments
Filter
Showing 211–240 of 261 results
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-LE Plus |
| Configuration | Benchtop/Floor-standing |
| Industry Application | Electronics |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Detection Limit | 0.1 ppm |
| Quantitative Range | 0.1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD (at 100 s counting time, for Cr in stainless steel standard) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EPMA-1720 Series |
| Pricing | Available upon Request |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | EPMA-1720 |
| Analytical Range | Be (4) to U (92) |
| Electron Source | Tungsten (W) filament and Cerium Hexaboride (CeB₆) filament |
| Secondary Electron Image Resolution | 6 nm (W), 5 nm (CeB₆) |
| X-ray Take-off Angle | 52.5° |
| Spectrometer Type | Full-focusing Wavelength Dispersive Spectrometer (WDS) |
| Detector Configuration | High-sensitivity, high-resolution WDS system |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer | Shimadzu Corporation |
| Type | Imported Instrument |
| Model | EPMA-8050G |
| Pricing | Available Upon Request |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | EPMA-8050G |
| Beam Current Range | Up to 1 µA |
| Secondary Electron Resolution | 3 nm at 30 kV |
| X-ray Take-off Angle | 52.5° |
| X-ray Spectrometer | Five-channel, high-sensitivity, high-resolution WDS with full-focus crystals |
| X-ray Element Coverage | Be (4) to U (92) |
| Emission Source | High-brightness Schottky field-emission gun |
| Vacuum Architecture | Dual-stage orifice differential pumping system with ultra-high vacuum (UHV) electron gun chamber |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | LAB CENTER XRF-1800 |
| Pricing | Available Upon Request |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | MXF-2400 |
| Pricing | Available Upon Request |
| Brand | Shimadzu |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Category | Domestic |
| Model | MXF-N3 Plus |
| Price Range | USD 210,000 – 280,000 |
| Instrument Type | Simultaneous Multi-Channel |
| X-ray Tube Power | 3 kW |
| Elemental Range | Na (11) to U (92) |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Model | TableXAFS-3000 |
| X-ray Source Power | 2.0 kW Mo anode with high-performance power supply (optional foreign source upgrade) |
| Monochromatic X-ray Photon Flux | 2.5 × 10⁶ photons/s |
| Minimum Detectable Elemental Concentration | < 0.5 wt% |
| Tunable X-ray Absorption Energy Range | 4.5–20 keV |
| Brand | SPECREATION |
|---|---|
| Model | TableXAFS-500 |
| Origin | Anhui, China |
| X-ray Source Power | 1.2 kW |
| Monochromatic Photon Flux | 500,000–1,000,000 photons/sec @ 9 keV |
| Detectable Elemental Concentration Limit | ≥1 wt% |
| Tunable X-ray Energy Range | 5–20 keV |
| XAFS Scan Speed | 20 eV/min |
| Energy Resolution | 0.5–1.5 eV (near-edge, 7–9 keV) |
| Monochromator Crystal | 100 mm diameter, R = 500 mm spherical Si or Ge bent crystal |
| Detector | Silicon Drift Detector (SDD) |
| Sample Carousel Capacity | 7–16 positions |
| Single-Scan Energy Coverage | >600 eV @ 7–9 keV |
| Brand | SPECREATION |
|---|---|
| Model | TableXES-V2k |
| Origin | Anhui, China |
| Instrument Type | Benchtop XES/XAFS Spectrometer |
| X-ray Source | 1.2 kW Sealed-Tube X-ray Tube (Customizable Anode Material) |
| Energy Range | 4.5–20 keV (Single-scan range >600 eV at 7–9 keV) |
| Energy Resolution | 0.5–1.5 eV (at 7–9 keV, XANES region) |
| Monochromator | Spherical bent crystal (Si or Ge), 100 mm aperture, 500 mm radius |
| Photon Flux | 5×10⁵–1×10⁶ photons/sec @ 9 keV |
| Detector | Silicon Drift Detector (SDD) |
| Sample Carousel | 7–16-position motorized sample wheel |
| Scan Mechanism | High-precision goniometric stage with thermal drift compensation |
| Safety | Interlocked radiation shielding compliant with IEC 61010-1 and GBZ 117-2020 |
| Optional Modes | Fluorescence-detected XAFS (FD-XAFS), Resonant Inelastic X-ray Scattering (RIXS)-compatible XES, In Situ/Operando cell integration |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMIDEX |
