Keithley 2636B Dual-Channel SourceMeter Instrument

Overview

The Keithley 2636B Dual-Channel SourceMeter® Instrument is a precision, tightly integrated source-and-measure solution engineered for high-accuracy DC and pulsed I-V characterization, parametric testing, and production validation of semiconductor devices, materials, and electronic components. Unlike conventional power supplies or multimeters, the 2636B operates as a true 4-quadrant source-measure unit (SMU), capable of sourcing voltage while sinking current, sourcing current while sinking voltage, or operating in any combination—enabling comprehensive device behavior mapping across forward/reverse bias, leakage, breakdown, and transient regimes. Its dual-channel architecture provides galvanically isolated operation, eliminating crosstalk and enabling concurrent, synchronized measurements on two independent DUTs—or coordinated multi-terminal device testing (e.g., gate-drain-source characterization of MOSFETs). Each channel delivers full 40 W capability with 6½-digit measurement resolution, supporting dynamic pulse widths down to 100 µs at sub-0.1% setting accuracy—critical for minimizing self-heating during high-current stress tests.

Key Features

• Dual independent 4-quadrant SMU channels with full isolation, enabling parallel test execution without host dependency
• Wide dynamic range: ±10 A / ±200 V sourcing and ±0.1 fA / ±100 nV measurement sensitivity
• Embedded Test Script Processor (TSP®) architecture allows full test sequences—including branching, looping, math operations, and pass/fail logic—to execute autonomously within the instrument
• TSP-Link® technology supports daisy-chained expansion of up to 32 SMUs (64 channels) without requiring a controller PC or additional timing hardware
• Native SCPI and IEEE 488.2 command compatibility ensures seamless integration with legacy Keithley 2400-based test systems
• Web-based front panel interface accessible via any modern browser—no client software installation required
• Comprehensive I/O connectivity: USB 2.0 (USBTMC), LXI-C compliant Ethernet, GPIB, RS-232, and 12-bit digital I/O for external trigger synchronization and handler control

Sample Compatibility & Compliance

The 2636B is routinely deployed in R&D labs and production test floors for characterizing discrete semiconductors (diodes, transistors, thyristors), ICs (logic, analog, power), photovoltaic cells, MEMS sensors, battery materials, and nanoscale devices. Its low-noise design and guarded triaxial inputs meet stringent requirements for ultra-low-current metrology. The instrument complies with ISO/IEC 17025-relevant traceability practices when used with NIST-traceable calibration standards. Firmware and embedded TSP scripts support audit-ready logging for GLP/GMP environments; optional ACS-Basic software includes configurable reporting templates aligned with JEDEC JESD22-A114 (ESD), JESD22-A115 (latch-up), and MIL-STD-750 test methodologies.

Software & Data Management

Keithley offers free, cross-platform driver suites (IVI-COM, IVI-C, MATLAB, Python PyVISA, LabVIEW) with full documentation and example code. The embedded web interface enables real-time I/V sweeps, parameter sweeps, and data export in CSV or Excel format directly from the instrument’s internal storage. For automated test systems, TSP scripts can be developed offline using the free KickStart™ Instrument Control Software or imported from legacy 2400 configurations. All firmware updates are digitally signed and delivered via HTTPS, ensuring integrity and version control. Data logs include timestamps, channel metadata, and user-defined tags—supporting traceability under FDA 21 CFR Part 11 when configured with appropriate system-level access controls and electronic signature policies.

Applications

• Parametric testing of Si, SiC, GaN, and compound semiconductor devices under DC and pulsed conditions
• Leakage current analysis of gate oxides, passivation layers, and high-k dielectrics
• Forward/reverse bias characterization of LEDs, laser diodes, and photodetectors
• Resistance degradation studies in resistive RAM (ReRAM) and memristor arrays
• Production binning and functional test of discrete power devices and protection ICs
• Material resistivity and contact resistance measurement using four-wire Kelvin sensing

FAQ

Is the Keithley 2636B compatible with existing Keithley 2400 test scripts?

Yes—the 2636B supports full backward compatibility with standard SCPI commands and TSP syntax used in Keithley 2400 applications, enabling rapid migration without code rewrite.
Can the two channels operate synchronously with sub-microsecond timing alignment?

Yes—hardware-triggered synchronization via rear-panel digital I/O or TSP-Link ensures channel coordination with ≤100 ns jitter across all operating modes.
Does the instrument support remote calibration verification and self-test routines?

Yes—built-in self-calibration routines (per channel) and periodic verification checks are accessible via SCPI or the web interface, supporting ISO/IEC 17025 quality management workflows.
What is the maximum number of 2636B units that can be controlled in a single TSP-Link network?

Up to 32 instruments (64 channels) may be daisy-chained via TSP-Link without a master controller, with deterministic timing and shared script execution across the entire network.
Is ACS-Basic software included or separately licensed?

ACS-Basic is an optional add-on license—free evaluation version is available for download; full version requires activation and supports automated wafer-level probing and statistical process control (SPC) export.