| Instrument Type | Benchtop ED-XRF Spectrometer |
| Application Scope | General-purpose elemental analysis, optimized for precious metals |
| Compliance | Designed for ISO/IEC 17025-compliant labs, supports GLP/GMP data integrity requirements |
| Detector | High-resolution silicon drift detector (SDD) with micro-focus X-ray source |
| Measurement Principle | Energy-dispersive X-ray fluorescence (ED-XRF) with polycapillary optic collimation |
| Sample Form | Solid, powdered, or plated samples (non-destructive) |
| Software | SPECTRO XRF Analyzer Suite with audit trail, user-level permissions, and 21 CFR Part 11–ready reporting modules |
| Data Export | CSV, XML, PDF |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO SCOUT |
| Instrument Type | Polarized ED-XRF |
| Configuration | Benchtop/Field-Deployable |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | Rhodium (Rh) anode, up to 50 kV |
| Elemental Range | Na (11) to U (92) |
| Detection Limits | As low as <1 ppm for selected elements |
| Analysis Time | 3–10 min per sample |
| Dimensions | 270 × 306 × 306 mm |
| Weight | 12.75 kg |
| Battery Life | Up to 5 hours continuous operation |
| Sample Chamber | Large-volume, accommodates irregular and bulk samples |
| Calibration | iCAL single-sample standardization in ≤5 minutes |
| Software Interface | Integrated touchscreen with preloaded application packages |
| Optional | Integrated high-resolution camera for sample positioning and image-result correlation |
| Connectivity | USB, Wi-Fi, Ethernet |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO SCOUT |
| Type | Portable, Hybrid (Scanning + Multi-Channel) ED-XRF Spectrometer |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | Rh anode, max. 50 kV |
| Elemental Range | Na (11) to U (92) |
| Spot Size | 1 mm diameter |
| Dimensions (transport) | 270 × 306 × 306 mm |
| Dimensions (operational) | 350 × 306 × 306 mm |
| Weight | 12.0 kg (without battery), 12.75 kg (with battery) |
| Power Supply | 10–30 V DC (integrated Li-ion battery) |
| AC adapter | 90–264 V AC, 50–60 Hz |
| Interface | Integrated touchscreen PC, Bluetooth, Wi-Fi, LAN, USB |
| Software | SPECTRO XRF Analyzer Pro with iCAL (intelligent Calibration) |
| Compliance | Designed for field-deployable GLP-aligned workflows |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROCUBE |
| Configuration | Benchtop/Floor-Standing |
| Elemental Range | Na–U |
| Quantification Range | 0.1 ppm – 99.99% |
| Energy Resolution | 130 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements, n ≥ 10) |
| Detector | Silicon Drift Detector (SDD) |
| Compliance | CE, RoHS, IEC 61000-6-3/6-4 |
| Instrument Class | ED-XRF Spectrometer for Petrochemical QA/QC |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROCUBE (RoHS-Optimized) |
| Configuration | Benchtop/Free-Standing |
| Detector Type | High-Resolution Silicon Drift Detector (SDD) |
| Count Rate Capability | Up to 100,000 cps |
| Elemental Range | Na (11) to U (92) |
| Minimum Detection Limits (MDL) | Sub-ppm to low-ppm range for regulated elements (Pb, Cd, Hg, Cr, Br, Cl, etc.) |
| Compliance Standards | IEC 62321-5:2013, EN 62321-5:2014, ASTM F2853-21, USP <232>/<233>, ISO 17025-accredited operation support |
| Software | SPECTRO XRF Suite with RoHS-specific method templates, audit trail, and 21 CFR Part 11-compliant user management |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | XEPOS Polarized |
| Instrument Type | Polarized ED-XRF |
| Configuration | Benchtop/Floor-standing |
| Regulatory Compliance | CE, RoHS, ISO/IEC 17025 compatible (when operated under GLP/GMP conditions) |
| Software | TurboQuant II with ASTM E1621, ISO 21043, and USP <233> method support |
| Detector | High-resolution silicon drift detector (SDD), >140 eV Mn Kα resolution |
| Excitation Source | Dual-target polarized X-ray tube (Mo/Rh), variable kV/mA control |
| Multi-layer Analysis Capability | Up to 8 layers, 55 elements simultaneously quantifiable |
| Detection Limits | Sub-ppm for heavy metals in polymer matrices |
| Sample Forms | Solids (flat, irregular, coated), powders (pressed pellets), liquids (in sealed cells) |
| Data Security | FDA 21 CFR Part 11 compliant audit trail, electronic signature, role-based access control |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | XEPOS |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 50 W |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Detection Limit Improvement | Up to 3× lower vs. prior-generation ED-XRF |
| Analytical Range | Sub-ppm to 100% w/w |
| Repeatability | < 0.1% RSD (at mid-range concentrations) |
| Energy Resolution | < 130 eV (Mn Kα) |
| Excitation Mode | Polarized, Single-Wavelength (Monochromatic) Secondary Target Excitation |
| Software Platform | TurboQuant II |
| Compliance Framework | Designed for GLP/GMP environments |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO xSORT |
| Portability | Handheld / Field-Deployable |
| Detection Range | Mg (12) to U (92) |
| Display | 5-inch HD touchscreen |
| Operating System | Android-based embedded OS |
| Connectivity | Wi-Fi, Bluetooth, USB, MicroSD |
| Integrated Sensors | GPS, dual cameras |
| Ergonomics | Glove-compatible physical buttons, low-force trigger, balanced weight distribution |
| Compliance | Meets ISO 12847, ASTM E2865, and EU RoHS/WEEE screening requirements |
| Software Platform | XRF Analyzer Pro (PC-based, supports audit trail, method management, and GLP-compliant reporting) |
| Sample Handling | Compatible with portable sample chamber and docking station for lab-grade repeatability |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO xSORT XHH04 |
| Application | Field-Portable Elemental Analysis |
| Element Range | Na (11) to U (92) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Operating System | Android-based Custom Firmware |
| Display | 5-inch Wide-Angle HD Touchscreen |
| Connectivity | Wi-Fi, Bluetooth 5.0, USB-C, microSD Slot |
| Optional Modules | Integrated GPS, Dual-Camera Imaging System (Sample Positioning + Test Area Documentation), Docking Station for Lab-Grade Expansion |
| Brand | Stresstech Oy |
|---|---|
| Origin | Finland |
| Model | CamScan1000 |
| Measurement Principle | Magnetic Barkhausen Noise (MBN) |
| Cycle Time | 6–8 seconds per lobe |
| Channel Configuration | Single- or Multi-channel |
| Detection Type | Non-destructive, quantitative surface burn assessment |
| Alarm Threshold | User-definable |
| Compliance | Designed for ISO/IEC 17025-aligned QA environments |
| Application Scope | In-line and off-line camshaft inspection |
| Brand | Stresstech Oy |
|---|---|
| Origin | Finland |
| Model | CrankScan200 |
| Detection Principle | Magnetic Barkhausen Noise (MBN) |
| Measurement Type | Non-Destructive, Surface & Near-Surface Integrity Assessment |
| Channel Configuration | Single- or Multi-Channel Probe Support |
| Probe Compatibility | Curved-Surface Optimized Sensors for Journal, Fillet, Flank, and Crankweb Geometry |
| Alarm Thresholding | User-Configurable Signal Amplitude & Statistical Deviation Limits |
| Compliance Framework | Supports ISO 28671 (Non-destructive testing — Magnetic Barkhausen noise testing — General principles), ASTM E3094 (Standard Guide for MBN Testing of Ferromagnetic Materials), and GLP/GMP-aligned data traceability |
| Brand | Stresstech Oy |
|---|---|
| Country of Origin | Finland |
| Model | G2 |
| Portability | Field-deployable, integrated water-cooled X-ray generator |
| Safety Compliance | EN 61000-6-4, EN 61000-6-2, IEC 61000-4-3, CE-marked for industrial use |
| Detector Type | High-resolution silicon strip detector (SSD) or CCD-based imaging detector (configurable) |
| X-ray Source | Microfocus tungsten anode tube, 30–50 kV adjustable, <100 µm focal spot |
| Measurement Method | Sin²ψ technique with automated ψ-tilt stage (±45° range) |
| Data Acquisition | Real-time diffraction pattern capture, peak fitting via pseudo-Voigt deconvolution |
| Software Platform | RoboScan™ v5.x with GLP-compliant audit trail and 21 CFR Part 11-ready user access control |
| Brand | Stresstech Oy |
|---|---|
| Origin | Finland |
| Model | GearScan |
| Measurement Principle | Barkhausen Noise Analysis (BNA) |
| Diameter Range | 5–2000 mm |
| Module Range | 1–70 |
| Measurement Time per Tooth | 2–30 s (dependent on geometry and surface condition) |
| Motion Control | Computer-controlled precision DC servo motor with linear-bearing-driven probe |
| Compliance | Designed for ISO 13302, ASTM E2964, and EN 10327-based residual stress and grinding burn assessment workflows |
| Software | RoboScan™ PC-based acquisition and analysis suite with audit trail, user access levels, and GLP/GMP-ready reporting |
| Brand | Stresstech Oy |
|---|---|
| Origin | Finland |
| Model | Rollscan 250 |
| Type | Non-Destructive Surface Integrity Analyzer |
| Measurement Principle | Magnetic Barkhausen Noise (MBN) Analysis |
| Compliance | ISO 28640, ASTM E3147 (under development), EN 10327 (applicable for grinding burn assessment) |
| Sensor Interface | Plug-and-play modular connector |
| Motion Control | Motorized X/Z linear axes + A/T rotational axes |
| Software Platform | EasyGear v5.x (Windows-based, FDA 21 CFR Part 11 compliant configuration available) |
| Data Output | ASCII, CSV, XML |
| Cabinet Integration | Integrated control cabinet with main isolator switch, LED status indicators, emergency stop, door interlock, and Ergotron-display mounting |
| Brand | Stresstech Oy |
|---|---|
| Origin | Finland |
| Model | XStress 3000 |
| Application | Residual stress measurement via X-ray diffraction (XRD) |
| Portability | Field-deployable, battery-optional operation |
| Power Requirement | Single AC source (100–240 V, 50/60 Hz) |
| Setup Time | ≤10 minutes |
| Communication Interface | Ethernet, USB, and embedded Windows-based controller |
| Compliance | Designed for ISO 21940, ASTM E915, and EN 15305-compliant residual stress evaluation |
| Brand | Thermo Fisher |
|---|---|
| Origin | Switzerland |
| Manufacturer | Yes |
| Origin Category | Imported |
| Model | ARL Perform’X |
| Instrument Type | Floor-standing |
| Instrument Class | Scanning-type |
| X-ray Tube Power Options | 1500 W / 2500 W / 4200 W |
| Elemental Range | Be to U (Atomic Number 4 to 92) |
| Brand | Thermo Fisher |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | ARL QUANT'X |
| Form Factor | Benchtop/Floor-standing |
| Application Scope | General-purpose |
| Elemental Range | F to U (no elemental restrictions) |
| Quantification Range | <1 ppm to 100% |
| Energy Resolution | ≤140 eV at Mn Kα |
| Short-term Precision | RSD < 0.3% over 8 hours |
| Detector | High-performance Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | Thermo Fisher |
|---|---|
| Origin | Switzerland |
| Manufacturer | Thermo Fisher Scientific |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ/θ |
| Angular Accuracy | ±0.002° |
| Detector | Solid-state 2D pixel detector (55 × 55 µm pixel pitch) |
| Sample Handling | Manual 1-position holder or optional 6-position autosampler |
| X-ray Source | Cu or Co sealed-tube anode |
| Cooling | Optional water-cooling system |
| Data Output | Automated LIMS integration |
| Compliance | IEC 61000-4, IEC 62471, EN 61000-6-3, FDA 21 CFR Part 11 ready (with optional audit trail module) |
| Brand | Thermo Fisher |
|---|---|
| Origin | USA |
| Model | Niton XLt 797RWY |
| Instrument Type | Portable |
| X-ray Tube Power | 400 W |
| Detectable Elements | Boron (B, Z=5) to Uranium (U, Z=92) |
| Detector Linearity Range | kCPS |
| Beryllium Window Thickness | µm |
| Detector | Peltier-cooled Si-PIN |
| Energy Resolution | <250 eV (FWHM at Mn Kα, 2σ confidence) |
| Weight | 1.4 kg |
| Dimensions | 248 × 273 × 95 mm |
| Battery Life | 6–12 h |
| Operating Voltage | 40 kV / 50 µA max |
| Filter System | Dual-filter configuration (Filter 2 optimized for Cl and Cr in halogen-free screening) |